SCHEMBL107600

SCHEMBL107600

CC(C)(C)c1ccc([S+]2CCCC2)cc1

nearest known ligand 0.42

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
TSHR P16473 1/20 0.42
LMNA P02545 2/20 0.41
TYR P14679 1/20 0.41
KIF11 P52732 2/20 0.35
ALDH1A1 P00352 3/20 0.35
GAA P10253 2/20 0.35
HTT P42858 2/20 0.35
SMN1; SMN2 Q16637 2/20 0.35
MEN1 O00255 1/20 0.35
KMT2A Q03164 1/20 0.35
NPC1 O15118 2/20 0.33
MAPT P10636 2/20 0.33
RAB9A P51151 2/20 0.33
HPGD P15428 1/20 0.33
MAPK1 P28482 1/20 0.33
KDM4E B2RXH2 1/20 0.33
SIGMAR1 Q99720 1/20 0.33
NPY1R P25929 1/20 0.33
NPY2R P49146 1/20 0.33
NPY4R P50391 1/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL98257 0.98 TSHR (0.41) TSHRLMNATYRKIF11ALDH1A1
Bromide SCHEMBL1923160 0.98 TSHR (0.41) TSHRLMNATYRKIF11ALDH1A1
SCHEMBL1696855 0.81 RAB9A (0.41) TSHRLMNATYRKIF11ALDH1A1
SCHEMBL4569615 0.79 TSHR (0.37) TSHRLMNATYRALDH1A1GAA
SCHEMBL12257129 0.79 CNR2 (0.41) LMNASMN1; SMN2NPC1MAPTRAB9A
Hydrochloric Acid SCHEMBL31108772 0.79 RAB9A (0.41) TSHRLMNATYRKIF11ALDH1A1
SCHEMBL7059010 0.76 LMNA (0.38) TSHRLMNAALDH1A1GAASMN1; SMN2
SCHEMBL31400064 0.74 RAB9A (0.40) TSHRLMNATYRKIF11ALDH1A1
SCHEMBL137128 0.71 ACHE (0.40) LMNAALDH1A1GAASMN1; SMN2ACHE
SCHEMBL424728 0.71 TSHR (0.73) TSHRLMNATYRKIF11ALDH1A1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 242 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-116096760-B Hindered amine stabilized UV-active organopalladium catalyzed polycycloolefin compositions as optical materials 住友电木株式会社 2024-08-02 CN disclosed
US-11897991-B2 UV active derivatives of Pd(AcAc)2 catalyzed polycycloolefin compositions as optical materials PROMERUS, LLC (US) 2024-02-13 US disclosed
WO-2023158767-A1 DUAL CATALYST SYSTEM FOR MASS VINYL ADDITION AND CATIONIC POLYMERIZABLE COMPOSITIONS PROMERUS, LLC (US) 2023-08-24 WO disclosed
WO-2023158768-A1 DUAL CATALYST SYSTEM FOR MASS ROMP AND CATIONIC POLYMERIZABLE COMPOSITIONS PROMERUS, LLC (US) 2023-08-24 WO disclosed
US-11667731-B2 Stabilized UV active organopalladium compounds as vinyl addition catalysts PROMERUS, LLC (US) 2023-06-06 US disclosed
CN-116096760-A Hindered amine stabilized UV-active organopalladium catalyzed polycycloolefin compositions as optical materials 普罗米鲁斯有限责任公司 2023-05-09 CN disclosed
US-20230038665-A1 STABILIZED UV ACTIVE ORGANOPALLADIUM COMPOUNDS AS VINYL ADDITON CATALYSTS PROMERUS, LLC (US) 2023-02-09 US disclosed
WO-2023278649-A1 STABILIZED UV ACTIVE ORGANOPALLADIUM COMPOUNDS AS VINYL ADDITION CATALYSTS PROMERUS, LLC (US) 2023-01-05 WO disclosed
EP-4085083-A1 UV ACTIVE DERIVATIVES OF PD(ACAC)2 CATALYZED POLYCYCLOOLEFIN COMPOSITIONS AS OPTICAL MATERIALS Promerus, LLC (US) 2022-11-09 EP disclosed
US-20170285482-A1 ORGANIC PROCESSING LIQUID AND PATTERN FORMING METHOD FUJIFILM CORPORATION (JP) 2017-10-05 US disclosed
US-20100304300-A1 PHOTOSENSITIVE COMPOSITION AND PATTERN-FORMING METHOD USING THE PHOTOSENSITIVE COMPOSITION FUJIFILM CORPORATION (JP) 2010-12-02 US disclosed
US-20090325102-A1 PHOTOSENSITIVE COMPOSITION AND PATTERN FORMING METHOD USING SAME FUJIFILM CORPORATION (JP) 2009-12-31 US disclosed
US-20090325103-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION AND PATTERN FORMING METHOD USING SAME FUJIFILM CORPORATION (JP) 2009-12-31 US disclosed
US-7592125-B2 Chemically-amplified positive photoresist compositions that contain a photoactive component and blend of at least two distinct resins; a first resin that comprises hydroxy naphthyl groups and a second cross-linked resin; reduced line edge roughness ROHM AND HAAS ELECTRIC MATERIALS LLC (US) 2009-09-22 US disclosed
US-7592126-B2 Positive resist composition and pattern forming method using the resist composition FUJIFILM CORPORATION (JP) 2009-09-22 US disclosed
US-7465528-B2 Positive-working photosensitive composition and pattern forming method using the same FUJIFILM CORPORATION (JP) 2008-12-16 US disclosed
US-7341817-B2 Photosensitive composition, compound for use in the photosensitive composition, and pattern forming method using the photosensitive composition FUJIFILM CORPORATION (JP) 2008-03-11 US disclosed
US-20070087288-A1 Positive-working photosensitive composition and pattern forming method using the same FUJIFILM CORPORATION 2007-04-19 US disclosed
US-20030134227-A1 Cyclic sulfonium and sulfoxonium photoacid generators and photoresists comprising same SHIPLEY COMPANY, LLC 2003-07-17 US disclosed
EP-1308781-A2 Cyclic sulfonium and sulfoxonium photoacid generators and photoresists containing them Shipley Co. L.L.C. (US) 2003-05-07 EP disclosed