SCHEMBL104602

SCHEMBL104602

CCOCC(C)OC(=O)CC

nearest known ligand 0.34

Predicted protein targets (top 16)

geneUniProtsupporting neighboursconfidence
MEN1 O00255 1/20 0.34
CYP2C19 P33261 1/20 0.34
RECQL P46063 1/20 0.34
KMT2A Q03164 1/20 0.34
FAAH O00519 4/20 0.32
CNR1 P21554 1/20 0.32
CNR2 P34972 1/20 0.32
LMNA P02545 2/20 0.31
TDP1 Q9NUW8 1/20 0.31
ALDH1A1 P00352 2/20 0.31
TSHR P16473 1/20 0.31
MGAM O43451 1/20 0.31
GAA P10253 1/20 0.31
SI P14410 1/20 0.31
MGAM2 Q2M2H8 1/20 0.31
SOAT1 P35610 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL4592181 0.92 HSD17B10 (0.41) MEN1CYP2C19RECQLKMT2ATDP1
SCHEMBL2700958 0.92 TDP1 (0.39) MEN1CYP2C19RECQLKMT2ATDP1
SCHEMBL27646125 0.90 ALDH1A1 (0.41) MEN1CYP2C19RECQLKMT2ATDP1
SCHEMBL27646136 0.86 TDP1 (0.36) MEN1CYP2C19RECQLKMT2ALMNA
SCHEMBL9937292 0.85 FAAH (0.31) FAAHCNR1CNR2LMNATDP1
SCHEMBL27646088 0.85 L3MBTL1 (0.33) MEN1CYP2C19RECQLKMT2AFAAH
SCHEMBL4592498 0.84 HSD17B10 (0.41) TDP1
SCHEMBL9937646 0.83 FAAH (0.30) FAAHCNR1CNR2
SCHEMBL7038035 0.83 ALDH1A1 (0.43) FAAHCNR1CNR2LMNATDP1
SCHEMBL445697 0.83 TDP1 (0.50) MEN1CYP2C19RECQLKMT2AFAAH

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 1429 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-4720077-A1 ORGANOMETALLIC TIN OXO CARBOXYLATE CLUSTERS WITH MIXED ORGANIC LIGANDS FOR EUV LITHOGRAPHY Merck Patent GmbH (DE) 2026-04-08 EP claimed
WO-2025099042-A1 ORGANOMETALLIC SN OXO CARBOXYLATE CLUSTERS WITH CARBOXYLATE LIGANDS THAT CONTAIN A LINEAR OR CYCLIC ESTER FUNCTIONALITY MERCK PATENT GMBH (DE) 2025-05-15 WO claimed
CN-119998727-A Chemically amplified positive resist composition for improving pattern profile and enhancing etch resistance YC化学制品株式会社 2025-05-13 CN claimed
CN-114556216-B Positive photosensitive resin composition and display element using same 株式会社东进世美肯 2025-04-25 CN claimed
CN-113260922-B Positive photosensitive resin composition 株式会社东进世美肯 2025-02-25 CN claimed
WO-2025032041-A1 ORGANOMETALLIC CLUSTER CONTAINING SULFUR FOR EUV LITHOGRAPHY BACKGROUND MERCK PATENT GMBH (DE) 2025-02-13 WO claimed
US-12216403-B2 Positive photosensitive resin composition and display device using the same DONJIN SEMICHEM CO., LTD. (KR) 2025-02-04 US claimed
CN-110967927-B Photosensitive resin composition and display device including the same 三星显示有限公司 2025-01-28 CN claimed
WO-2024246119-A1 ORGANOMETALLIC TIN OXO CARBOXYLATE CLUSTERS WITH MIXED ORGANIC LIGANDS FOR EUV LITHOGRAPHY MERCK PATENT GMBH (DE) 2024-12-05 WO claimed
EP-4433873-A2 COMPOSITIONS AND METHODS FOR IMPROVING METAL STRUCTURE FABRICATION BY WET CHEMICAL ETCH Merck Patent GmbH (DE) 2024-09-25 EP claimed
US-8278021-B2 Method of fabricating a thin film transistor substrate and a photosensitive composition used in the thin film transistor substrate SAMSUNG ELECTRONICS CO., LTD. (KR) 2012-10-02 US claimed
WO-2012082760-A1 BATTERY ELECTROLYTE SOLUTION CONTAINING CERTAIN ESTER-BASED SOLVENTS, AND BATTERIES CONTAINING SUCH AN ELECTROLYTE SOLUTION DOW GLOBAL TECHNOLOGIES LLC (US) 2012-06-21 WO claimed
US-8193307-B2 Synthesis of photoresist polymer SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-06-05 US claimed
EP-2146246-A1 Negative resist composition and patterning process Shin-Etsu Chemical Co., Ltd. (JP) 2010-01-20 EP claimed
US-7635553-B2 Pattern forming method and resist composition used therefor FUJIFILM CORPORATION (JP) 2009-12-22 US claimed
US-20090176936-A1 Ink composition and method of forming a pattern using the same LG DISPLAY CO., LTD. (KR) 2009-07-09 US claimed
US-20090030103-A1 METHOD OF FABRICATING A THIN FILM TRANSISTOR SUBSTRATE AND A PHOTOSENSITIVE COMPOSITION USED IN THE THIN FILM TRANSISTOR SUBSTRATE SAMSUNG ELECTRONICS CO., LTD. (KR) 2009-01-29 US claimed
US-6794108-B1 COMPOUND CAPABLE OF GENERATING ACID BY ACTINIC RADIATION; POLYMER AND COMPOUND THAT DECOMPOSE TO A SULFONIC ACID; STORAGE STABILITY FUJI PHOTO FILM CO., LTD. (JP) 2004-09-21 US claimed
US-6379860-B1 RESIN OBTAINED BY REACTION OF ALKALI-SOLUBLE RESIN HAVING PHENOLIC HYDROXYL GROUPS WITH ENOL ETHER DECOMPOSES IN ACID TO INCREASE SOLUBILITY; HEAT RESISTANCE, SENSITIVIY, RESOLUTION; GENERATES ACID UPON ACTINIC RADIATION EXPOSURE FUJI PHOTO FILM CO., LTD. (JP) 2002-04-30 US claimed
CN-1262317-A Ether ester type dry cleaning solvent composition LI JINYAN (CN) 2000-08-09 CN claimed