SCHEMBL73027

SCHEMBL73027

C=Cc1c(O)ccc2ccccc12

nearest known ligand 0.66

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
ERN1 O75460 1/20 0.66
KMT2A Q03164 7/20 0.59
MEN1 O00255 6/20 0.59
MAPT P10636 10/20 0.56
KDM4E B2RXH2 7/20 0.54
L3MBTL1 Q9Y468 5/20 0.54
ALDH1A1 P00352 4/20 0.54
GAA P10253 3/20 0.54
HPGD P15428 2/20 0.54
ATM Q13315 1/20 0.54
RRM1 P23921 1/20 0.54
PTPN22 Q9Y2R2 1/20 0.54
THRB P10828 3/20 0.53
POLB P06746 3/20 0.53
MPI P34949 2/20 0.53
ALOX15 P16050 1/20 0.53
TSHR P16473 1/20 0.53
HSD17B10 Q99714 1/20 0.53
CRHBP P24387 1/20 0.53
CRHR2 Q13324 1/20 0.53

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL30273052 1.00 ERN1 (0.66) ERN1KMT2AMEN1MAPTKDM4E
Formamide SCHEMBL9731302 0.91 ERN1 (0.66) ERN1KMT2AMEN1MAPTKDM4E
SCHEMBL7403263 0.84 ERN1 (0.61) ERN1KMT2AMEN1MAPTKDM4E
SCHEMBL7915280 0.83 ERN1 (0.70) ERN1KMT2AMEN1MAPTKDM4E
SCHEMBL7915285 0.83 ERN1 (0.70) ERN1KMT2AMEN1MAPTKDM4E
SCHEMBL383717 0.82 ERN1 (0.46) ERN1KMT2AMEN1MAPTKDM4E
SCHEMBL304032 0.79 ERN1 (1.00) ERN1KMT2AMEN1MAPTKDM4E
SCHEMBL6411521 0.79 ERN1 (0.66) ERN1KMT2AMEN1MAPTKDM4E
SCHEMBL1520145 0.79 ERN1 (0.66) ERN1KMT2AMEN1MAPTKDM4E
SCHEMBL29358409 0.79 ERN1 (1.00) ERN1KMT2AMEN1MAPTKDM4E

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 1053 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8945809-B2 Fluorinated monomer, fluorinated polymer, resist composition, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-02-03 US claimed
US-8916331-B2 Resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-12-23 US claimed
US-8647808-B2 Fluorinated monomer, polymer, resist composition, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-02-11 US claimed
CN-101308329-B Coating compositions ROHM & HAAS ELECT MAT 2013-09-04 CN claimed
EP-2466379-B1 Resist composition and patterning process SHINETSU CHEMICAL CO (JP) 2013-07-17 EP claimed
US-8420292-B2 Polymer, resist composition, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-04-16 US claimed
EP-1998222-B1 Coating compositions ROHM & HAAS ELECT MAT (US) 2013-03-20 EP claimed
US-8313886-B2 Resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-11-20 US claimed
EP-2466379-A1 Resist composition and patterning process Shin-Etsu Chemical Co., Ltd. (JP) 2012-06-20 EP claimed
US-20120148945-A1 RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-06-14 US claimed
US-20110151381-A1 FLUORINATED MONOMER, FLUORINATED POLYMER, RESIST COMPOSITION, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2011-06-23 US claimed
US-7923195-B2 Positive resist composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2011-04-12 US claimed
US-7887991-B2 Positive resist composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2011-02-15 US claimed
US-20100266957-A1 RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-10-21 US claimed
US-7655378-B2 Negative resist composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-02-02 US claimed
US-20090202940-A1 Positive resist composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2009-08-13 US claimed
US-20090202947-A1 Positive resist composition and patterning process using the same SHIN-ETSU CHEMICAL CO.,LTD (JP) 2009-08-13 US claimed
US-20080020290-A1 Negative resist composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2008-01-24 US claimed
US-20080020289-A1 Novel polymer, positive resist composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2008-01-24 US claimed
US-6005151-A Processs for preparing aromatic olefins using palladacycle catalysis AVENTIS (DE) 1999-12-21 US claimed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (1 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20110151381-A1 FLUORINATED MONOMER, FLUORINATED POLYMER, RESIST COMPOSITION, AND PATTERNING PROCESS AFF1, H1-0, FRG1 ERN1 2489/4885KMT2A 105/4885MEN1 415/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.