SCHEMBL13027426

SCHEMBL13027426

COc1ccc(C)c(C)c1CC[Si](OC)(OC)OC

nearest known ligand 0.32

Predicted protein targets (top 14)

geneUniProtsupporting neighboursconfidence
▸ KDM4E B2RXH2 3/20 0.32
▸ ALDH1A1 P00352 2/20 0.32
▸ MAPT P10636 3/20 0.32
▸ ACHE P22303 1/20 0.31
▸ MEN1 O00255 2/20 0.31
▸ POLB P06746 2/20 0.31
▸ KMT2A Q03164 2/20 0.31
▸ NPSR1 Q6W5P4 1/20 0.31
▸ LMNA P02545 1/20 0.30
▸ SMN1; SMN2 Q16637 1/20 0.30
▸ SLC6A4 P31645 1/20 0.30
▸ ATM Q13315 1/20 0.30
▸ GAA P10253 1/20 0.30
▸ PKM P14618 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL15672394 0.89 KMT2A (0.33) KDM4EALDH1A1MAPTACHEMEN1
SCHEMBL13027381 0.87 NOS2 (0.32) POLB
SCHEMBL15672383 0.87 KDM4E (0.30) KDM4EALDH1A1
SCHEMBL13027405 0.86 ALDH1A1 (0.32) KDM4EALDH1A1MAPTACHEMEN1
SCHEMBL13027536 0.84 — —
SCHEMBL15672392 0.84 ALDH1A1 (0.33) KDM4EALDH1A1MAPTACHEMEN1
SCHEMBL13027242 0.84 MAPT (0.33) KDM4EALDH1A1MAPTACHEMEN1
SCHEMBL13027428 0.79 CA12 (0.37) KDM4EALDH1A1MAPTPOLBLMNA
SCHEMBL13027382 0.78 PDCD1LG2 (0.31) ALDH1A1MEN1KMT2A
SCHEMBL13027454 0.78 AOC3 (0.38) KDM4EALDH1A1MAPTSMN1; SMN2SLC6A4

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 2 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8697330-B2 Composition for forming a silicon-containing antireflection film, substrate having the silicon-containing antireflection film from the composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-04-15 — — US disclosed
US-20100285407-A1 Composition for forming a silicon-containing antireflection film, substrate having the silicon-containing antireflection film from the composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-11-11 — — US disclosed
Send feedback