SCHEMBL12418948

SCHEMBL12418948

COC(C)c1cc(CO)c(O)c(CO)c1

nearest known ligand 0.37

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
SHBG P04278 1/20 0.37
AKR1C2 P52895 1/20 0.36
AKR1C1 Q04828 1/20 0.36
PDE4A P27815 1/20 0.35
PDE4B Q07343 1/20 0.35
PDE4C Q08493 1/20 0.35
PDE4D Q08499 1/20 0.35
EGFR P00533 2/20 0.35
CDK4 P11802 2/20 0.35
CCND1 P24385 2/20 0.35
KDM4E B2RXH2 4/20 0.34
CASP6 P55212 1/20 0.34
GABRA1 P14867 1/20 0.32
GABRB2 P47870 1/20 0.32
ADRB2 P07550 2/20 0.32
CYP1A2 P05177 2/20 0.32
CYP2D6 P10635 2/20 0.32
TSHR P16473 1/20 0.32
NFKB1 P19838 1/20 0.32
HIF1A Q16665 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL19965527 0.86 SHBG (0.36) SHBGHIF1ASMN1; SMN2
SCHEMBL4455166 0.79 GABRA1 (0.45) SHBGKDM4ECASP6GABRA1GABRB2
SCHEMBL3081907 0.78 KDM4E (0.41) SHBGKDM4ECASP6GABRA1GABRB2
SCHEMBL27536560 0.75 SHBG (0.39) SHBGKDM4ECASP6GABRA1GABRB2
SCHEMBL16865574 0.75 SHBG (0.39) SHBGKDM4ECASP6GABRA1GABRB2
SCHEMBL10130846 0.74 PDE4A (0.43) PDE4APDE4BPDE4CPDE4DKDM4E
SCHEMBL4459305 0.73 ALDH1A1 (0.43) SHBGKDM4ECASP6GABRA1GABRB2
SCHEMBL27049060 0.73 HSD17B10 (0.44) SHBGKDM4ECASP6ADRB2CYP1A2
SCHEMBL14028988 0.72 ADRB2 (0.39) SHBGKDM4ECASP6ADRB2CYP1A2
SCHEMBL22991586 0.72 TTR (0.44) AKR1C2AKR1C1EGFRCDK4CCND1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 21 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20180074403-A1 POSITIVE PHOTOSENSITIVE RESIN COMPOSITION, PATTERNED CURED FILM PRODUCTION METHOD, PATTERNED CURED FILM, AND ELECTRONIC COMPONENT HD MICROSYSTEMS, LTD. (JP) 2018-03-15 US disclosed
EP-2133743-B1 PHOTOSENSITIVE RESIN COMPOSITION, PROCESS FOR PRODUCING PATTERNED HARDENED FILM WITH USE THEREOF AND ELECTRONIC PART HITACHI CHEMICAL DUPONT MICROSYSTEMS LTD (JP) 2018-01-24 EP disclosed
US-9274422-B2 Photosensitive resin composition, method for forming pattern-cured film using photosensitive resin composition, and electronic component HITACHI CHEMICAL DUPONT MICROSYSTEMS, LTD. (JP) 2016-03-01 US disclosed
US-9274422-B2 Photosensitive resin composition, method for forming pattern-cured film using photosensitive resin composition, and electronic component HITACHI CHEMICAL DUPONT MICROSYSTEMS, LTD. (JP) 2016-03-01 US disclosed
US-8871422-B2 Negative-type photosensitive resin composition, pattern forming method and electronic parts HITACHI CHEMICAL DUPONT MICROSYSTEMS LTD. (JP) 2014-10-28 US disclosed
US-8871422-B2 Negative-type photosensitive resin composition, pattern forming method and electronic parts HITACHI CHEMICAL DUPONT MICROSYSTEMS LTD. (JP) 2014-10-28 US disclosed
US-8758977-B2 Negative-type photosensitive resin composition, pattern forming method and electronic parts HITACHI CHEMICAL DUPONT MICROSYSTEMS, LTD. (JP) 2014-06-24 US disclosed
