SCHEMBL10061831

SCHEMBL10061831

CC(=O)OC1(C)CCC2CC1OC2=O

nearest known ligand 0.35

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
ALOX15 P16050 1/20 0.35
UBE2D3 P61077 1/20 0.33
CYP3A4 P08684 5/20 0.32
LMNA P02545 4/20 0.32
NR3C1 P04150 4/20 0.32
AR P10275 4/20 0.32
PGR P06401 3/20 0.32
ALDH1A1 P00352 2/20 0.32
CHRM2 P08172 2/20 0.32
ABCB11 O95342 2/20 0.32
NPSR1 Q6W5P4 2/20 0.32
SMN1; SMN2 Q16637 2/20 0.32
ABCC4 O15439 1/20 0.32
ESR1 P03372 1/20 0.32
SHBG P04278 1/20 0.32
NR3C2 P08235 1/20 0.32
CHRM1 P11229 1/20 0.32
HRH2 P25021 1/20 0.32
AKR1C3 P42330 1/20 0.32
AKR1C2 P52895 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL441712 0.84 SMN1; SMN2 (0.34) SMN1; SMN2
SCHEMBL685795 0.83
SCHEMBL12705175 0.83
SCHEMBL14877467 0.82
SCHEMBL686101 0.82 SMN1; SMN2 (0.31) SMN1; SMN2
SCHEMBL12765236 0.80 OPRK1 (0.30)
SCHEMBL786164 0.80 ACHE (0.32)
SCHEMBL785964 0.80 FKBP1A (0.30) SMN1; SMN2
SCHEMBL9881070 0.78 NLRP3 (0.33) CYP19A1
SCHEMBL13370889 0.78

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 28 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-1489459-B1 Positive resist composition and method of forming pattern using the same FUJIFILM CORP (JP) 2015-10-14 EP disclosed
EP-1403295-B1 Ester compounds, polymers, resist compositions and patterning process SHINETSU CHEMICAL CO (JP) 2014-10-22 EP disclosed
EP-2186838-B1 METHOD FOR PRODUCING STAR POLYMER NIPPON SODA CO (JP) 2014-08-27 EP disclosed
EP-2296039-B1 Positive photosensitive composition FUJIFILM CORP (JP) 2013-09-25 EP disclosed
US-8193286-B2 Acrylic star polymer NIPPON SODA CO., LTD. (JP) 2012-06-05 US disclosed
US-20110152388-A1 Multibranched polymer and method for producing the same NIPPON SODA CO., LTD. (JP) 2011-06-23 US disclosed
US-20110098413-A1 Acrylic star polymer NIPPON SODA CO., LTD (JP) 2011-04-28 US disclosed
US-7919570-B2 narrowly dispersed; controlled molecular weight; ionic conductivity, shape stability; battery adhesive or binder; 1,1,2,2-tetrakis(4-hydroxyphenyl)ethane or pentaerythritol reacted with bromoisobutyroyl bromide for core; living radical polymerization of acrylate or a styrene at halogen atoms as the arms NIPPON SODA CO., LTD. (JP) 2011-04-05 US disclosed
US-7847045-B2 Acrylic acid-based polymer and method of producing the same NIPPON SODA CO., LTD. (JP) 2010-12-07 US disclosed
US-20100210805-A1 METHOD FOR PRODUCING STAR POLYMER NIPPON SODA CO., LTD. (JP) 2010-08-19 US disclosed
US-7255971-B2 Positive resist composition FUJIFILM CORPORATION (JP) 2007-08-14 US disclosed
US-7252924-B2 Positive resist composition and method of pattern formation using the same FUJIFILM CORPORATION (JP) 2007-08-07 US disclosed
US-7235341-B2 Positive resist composition FUJIFILM CORPORATION (JP) 2007-06-26 US disclosed
US-7214733-B2 Positive type resist composition FUJI PHOTO FILM CO., LTD. (JP) 2007-05-08 US disclosed
US-7192681-B2 Positive photosensitive composition FUJI PHOTO FILM CO., LTD. (JP) 2007-03-20 US disclosed
US-7189492-B2 Photosensitive composition and pattern forming method using the same FUJI PHOTO FILM CO., LTD. (JP) 2007-03-13 US disclosed
US-7179578-B2 Positive resist composition FUJI PHOTO FILM CO., LTD. (JP) 2007-02-20 US disclosed
US-7179579-B2 Radiation-sensitive composition FUJI PHOTO FILM CO., LTD. (JP) 2007-02-20 US disclosed
US-7169541-B2 Compound, polymer, resist composition, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-01-30 US disclosed
US-7169541-B2 Compound, polymer, resist composition, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-01-30 US disclosed