SCHEMBL6846649

SCHEMBL6846649

CCC(O)c1cccc2[nH]nnc12

nearest known ligand 0.36

Predicted protein targets (top 4)

geneUniProtsupporting neighboursconfidence
IDO1 P14902 2/20 0.36
LMNA P02545 1/20 0.35
PDE2A O00408 1/20 0.30
TSHR P16473 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL9222918 0.82 TSHR (0.42) TSHR
SCHEMBL5381799 0.81 KDM4E (0.37) IDO1LMNATSHR
SCHEMBL24630973 0.80 ADRB2 (0.50) LMNATSHR
SCHEMBL27998221 0.79 GPR84 (0.38) IDO1LMNATSHR
SCHEMBL7048243 0.79 IDO1 (0.31) IDO1LMNATSHR
Hydrochloric Acid SCHEMBL27998010 0.78 GPR84 (0.37) IDO1LMNATSHR
SCHEMBL11151068 0.78 CYP1A2 (0.30) LMNATSHR
SCHEMBL2611045 0.78 GABRA1 (0.39) LMNATSHR
SCHEMBL5016076 0.77 GPR84 (0.30)
SCHEMBL27635807 0.75 FFAR1 (0.33)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 41 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-109743878-B Suspension and grinding method 昭和电工材料株式会社 2021-07-06 CN claimed
US-4212754-A LIGANDS CONTAINING AMINE, HYDROXY, OXAZOLINE, AND IMIDAZOLINE GROUPS MOBIL OIL CORPORATION (US) 1980-07-15 US claimed
US-12630742-B2 Polishing composition using polishing particles containing basic substance and having high water affinity NISSAN CHEMICAL CORPORATION (JP) 2026-05-19 US disclosed
US-20260117105-A1 POLISHING COMPOSITION HAVING EXCELLENT STORAGE STABILITY AND METHOD FOR PRODUCING SAME NISSAN CHEMICAL CORPORATION (JP) 2026-04-30 US disclosed
US-20260042978-A1 PROCESSING SOLUTION FOR SEMICONDUCTOR DEVICE TOKYO OHKA KOGYO CO LTD (JP) 2026-02-12 US disclosed
US-20260028553-A1 PROCESSING SOLUTION, METHOD FOR MANUFACTURING PROCESSING SOLUTION, METHOD FOR PROCESSING SUBSTRATE, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE TOKYO OHKA KOGYO CO LTD (JP) 2026-01-29 US disclosed
US-20250270480-A1 PROCESSING SOLUTION, METHOD FOR PROCESSING SEMICONDUCTOR SUBSTRATE, AND METHOD FOR MANUFACTURING SEMICONDUCTOR TOKYO OHKA KOGYO CO., LTD. (JP) 2025-08-28 US disclosed
US-20250270474-A1 PROCESSING SOLUTION, METHOD FOR PROCESSING SEMICONDUCTOR SUBSTRATE, AND METHOD FOR MANUFACTURING SEMICONDUCTOR TOKYO OHKA KOGYO CO., LTD. (JP) 2025-08-28 US disclosed
US-20250201546-A1 METHOD FOR PROCESSING SUBSTRATE, KIT FOR PROCESSING SUBSTRATE, AND METHOD FOR MANUFACTURING SEMICONDUCTOR SUBSTRATE TOKYO OHKA KOGYO CO., LTD. (JP) 2025-06-19 US disclosed
US-20250136843-A1 POLISHING COMPOSITION COMPRISING POLISHING PARTICLES HAVING HIGH WATER AFFINITY NISSAN CHEMICAL CORPORATION (JP) 2025-05-01 US disclosed
US-20250140548-A1 PROCESSING SOLUTION, METHOD FOR PROCESSING SUBSTRATE, AND METHOD FOR MANUFACTURING SEMICONDUCTOR SUBSTRATE TOKYO OHKA KOGYO CO., LTD, (JP) 2025-05-01 US disclosed
US-20160107286-A1 CMP POLISHING SOLUTION AND POLISHING METHOD USING SAME HITACHI CHEMICAL COMPANY, LTD (JP) 2016-04-21 US disclosed
US-20160086819-A1 CMP POLISHING SOLUTION AND POLISHING METHOD USING SAME HITACHI CHEMICAL COMPANY, LTD (JP) 2016-03-24 US disclosed
CN-1803964-B Materials for polishing liquid for metal, polishing liquid for metal, method for preparation thereof and polishing method using same HITACHI CHEMICAL CO LTD 2010-12-15 CN disclosed
CN-101045855-A Polishing fluid and polishing method HITACHI CHEMICAL CO LTD (JP) 2007-10-03 CN disclosed
CN-101037586-A Polishing fluid and method of polishing HITACHI CHEMICAL CO LTD (JP) 2007-09-19 CN disclosed
CN-1803964-A Materials for polishing liquid for metal, polishing liquid for metal, method for preparation thereof and polishing method using same HITACHI CHEMICAL CO LTD (JP) 2006-07-19 CN disclosed
CN-1243071-C Metal polishing liquid material, metal polishing liquid, method for producing same, and polishing method using same HITACHI CHEMICAL CO LTD (JP) 2006-02-22 CN disclosed
US-20040148867-A1 Chelating resin particle consisting of aminocarboxylic acid, aminophosphonic acid, and/or iminodiacetic acid group; inorganic particle and anionic surfactant; chemical mechanical polishing SUMITOMO CHEMICAL COMPANY, LIMITED 2004-08-05 US disclosed
CN-1392215-A Metal polishing liquid material, metal polishing liquid, method for producing same, and polishing method using same HITACHI CHEMICAL CO LTD (JP) 2003-01-22 CN disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (4 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20260117105-A1 POLISHING COMPOSITION HAVING EXCELLENT STORAGE STABILITY AND METHOD FOR PRODUCING SAME SRPRA, SEM1, PSMA1 IDO1 3564/4885LMNA 1106/4885PDE2A 2391/4885
US-20260028553-A1 PROCESSING SOLUTION, METHOD FOR MANUFACTURING PROCESSING SOLUTION, METHOD FOR PROCESSING SUBSTRATE, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE TET2, TET1, KDM2A IDO1 179/4885LMNA 3633/4885PDE2A 544/4885
US-20260042978-A1 PROCESSING SOLUTION FOR SEMICONDUCTOR DEVICE TWF2, DSTYK, WNK1 IDO1 1466/4885LMNA 4667/4885PDE2A 4787/4885
US-12630742-B2 Polishing composition using polishing particles containing basic substance and having high water affinity POLR1A, PRMT1, SRRM2 IDO1 2430/4885LMNA 978/4885PDE2A 1073/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.