SCHEMBL10183033

SCHEMBL10183033

CCC(C)c1ccc(OS(=O)(=O)C(F)(F)C(F)(F)C(F)(F)S(=O)(=O)O)c2ccccc12

nearest known ligand 0.33

Predicted protein targets (top 7)

geneUniProtsupporting neighboursconfidence
TSHR P16473 2/20 0.33
SLC2A1 P11166 1/20 0.32
FABP4 P15090 1/20 0.31
HTT P42858 1/20 0.31
MCOLN3 Q8TDD5 1/20 0.31
ALDH1A1 P00352 1/20 0.31
LMNA P02545 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL9966116 0.77 SLC2A1 (0.34) SLC2A1
SCHEMBL18561740 0.77 CASP1 (0.40) ALDH1A1
SCHEMBL18219814 0.77 SLC2A1 (0.33) SLC2A1FABP4ALDH1A1
SCHEMBL12040205 0.77 FABP4 (0.31) TSHRSLC2A1FABP4HTTMCOLN3
SCHEMBL16638146 0.75
SCHEMBL15450682 0.75 CDC25B (0.40) FABP4
SCHEMBL682247 0.74 ALDH1A1 (0.43) TSHRALDH1A1
SCHEMBL16638365 0.74 ALDH1A1 (0.39) TSHRSLC2A1HTTALDH1A1
SCHEMBL2742165 0.74 CAPN1 (0.30) SLC2A1LMNA
SCHEMBL12040222 0.72 HPGDS (0.36) SLC2A1FABP4ALDH1A1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 5 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9568824-B2 Actinic-ray- or radiation-sensitive resin composition, resist film therefrom and method of forming pattern therewith FUJIFILM CORPORATION (JP) 2017-02-14 US disclosed
US-9005870-B2 Actinic-ray- or radiation-sensitive resin composition and method of forming pattern using the composition FUJIFILM CORPORATION (JP) 2015-04-14 US disclosed
US-20120034559-A1 ACTINIC-RAY- OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM THEREFROM AND METHOD OF FORMING PATTERN THEREWITH FUJIFILM CORPORATION (JP) 2012-02-09 US disclosed
US-20110318693-A1 ACTINIC-RAY- OR RADIATION-SENSITIVE RESIN COMPOSITION, AND RESIST FILM AND PATTERN FORMING METHOD USING THE SAME FUJIFILM CORPORATION (JP) 2011-12-29 US disclosed
US-20110183263-A1 ACTINIC-RAY- OR RADIATION-SENSITIVE RESIN COMPOSITION AND METHOD OF FORMING PATTERN USING THE COMPOSITION FUJIFILM CORPORATION (JP) 2011-07-28 US disclosed