SCHEMBL646707

SCHEMBL646707

CCCO[Si](F)(OCCC)OCCC

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL645691 0.81 ADRB2 (0.41)
SCHEMBL31415923 0.80
SCHEMBL25327708 0.78 CA1 (0.32)
SCHEMBL23701045 0.78
SCHEMBL27576729 0.75
SCHEMBL138265 0.72
SCHEMBL2114336 0.72 CA1 (0.30)
SCHEMBL23873 0.72 CA1 (0.30)
SCHEMBL31211141 0.72 CES1 (0.38)
SCHEMBL3481796 0.71

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 168 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-119593195-A Hydrophilic material, hydrophobic material, preparation method of hydrophilic material and hydrophobic material, and gas-liquid separation filter device with hydrophilic material and hydrophobic material 中科瑞丽分离科技无锡有限公司 2025-03-11 CN claimed
US-8216649-B2 Liquid crystal aligning agent, method of producing a liquid crystal alignment film and liquid crystal display device JSR CORPORATION (JP) 2012-07-10 US claimed
US-7125912-B2 Doped sol-gel materials and method of manufacture utilizing reduced mixing temperatures SIMAX TECHNOLOGIES, INC. (US) 2006-10-24 US claimed
US-20030078153-A1 Doped sol-gel materials and method of manufacture utilizing reduced mixing temperatures SIMAX TECHNOLOGIES, INC. 2003-04-24 US claimed
US-5334552-A Forming wiring layer over dielectric film on substrate surface covering with silicon dioxide film, then forming fluorine-containing silicon dioxide and flattening films, dry etching of flattening film NEC CORPORATION (JP) 1994-08-02 US claimed
CN-119593195-A Hydrophilic material, hydrophobic material, preparation method of hydrophilic material and hydrophobic material, and gas-liquid separation filter device with hydrophilic material and hydrophobic material 中科瑞丽分离科技无锡有限公司 2025-03-11 CN disclosed
CN-118613545-A Mixed composition, film obtained by curing the mixed composition, and glass having the film 住友化学株式会社 2024-09-06 CN disclosed
WO-2023145301-A1 MIXED COMPOSITION, CURED FILM OF SAID MIXED COMPOSITION, AND GLASS HAVING SAID FILM 住友化学株式会社 2023-08-03 WO disclosed
EP-3239111-B1 CURABLE COMPOSITION, TRANSFER FILM, FRONT PLATE OF IMAGE DISPLAY DEVICE, FRONT PLATE-INTEGRATED SENSOR, IMAGE DISPLAY DEVICE, AND MANUFACTURING METHOD FOR FRONT PLATE OF IMAGE DISPLAY DEVICE FUJIFILM CORP (JP) 2021-02-17 EP disclosed
EP-1520891-B1 FILM FORMING COMPOSITION, PROCESS FOR PRODUCING FILM FORMING COMPOSITION, INSULATING FILM FORMING MATERIAL, PROCESS FOR FORMING FILM, AND SILICA-BASED FILM JSR CORP (JP) 2019-05-01 EP disclosed
EP-3239111-A1 CURABLE COMPOSITION, TRANSFER FILM, FRONT PLATE OF IMAGE DISPLAY DEVICE, FRONT PLATE-INTEGRATED SENSOR, IMAGE DISPLAY DEVICE, AND MANUFACTURING METHOD FOR FRONT PLATE OF IMAGE DISPLAY DEVICE FUJIFILM Corporation (JP) 2017-11-01 EP disclosed
US-9268451-B2 Transfer film, manufacturing method of capacitive input device, capacitive input device, and image display device including the same FUJIFILM CORPORATION (JP) 2016-02-23 US disclosed
EP-1090967-A2 Composition for film formation, method of film formation, and insulating film JSR Corporation (JP) 2001-04-11 EP disclosed
EP-1088868-A2 Composition for film formation, method of film formation, and insulating film JSR Corporation (JP) 2001-04-04 EP disclosed
EP-1058274-A1 Composition for film formation and material for insulating film formation JSR Corporation (JP) 2000-12-06 EP disclosed
EP-1045290-A2 Composition for resist underlayer film and method for producing the same JSR Corporation (JP) 2000-10-18 EP disclosed
US-5744378-A Method for fabricating a semiconductor device having multilevel interconnections NEC CORPORATION (JP) 1998-04-28 US disclosed
US-5468682-A Method of manufacturing semiconductor device using the abrasive NEC CORPORATION (JP) 1995-11-21 US disclosed
US-5405805-A Method for forming interconnect structure, insulating films and surface protective films of semiconductor device NEC CORPORATION (JP) 1995-04-11 US disclosed
US-5334552-A Forming wiring layer over dielectric film on substrate surface covering with silicon dioxide film, then forming fluorine-containing silicon dioxide and flattening films, dry etching of flattening film NEC CORPORATION (JP) 1994-08-02 US disclosed