SCHEMBL7865859

SCHEMBL7865859

CC(C)OCOc1cccc(OCOC(C)C)c1

nearest known ligand 0.44

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
NPSR1 Q6W5P4 1/20 0.44
MTNR1A P48039 3/20 0.42
MTNR1B P49286 3/20 0.42
TSHR P16473 3/20 0.41
HIF1A Q16665 2/20 0.41
ALDH1A1 P00352 2/20 0.41
SMN1; SMN2 Q16637 2/20 0.41
MAPK1 P28482 2/20 0.41
KDM4E B2RXH2 2/20 0.41
NSD2 O96028 1/20 0.41
HTR1D P28221 1/20 0.41
HTR1B P28222 1/20 0.41
MAOB P27338 2/20 0.40
L3MBTL1 Q9Y468 2/20 0.40
CYP3A4 P08684 3/20 0.39
TP53 P04637 2/20 0.39
MEN1 O00255 1/20 0.39
CYP1A2 P05177 1/20 0.39
CYP2C9 P11712 1/20 0.39
CYP2C19 P33261 1/20 0.39

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL4960444 0.87 APP (0.39) NPSR1MTNR1AMTNR1BTSHRALDH1A1
SCHEMBL873981 0.87 MAOB (0.51) ALDH1A1KDM4EMAOBL3MBTL1KMT2A
SCHEMBL3823297 0.86 ALDH1A1 (0.30) NPSR1ALDH1A1
SCHEMBL5702516 0.84 LMNA (0.52) MTNR1AMTNR1BALDH1A1HTR1DHTR1B
SCHEMBL8751833 0.82 GPBAR1 (0.43) NPSR1MTNR1AMTNR1BTSHRHIF1A
SCHEMBL7864203 0.81 NQO1 (0.43) TSHRALDH1A1MAPK1KDM4ELMNA
SCHEMBL74478 0.81 NPSR1 (0.54) NPSR1TSHRALDH1A1SMN1; SMN2MAPK1
SCHEMBL5149611 0.80 CHRNB2 (0.57) TSHRALDH1A1MAOBMEN1KMT2A
SCHEMBL8751741 0.78 HTT (0.37) TSHRALDH1A1SMN1; SMN2MAPK1KDM4E
SCHEMBL2942427 0.78 ALDH1A1 (0.37) NPSR1HIF1AALDH1A1KDM4EMEN1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 9 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-6303264-B1 PROFILE OF PATTERN OF QUARTER MICRON ORDER WITHOUT CAUSING FOOTING, WHILE RETAINING HIGH RESOLUTION ABILITY AND HIGH SENSITIVITY WAKO PURE CHEMICAL INDUSTRIES, LTD (JP) 2001-10-16 US disclosed
EP-0675410-B1 Resist composition for deep ultraviolet light WAKO PURE CHEM IND LTD (JP) 1999-08-04 EP disclosed
EP-0875787-A1 Method for reducing the substrate dependence of resist Wako Pure Chemical Industries, Ltd. (JP) 1998-11-04 EP disclosed
US-5780206-A USING AN ANTHRACENE DERIVATIVE AS AN ABSORBER ON HIGHLY REFLECTIVE SURFACES; ALKALI-SOLUBLE POLYMERS; GENERATION OF ACID CATALYSTS; FINE PATTERNS WAKO PURE CHEMICAL INDUSTRIES, LTD. (JP) 1998-07-14 US disclosed
US-5695910-A RESIN BECOMES ALKALI SOLUBLE BY ELIMINATING PROTECTIVE GROUPS BY ACTION OF IN SITU GENERATED ACID WAKO PURE CHEMICAL INDUSTRIES, LTD. (JP) 1997-12-09 US disclosed
EP-0579420-B1 Negative working resist material and pattern forming process WAKO PURE CHEM IND LTD (JP) 1997-03-05 EP disclosed
EP-0675410-A1 Resist composition for deep ultraviolet light WAKO PURE CHEMICAL INDUSTRIES LTD (JP) 1995-10-04 EP disclosed
US-5389491-A Negative working resist composition MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. (JP) 1995-02-14 US disclosed
EP-0579420-A2 Negative working resist material and pattern forming process WAKO PURE CHEMICAL INDUSTRIES LTD (JP) 1994-01-19 EP disclosed