SCHEMBL10181563

SCHEMBL10181563

C=C(C)C(=O)OCCC(=O)OC1CC2CC1CC2C#N

nearest known ligand 0.33

Predicted protein targets (top 3)

geneUniProtsupporting neighboursconfidence
▸ THRB P10828 1/20 0.33
▸ TSHR P16473 2/20 0.33
▸ ALDH1A1 P00352 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL21505907 0.83 ALDH1A1 (0.31) ALDH1A1
SCHEMBL304110 0.83 ALDH1A1 (0.31) ALDH1A1
SCHEMBL24687529 0.83 ALDH1A1 (0.31) ALDH1A1
SCHEMBL18400941 0.74 ALDH1A1 (0.43) THRBTSHRALDH1A1
SCHEMBL19718945 0.74 ALDH1A1 (0.43) THRBTSHRALDH1A1
SCHEMBL10180142 0.72 — —
SCHEMBL13458358 0.70 THRB (0.41) THRBTSHRALDH1A1
SCHEMBL23059482 0.70 — —
SCHEMBL27818005 0.70 NAAA (0.49) THRBTSHRALDH1A1
SCHEMBL25239579 0.69 NAAA (0.50) THRBTSHRALDH1A1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8802349-B2 Actinic ray-sensitive or radiation-sensitive resin composition and resist film and pattern forming method using the composition FUJIFILM CORPORATION (JP) 2014-08-12 — — US disclosed
US-8802349-B2 Actinic ray-sensitive or radiation-sensitive resin composition and resist film and pattern forming method using the composition FUJIFILM CORPORATION (JP) 2014-08-12 — — US disclosed
US-20120015301-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION AND RESIST FILM AND PATTERN FORMING METHOD USING THE COMPOSITION FUJIFILM CORPORATION (JP) 2012-01-19 — — US disclosed
US-20120015301-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION AND RESIST FILM AND PATTERN FORMING METHOD USING THE COMPOSITION FUJIFILM CORPORATION (JP) 2012-01-19 — — US disclosed
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