SCHEMBL135098

SCHEMBL135098

CC(C)(C)C1C2CC3CC(C2)CC1(C(=O)O)C3

nearest known ligand 0.34

Predicted protein targets (top 13)

geneUniProtsupporting neighboursconfidence
LMNA P02545 1/20 0.33
EPHX2 P34913 2/20 0.33
THRB P10828 1/20 0.32
CYP2C9 P11712 1/20 0.32
GAA P10253 1/20 0.32
HSD11B1 P28845 2/20 0.32
HSD11B2 P80365 2/20 0.32
EPHX1 P07099 1/20 0.31
ALDH1A1 P00352 2/20 0.31
MEN1 O00255 1/20 0.31
MAPK1 P28482 1/20 0.31
KMT2A Q03164 1/20 0.31
HTT P42858 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL29791378 0.82 APLNR (0.30)
SCHEMBL1088728 0.75 THRB (0.35) EPHX2THRBCYP2C9GAAHSD11B1
SCHEMBL700514 0.74 ALDH1A1 (0.36) LMNAHSD11B1HSD11B2ALDH1A1HTT
SCHEMBL702570 0.73
SCHEMBL26881004 0.72 MEN1 (0.33) GAAHSD11B1HSD11B2MEN1KMT2A
SCHEMBL26881003 0.72 MEN1 (0.33) GAAHSD11B1HSD11B2MEN1KMT2A
SCHEMBL26881005 0.72 MEN1 (0.33) GAAHSD11B1HSD11B2MEN1KMT2A
SCHEMBL59961 0.72 CYP2C9 (0.36) EPHX2THRBCYP2C9GAAHSD11B1
SCHEMBL28441342 0.72 HSD11B1 (0.30) HSD11B1
SCHEMBL74823 0.71 THRB (0.35) EPHX2THRBCYP2C9GAAHSD11B1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 66 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20230393469-A1 RADIATION-SENSITIVE RESIN COMPOSITION, METHOD FOR FORMING RESIST PATTERN, POLYMER, AND COMPOUND JSR CORPORATION (JP) 2023-12-07 US disclosed
US-9200098-B2 Radiation-sensitive composition and compound JSR CORPORATION (JP) 2015-12-01 US disclosed
US-20150241779-A1 REAGENT FOR ENHANCING GENERATION OF CHEMICAL SPECIES OSAKA UNIVERSITY (JP) 2015-08-27 US disclosed
WO-2015125495-A1 Reagent for Enhancing Generation of Chemical Species TOYO GOSEI CO., LTD. (JP) 2015-08-27 WO disclosed
US-9029067-B2 Resin composition for making resist pattern insoluble, and method for formation of resist pattern by using the same JSR CORPORATION (JP) 2015-05-12 US disclosed
US-8968980-B2 Radiation-sensitive resin composition and compound JSR CORPORATION (JP) 2015-03-03 US disclosed
US-20150004547-A1 RESIN COMPOSITION FOR MAKING RESIST PATTERN INSOLUBLE, AND METHOD FOR FORMATION OF RESIST PATTERN BY USING THE SAME JSR CORPORATION (JP) 2015-01-01 US disclosed
US-20140363773-A1 PATTERN-FORMING METHOD JSR CORPORATION (JP) 2014-12-11 US disclosed
US-8877429-B2 Resin composition for making resist pattern insoluble, and method for formation of resist pattern by using the same JSR CORPORATION (JP) 2014-11-04 US disclosed
US-8802348-B2 Radiation-sensitive resin composition JSR CORPORATION (JP) 2014-08-12 US disclosed
US-20090274977-A1 COMPOUND AND RADIATION-SENSITIVE COMPOSITION JSR CORPORATION (JP) 2009-11-05 US disclosed
EP-2100870-A1 COMPOUND AND RADIATION-SENSITIVE COMPOSITION JSR Corporation (JP) 2009-09-16 EP disclosed
EP-1961739-A1 NOVEL COMPOUND, POLYMER, AND RESIN COMPOSITION JSR Corporation (JP) 2008-08-27 EP disclosed
EP-1953595-A1 RADIATION-SENSITIVE RESIN COMPOSITION JSR Corporation (JP) 2008-08-06 EP disclosed
CN-1189792-C Photoresist composition containing cycloolefine polymer with lactone part IBM (US) 2005-02-16 CN disclosed
CN-1322967-A Photoresist composition containing cycloolefine polymer with lactone part IBM (US) 2001-11-21 CN disclosed
EP-0249139-B2 Resist compositions and use MICROSI INC (US) 1998-03-11 EP disclosed
US-5362607-A Photo-patternable in absence of moisture; treating substrate with positive resist composition, baking, irradiating resist in patterned way, heating, developing; resist of water-soluble phenolic resin, tertiary butyl compound, aryl onium salt MICROSI, INC. (US) 1994-11-08 US disclosed
US-5310619-A Resist compositions comprising a phenolic resin, an acid forming onium salt and a tert-butyl ester or tert-butyl carbonate which is acid-cleavable MICROSI, INC. (US) 1994-05-10 US disclosed
EP-0249139-A2 Resist compositions and use MicroSi, Inc. (a Delaware corporation) (US) 1987-12-16 EP disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (2 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20230393469-A1 RADIATION-SENSITIVE RESIN COMPOSITION, METHOD FOR FORMING RESIST PATTERN, POLYMER, AND COMPOUND RER1, RAD51, RFT1 LMNA 3566/4885EPHX2 678/4885THRB 2743/4885
US-20090274977-A1 COMPOUND AND RADIATION-SENSITIVE COMPOSITION RAD51, SLC11A2, XRCC6 LMNA 528/4885EPHX2 3619/4885THRB 3996/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.