SCHEMBL7864203

SCHEMBL7864203

CC(C)OCOc1ccc(OCOC(C)C)cc1

nearest known ligand 0.43

Predicted protein targets (top 16)

geneUniProtsupporting neighboursconfidence
NQO1 P15559 1/20 0.43
TDP1 Q9NUW8 2/20 0.39
MAOA P21397 1/20 0.38
PTGS1 P23219 1/20 0.38
LMNA P02545 1/20 0.37
ACACB O00763 2/20 0.36
ACACA Q13085 1/20 0.36
TSHR P16473 2/20 0.36
HPGD P15428 1/20 0.36
MAPT P10636 1/20 0.35
MAPK1 P28482 1/20 0.34
ADRB2 P07550 1/20 0.34
ADRB1 P08588 1/20 0.34
ADRB3 P13945 1/20 0.34
ALDH1A1 P00352 2/20 0.33
KDM4E B2RXH2 1/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL13992369 0.89 MAPT (0.45) MAOAPTGS1LMNAACACBTSHR
SCHEMBL5702516 0.88 LMNA (0.52) MAOAPTGS1LMNAADRB2ADRB1
SCHEMBL3823297 0.84 ALDH1A1 (0.30) ALDH1A1
SCHEMBL9311975 0.84 CHRNB2 (0.47) TDP1LMNAHPGDMAPTMAPK1
SCHEMBL7865859 0.81 NPSR1 (0.44) LMNATSHRMAPK1ALDH1A1KDM4E
SCHEMBL29766977 0.81 ALDH1A1 (0.37) ACACBALDH1A1KDM4E
SCHEMBL2942427 0.81 ALDH1A1 (0.37) ACACBALDH1A1KDM4E
SCHEMBL13052211 0.81 MAOA (0.39) TDP1MAOAPTGS1LMNAHPGD
SCHEMBL2947538 0.78 NQO1 (0.44) NQO1TDP1MAOAPTGS1ACACB
SCHEMBL15774864 0.77 CA1 (0.48)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 9 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-6303264-B1 PROFILE OF PATTERN OF QUARTER MICRON ORDER WITHOUT CAUSING FOOTING, WHILE RETAINING HIGH RESOLUTION ABILITY AND HIGH SENSITIVITY WAKO PURE CHEMICAL INDUSTRIES, LTD (JP) 2001-10-16 US disclosed
EP-0675410-B1 Resist composition for deep ultraviolet light WAKO PURE CHEM IND LTD (JP) 1999-08-04 EP disclosed
EP-0875787-A1 Method for reducing the substrate dependence of resist Wako Pure Chemical Industries, Ltd. (JP) 1998-11-04 EP disclosed
US-5780206-A USING AN ANTHRACENE DERIVATIVE AS AN ABSORBER ON HIGHLY REFLECTIVE SURFACES; ALKALI-SOLUBLE POLYMERS; GENERATION OF ACID CATALYSTS; FINE PATTERNS WAKO PURE CHEMICAL INDUSTRIES, LTD. (JP) 1998-07-14 US disclosed
US-5695910-A RESIN BECOMES ALKALI SOLUBLE BY ELIMINATING PROTECTIVE GROUPS BY ACTION OF IN SITU GENERATED ACID WAKO PURE CHEMICAL INDUSTRIES, LTD. (JP) 1997-12-09 US disclosed
EP-0579420-B1 Negative working resist material and pattern forming process WAKO PURE CHEM IND LTD (JP) 1997-03-05 EP disclosed
EP-0675410-A1 Resist composition for deep ultraviolet light WAKO PURE CHEMICAL INDUSTRIES LTD (JP) 1995-10-04 EP disclosed
US-5389491-A Negative working resist composition MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. (JP) 1995-02-14 US disclosed
EP-0579420-A2 Negative working resist material and pattern forming process WAKO PURE CHEMICAL INDUSTRIES LTD (JP) 1994-01-19 EP disclosed