SCHEMBL10167848

SCHEMBL10167848

CCC(C)(C)C(=O)OCC1COC(C)(C)O1

nearest known ligand 0.47

Predicted protein targets (top 11)

geneUniProtsupporting neighboursconfidence
CA2 P00918 2/20 0.47
TMEM97 Q5BJF2 2/20 0.36
SIGMAR1 Q99720 2/20 0.36
HMGCR P04035 4/20 0.34
ALDH1A1 P00352 2/20 0.34
NPSR1 Q6W5P4 1/20 0.34
HTR7 P34969 1/20 0.34
DGAT1 O75907 1/20 0.32
CTDSP1 Q9GZU7 1/20 0.32
APP P05067 1/20 0.30
HCRTR2 O43614 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL14929446 0.88 CA2 (0.47) CA2TMEM97SIGMAR1ALDH1A1NPSR1
SCHEMBL11922847 0.86 CA2 (0.50) CA2TMEM97SIGMAR1ALDH1A1NPSR1
SCHEMBL13642031 0.86 HMGCR (0.36) CA2HMGCR
SCHEMBL13642459 0.86 CA2 (0.38) CA2TMEM97SIGMAR1HMGCRALDH1A1
SCHEMBL13642027 0.86 CTDSP1 (0.38) CA2HMGCRALDH1A1CTDSP1
SCHEMBL25468169 0.85 HMGCR (0.33) CA2HMGCRALDH1A1CTDSP1
SCHEMBL13641643 0.85 CTDSP1 (0.39) CA2TMEM97SIGMAR1HMGCRALDH1A1
SCHEMBL18286659 0.85 CA2 (0.43) CA2TMEM97SIGMAR1ALDH1A1NPSR1
SCHEMBL13642024 0.84 HMGCR (0.34) CA2HMGCRALDH1A1CTDSP1
SCHEMBL106425 0.84 CA2 (0.48) CA2TMEM97SIGMAR1ALDH1A1NPSR1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 77 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-11829069-B2 Photoresist compositions and methods ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2023-11-28 US disclosed
US-20230350290-A1 PATTERN FORMING METHOD, KIT, AND RESIST COMPOSITION FUJIFILM CORPORATION (JP) 2023-11-02 US disclosed
US-20230333478-A1 PATTERN FORMING METHOD, METHOD FOR PRODUCING ELECTRONIC DEVICE, AND KIT FUJIFILM CORPORATION (JP) 2023-10-19 US disclosed
US-11747727-B2 Chemical liquid, chemical liquid storage body, pattern forming method, and kit FUJIFILM CORPORATION (JP) 2023-09-05 US disclosed
US-11733611-B2 Pattern forming method, method for producing electronic device, and kit FUJIFILM CORPORATION (JP) 2023-08-22 US disclosed
US-20230135117-A1 SOLUTION, SOLUTION STORAGE BODY, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, PATTERN FORMING METHOD, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE FUJIFILM CORPORATION (JP) 2023-05-04 US disclosed
US-11640114-B2 Compound, resin, photoresist composition and process for producing photoresist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2023-05-02 US disclosed
US-20180059545-A1 MONOMERS, POLYMERS AND PHOTORESIST COMPOSITIONS DUPONT SPECIALTY MATERIALS KOREA LTD (KR) 2018-03-01 US disclosed
US-9766547-B2 Pattern forming method, actinic ray-sensitive or radiation-sensitive resin composition, resist film, method of manufacturing electronic device using the same, and electronic device FUJIFILM CORPORATION (JP) 2017-09-19 US disclosed
US-20170097565-A1 ACTIVE LIGHT SENSITIVE OR RADIATION SENSITIVE RESIN COMPOSITION, ACTIVE LIGHT SENSITIVE OR RADIATION SENSITIVE FILM, PATTERN FORMING METHOD, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2017-04-06 US disclosed
US-20120308927-A1 POLYMERS, PHOTORESIST COMPOSITIONS AND METHODS OF FORMING PHOTOLITHOGRAHIC PATTERNS DOW GLOBAL TECHNOLOGIES LLC (US) 2012-12-06 US disclosed
US-20120282548-A1 PATTERN FORMING METHOD, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION AND RESIST FILM FUJIFILM CORPORATION (JP) 2012-11-08 US disclosed
US-8299142-B2 Ink composition, inkjet recording method, and printed article FUJIFILM CORPORATION (JP) 2012-10-30 US disclosed
US-20120219913-A1 PATTERN FORMING METHOD, ACTINIC-RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, AND RESIST FILM FUJIFILM CORPORATION (JP) 2012-08-30 US disclosed
US-20120171617-A1 POLYMERS, PHOTORESIST COMPOSITIONS AND METHODS OF FORMING PHOTOLITHOGRAPHIC PATTERNS DOW GLOBAL TECHNOLOGIES LLC (US) 2012-07-05 US disclosed
US-20120052449-A1 METHOD OF FORMING PATTERN FUJIFILM CORPORATION (JP) 2012-03-01 US disclosed
US-20120028196-A1 METHOD OF FORMING PATTERN AND ORGANIC PROCESSING LIQUID FOR USE IN THE METHOD FUJIFILM CORPORATION (JP) 2012-02-02 US disclosed
US-20090197055-A1 Ink composition, inkjet recording method, and printed article FUJIFILM CORPORATION (JP) 2009-08-06 US disclosed
US-20090027608-A1 PHOTOSENSITIVE COMPOSITION, PHOTOSENSITIVE RESIN TRANSFER FILM, AND METHOD FOR PRODUCING A PHOTOSPACER, AND SUBSTRATE FOR A LIQUID CRYSTAL DISPLAY DEVICE AND LIQUID DISPLAY DEVICE FUJIFILM CORPORATION (JP) 2009-01-29 US disclosed
US-7419761-B2 Photoresist monomer having spiro cyclic ketal group, polymer thereof and photoresist composition including the same DONGJIN SEMICHEM CO., LTD. (KR) 2008-09-02 US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (3 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-11640114-B2 Compound, resin, photoresist composition and process for producing photoresist pattern HAX1, BRIX1, RXRA CA2 4741/4885TMEM97 4362/4885SIGMAR1 1677/4885
US-20180059545-A1 MONOMERS, POLYMERS AND PHOTORESIST COMPOSITIONS PARG, LCP1, ALG3 CA2 4082/4885TMEM97 4863/4885SIGMAR1 3676/4885
US-20120282548-A1 PATTERN FORMING METHOD, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION AND RESIST FILM RAD51, RER1, RXRA CA2 3775/4885TMEM97 3731/4885SIGMAR1 3377/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.