SCHEMBL684980

SCHEMBL684980

C=CC(=O)OC1(C(C)C)CCCCC1

nearest known ligand 0.37

Predicted protein targets (top 1)

geneUniProtsupporting neighboursconfidence
TSHR P16473 2/20 0.37

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL686092 1.00 TSHR (0.37) TSHR
SCHEMBL684954 1.00 TSHR (0.37) TSHR
SCHEMBL263898 0.98 TSHR (0.38) TSHR
SCHEMBL673360 0.90 TSHR (0.41) TSHR
Acrylic Acid SCHEMBL8364683 0.85 TSHR (0.37) TSHR
SCHEMBL8102011 0.85 HCAR2 (0.32)
SCHEMBL4399259 0.83 TSHR (0.37) TSHR
SCHEMBL8106024 0.82 HCAR2 (0.33)
Methacrylic Acid SCHEMBL5177816 0.81 TSHR (0.34) TSHR
SCHEMBL4399278 0.81 TSHR (0.38) TSHR

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 477 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-11119408-B2 Compound, resin and photoresist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2021-09-14 US disclosed
US-10838300-B2 Salt and photoresist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2020-11-17 US disclosed
US-10795258-B2 Resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2020-10-06 US disclosed
US-10774029-B2 Compound, resin, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2020-09-15 US disclosed
US-10725380-B2 Compound, resin, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2020-07-28 US disclosed
US-10599033-B2 Salt, acid generator, resin, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2020-03-24 US disclosed
US-10571805-B2 Resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2020-02-25 US disclosed
US-10377692-B2 Photoresist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2019-08-13 US disclosed
US-10359700-B2 Salt, acid generator, photoresist composition and process of producing photoresist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2019-07-23 US disclosed
CN-109879756-A The preparation method of 1- isopropylcyclohexyl (methyl) acrylate 江苏南大光电材料股份有限公司 2019-06-14 CN disclosed
US-7423102-B2 Star polymer SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2008-09-09 US disclosed
US-20080193874-A1 Having acrylic ester functionality with acid labile ester ring functionality and sulfonium sulfonate acid salt; high resolution semiconductor microfabrication patterns; excimer laser lithography SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2008-08-14 US disclosed
US-20080193874-A1 Having acrylic ester functionality with acid labile ester ring functionality and sulfonium sulfonate acid salt; high resolution semiconductor microfabrication patterns; excimer laser lithography SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2008-08-14 US disclosed
US-20080166660-A1 Having acrylic ester functionality with acid labile ester ring functionality and sulfonium sulfonate acid salt; high resolution semiconductor microfabrication patterns; excimer laser lithography SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2008-07-10 US disclosed
US-20080166660-A1 Having acrylic ester functionality with acid labile ester ring functionality and sulfonium sulfonate acid salt; high resolution semiconductor microfabrication patterns; excimer laser lithography SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2008-07-10 US disclosed
US-7205090-B2 Chemical amplification type positive resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2007-04-17 US disclosed
US-7205090-B2 Chemical amplification type positive resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2007-04-17 US disclosed
US-20060074139-A1 Acrylic copolymer and radiation-sensitive resin composition JSR CORPORATION (JP) 2006-04-06 US disclosed
US-20060014913-A1 Star polymer SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2006-01-19 US disclosed
EP-1586594-A1 ACRYLIC COPOLYMER AND RADIATION-SENSITIVE RESIN COMPOSITION JSR Corporation (JP) 2005-10-19 EP disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (6 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-10725380-B2 Compound, resin, resist composition and method for producing resist pattern C1R, C9, RER1 TSHR 2860/4885
US-10359700-B2 Salt, acid generator, photoresist composition and process of producing photoresist pattern CBR1, CBR3, C1R TSHR 310/4885
US-10599033-B2 Salt, acid generator, resin, resist composition and method for producing resist pattern RER1, FRG1, C1R TSHR 402/4885
US-10774029-B2 Compound, resin, resist composition and method for producing resist pattern C1R, C9, RER1 TSHR 2893/4885
US-10838300-B2 Salt and photoresist composition containing the same C1S, C1R, CRY1 TSHR 2309/4885
US-10377692-B2 Photoresist composition C1R, C1S, F12 TSHR 1598/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.