US-8758977-B2 Negative-type photosensitive resin composition, pattern forming method and electronic parts HITACHI CHEMICAL DUPONT MICROSYSTEMS, LTD. (JP) 2014-06-24 US disclosed
US-20140120462-A1 PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR FORMING PATTERN-CURED FILM USING PHOTOSENSITIVE RESIN COMPOSITION, AND ELECTRONIC COMPONENT HITACHI CHEMICAL DUPONT MICROSYSTEMS, LTD. (JP) 2014-05-01 US disclosed
US-20140120462-A1 PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR FORMING PATTERN-CURED FILM USING PHOTOSENSITIVE RESIN COMPOSITION, AND ELECTRONIC COMPONENT HITACHI CHEMICAL DUPONT MICROSYSTEMS, LTD. (JP) 2014-05-01 US disclosed
US-8298747-B2 Photosensitive resin composition, process for producing patterned hardened film with use thereof and electronic part HITACHI CHEMICAL DUPONT MICROSYSTEMS, LTD. (JP) 2012-10-30 US disclosed
US-20110171436-A1 NEGATIVE-TYPE PHOTOSENSITIVE RESIN COMPOSITION, PATTERN FORMING METHOD AND ELECTRONIC PARTS HITACHI CHEMICAL DUPONT MICROSYSTEMS, LTD. (JP) 2011-07-14 US disclosed
US-20110171436-A1 NEGATIVE-TYPE PHOTOSENSITIVE RESIN COMPOSITION, PATTERN FORMING METHOD AND ELECTRONIC PARTS HITACHI CHEMICAL DUPONT MICROSYSTEMS, LTD. (JP) 2011-07-14 US disclosed
US-20100159217-A1 NEGATIVE-TYPE PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR FORMING PATTERNS, AND ELECTRONIC PARTS HITACHI CHEMICAL DUPONT MICROSYSTEMS, LTD (JP) 2010-06-24 US disclosed
US-20100159217-A1 NEGATIVE-TYPE PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR FORMING PATTERNS, AND ELECTRONIC PARTS HITACHI CHEMICAL DUPONT MICROSYSTEMS, LTD (JP) 2010-06-24 US disclosed
US-20100092879-A1 PHOTOSENSITIVE RESIN COMPOSITION, PROCESS FOR PRODUCING PATTERNED HARDENED FILM WITH USE THEREOF AND ELECTRONIC PART HITACHI CHEMICAL DUPONT MICROSYSTEMS, LTD. (JP) 2010-04-15 US disclosed
US-20100092879-A1 PHOTOSENSITIVE RESIN COMPOSITION, PROCESS FOR PRODUCING PATTERNED HARDENED FILM WITH USE THEREOF AND ELECTRONIC PART HITACHI CHEMICAL DUPONT MICROSYSTEMS, LTD. (JP) 2010-04-15 US disclosed
EP-2133743-A1 PHOTOSENSITIVE RESIN COMPOSITION, PROCESS FOR PRODUCING PATTERNED HARDENED FILM WITH USE THEREOF AND ELECTRONIC PART Hitachi Chemical DuPont Microsystems, Ltd. (JP) 2009-12-16 EP disclosed
US-20090181224-A1 NEGATIVE-TYPE PHOTOSENSITIVE RESIN COMPOSITION, PATTERN FORMING METHOD AND ELECTRONIC PARTS HITACHI CHEMICAL DUPONT MICROSYSTEMS LTD. (JP) 2009-07-16 US disclosed
US-20090181224-A1 NEGATIVE-TYPE PHOTOSENSITIVE RESIN COMPOSITION, PATTERN FORMING METHOD AND ELECTRONIC PARTS HITACHI CHEMICAL DUPONT MICROSYSTEMS LTD. (JP) 2009-07-16 US disclosed