SCHEMBL10447102

SCHEMBL10447102

CCOCC1CCCc2ccccc21

nearest known ligand 0.52

Predicted protein targets (top 7)

geneUniProtsupporting neighboursconfidence
IDO1 P14902 2/20 0.46
CYP19A1 P11511 1/20 0.44
TBXAS1 P24557 1/20 0.44
SIGMAR1 Q99720 1/20 0.43
ALDH1A1 P00352 1/20 0.43
XBP1 P17861 1/20 0.43
HTT P42858 1/20 0.43

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL10447649 0.90 HTR6 (0.47) IDO1
SCHEMBL19249507 0.84 IDO1 (0.46) IDO1CYP19A1TBXAS1SIGMAR1ALDH1A1
SCHEMBL28768500 0.83 IDO1 (0.49) IDO1CYP19A1TBXAS1SIGMAR1
SCHEMBL20433849 0.83 IDO1 (0.49) IDO1CYP19A1TBXAS1SIGMAR1
SCHEMBL30129841 0.81 CYP19A1 (0.49) IDO1CYP19A1TBXAS1SIGMAR1HTT
SCHEMBL598590 0.81 CYP19A1 (0.49) IDO1CYP19A1TBXAS1SIGMAR1HTT
SCHEMBL22721447 0.81 CYP19A1 (0.49) IDO1CYP19A1TBXAS1SIGMAR1HTT
SCHEMBL11948316 0.79 IDO1 (0.44) IDO1CYP19A1TBXAS1SIGMAR1
SCHEMBL5541899 0.78 CYP19A1 (0.54) CYP19A1TBXAS1SIGMAR1
Ether SCHEMBL10810294 0.77 IDO1 (0.46) IDO1ALDH1A1XBP1HTT

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 140 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-11687000-B2 Sulfonium compound, chemically amplified resist composition, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-06-27 US disclosed
US-11560355-B2 Onium salt, chemically amplified resist composition, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-01-24 US disclosed
US-11333974-B2 Onium salt, chemically amplified resist composition, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2022-05-17 US disclosed
US-20200223796-A1 ONIUM SALT, CHEMICALLY AMPLIFIED RESIST COMPOSITION, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2020-07-16 US disclosed
US-20200159115-A1 NOVEL SALT COMPOUND, CHEMICALLY AMPLIFIED RESIST COMPOSITION, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2020-05-21 US disclosed
US-20200133122-A1 NOVEL ONIUM SALT, CHEMICALLY AMPLIFIED RESIST COMPOSITION, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2020-04-30 US disclosed
US-10457761-B2 Polymer, resist composition, and pattern forming process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2019-10-29 US disclosed
US-10191373-B2 Method for producing polymer SHIN-ETSU CHEMICAL CO., LTD. (JP) 2019-01-29 US disclosed
US-10025180-B2 Sulfonium compound, resist composition, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2018-07-17 US disclosed
US-9989847-B2 Onium salt compound, resist composition, and pattern forming process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2018-06-05 US disclosed
US-20130017492-A1 PATTERNING PROCESS AND RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-01-17 US disclosed
US-20130017492-A1 PATTERNING PROCESS AND RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-01-17 US disclosed
US-20120315581-A1 PATTERNING PROCESS AND RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-12-13 US disclosed
US-20120315581-A1 PATTERNING PROCESS AND RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-12-13 US disclosed
US-20120308930-A1 PATTERNING PROCESS AND RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-12-06 US disclosed
US-20120308930-A1 PATTERNING PROCESS AND RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-12-06 US disclosed
US-20120202158-A1 PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-08-09 US disclosed
US-20120202158-A1 PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-08-09 US disclosed
US-20120183903-A1 PATTERNING PROCESS AND RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-07-19 US disclosed
US-20120183903-A1 PATTERNING PROCESS AND RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-07-19 US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (7 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-11333974-B2 Onium salt, chemically amplified resist composition, and patterning process ARF5, EIF2B3, KAT5 IDO1 3630/4885CYP19A1 4201/4885TBXAS1 4781/4885
US-11560355-B2 Onium salt, chemically amplified resist composition, and patterning process ARF5, EIF2B5, EIF2B3 IDO1 3197/4885CYP19A1 3516/4885TBXAS1 4795/4885
US-20200223796-A1 ONIUM SALT, CHEMICALLY AMPLIFIED RESIST COMPOSITION, AND PATTERNING PROCESS ARF5, EIF2B5, EIF2B3 IDO1 3197/4885CYP19A1 3516/4885TBXAS1 4795/4885
US-11687000-B2 Sulfonium compound, chemically amplified resist composition, and patterning process ETV6, PKD1, PKD2 IDO1 4605/4885CYP19A1 2372/4885TBXAS1 4524/4885
US-10025180-B2 Sulfonium compound, resist composition, and patterning process SRR, SPIN2B, SPIN4 IDO1 4414/4885CYP19A1 4484/4885TBXAS1 4019/4885
US-20200133122-A1 NOVEL ONIUM SALT, CHEMICALLY AMPLIFIED RESIST COMPOSITION, AND PATTERNING PROCESS ARF5, ARF4, EIF2B3 IDO1 3997/4885CYP19A1 4282/4885TBXAS1 4795/4885
US-20200159115-A1 NOVEL SALT COMPOUND, CHEMICALLY AMPLIFIED RESIST COMPOSITION, AND PATTERNING PROCESS ETV6, EEF2, EEF1G IDO1 4810/4885CYP19A1 4338/4885TBXAS1 4591/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.