SCHEMBL1743908

SCHEMBL1743908

[N-]=[N+]=C(C(=O)C1CCCCC1)S(=O)(=O)Cc1ccccc1

nearest known ligand 0.42

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 8/20 0.42
HPGD P15428 4/20 0.42
HSD17B10 Q99714 3/20 0.42
USP2 O75604 2/20 0.42
CYP2C19 P33261 1/20 0.39
SMN1; SMN2 Q16637 2/20 0.39
TSHR P16473 1/20 0.39
ALOX12 P18054 3/20 0.39
EPHX2 P34913 1/20 0.38
NPSR1 Q6W5P4 2/20 0.38
KDM4E B2RXH2 1/20 0.38
MEN1 O00255 1/20 0.38
GAA P10253 1/20 0.38
HTT P42858 1/20 0.38
KMT2A Q03164 1/20 0.38
CA12 O43570 1/20 0.37
CA1 P00915 1/20 0.37
CA2 P00918 1/20 0.37
CA4 P22748 1/20 0.37
CA6 P23280 1/20 0.37

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL29904429 0.79 POLB (0.41) ALDH1A1HPGDSMN1; SMN2EPHX2KDM4E
SCHEMBL8751745 0.76 CES2 (0.43) ALDH1A1TSHRGAAKMT2ARECQL
SCHEMBL1743909 0.72 EPHX2 (0.43) ALDH1A1SMN1; SMN2TSHRALOX12EPHX2
SCHEMBL7962771 0.71 TSHR (0.43) ALDH1A1HPGDHSD17B10SMN1; SMN2TSHR
SCHEMBL9404042 0.70 ALDH1A1 (0.51) ALDH1A1CYP2C19SMN1; SMN2TSHRALOX12
SCHEMBL17221973 0.69 GAA (0.45) ALDH1A1HPGDHSD17B10CYP2C19SMN1; SMN2
SCHEMBL6549890 0.69 CA2 (0.52) ALDH1A1HPGDHSD17B10SMN1; SMN2TSHR
SCHEMBL928962 0.69 ALDH1A1 (0.46) ALDH1A1HSD17B10SMN1; SMN2TSHREPHX2
SCHEMBL207711 0.68 CES2 (0.45) ALDH1A1TSHREPHX2
SCHEMBL11586847 0.68 EPHX2 (0.56) ALDH1A1HPGDUSP2CYP2C19SMN1; SMN2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 48 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-4091000-A1 DRY FILM FUJIFILM Electronic Materials U.S.A, Inc. (US) 2022-11-23 EP disclosed
WO-2021067547-A1 PLANARIZING PROCESS AND COMPOSITION FUJIFILM ELECTRONIC MATERIALS U.S.A., INC. (US) 2021-04-08 WO disclosed
EP-3639293-A1 MULTILAYER STRUCTURE FUJIFILM Electronic Materials U.S.A., Inc. (US) 2020-04-22 EP disclosed
EP-3478777-A1 DIELECTRIC FILM FORMING COMPOSITION FUJIFILM Electronic Materials U.S.A., Inc. (US) 2019-05-08 EP disclosed
EP-3478482-A1 DIELECTRIC FILM FORMING COMPOSITION FUJIFILM Electronic Materials U.S.A, Inc. (US) 2019-05-08 EP disclosed
WO-2019050566-A1 DIELECTRIC FILM FORMING COMPOSITION FUJIFILM ELECTRONIC MATERIALS U.S.A., INC. (US) 2019-03-14 WO disclosed
WO-2019050565-A1 DIELECTRIC FILM FORMING COMPOSITION FUJIFILM ELECTRONIC MATERIALS U.S.A., INC. (US) 2019-03-14 WO disclosed
EP-3417010-A1 POLYIMIDES FujiFilm Electronic Materials USA, Inc. (US) 2018-12-26 EP disclosed
EP-3417011-A1 POLYIMIDES FUJIFILM Electronic Materials U.S.A, Inc. (US) 2018-12-26 EP disclosed
EP-3417000-A1 POLYIMIDES FUJIFILM Electronic Materials U.S.A, Inc. (US) 2018-12-26 EP disclosed
EP-1509814-A2 ACETAL PROTECTED POLYMERS AND PHOTORESISTS COMPOSITIONS THEREOF Arch Specialty Chemicals, Inc. (US) 2005-03-02 EP disclosed
WO-2005000912-A2 NOVEL POSITIVE PHOTOSENSITIVE RESIN COMPOSITIONS FUJIFILM ELECTRONIC MATERIALS U.S.A., INC. (US) 2005-01-06 WO disclosed
WO-2004111726-A2 NOVEL PHOTOSENSITIVE RESIN COMPOSITIONS FUJIFILM ELECTRONIC MATERIALS U.S.A., INC. (US) 2004-12-23 WO disclosed
WO-2004081664-A2 NOVEL PHOTOSENSITIVE RESIN COMPOSITIONS ARCH SPECIALTY CHEMICALS, INC. (US) 2004-09-23 WO disclosed
WO-2004055592-A2 STABLE NON-PHOTOSENSITIVE POLYIMIDE PRECURSOR COMPOISTIONS FOR USE IN BILAYER IMAGING SYSTEMS ARCH SPECIALTY CHEMICALS, INC. (US) 2004-07-01 WO disclosed
WO-2004055593-A2 PROCESS FOR PRODUCING A HEAT RESISTANT RELIEF STRUCTURE ARCH SPECIALTY CHEMICALS, INC. (US) 2004-07-01 WO disclosed
WO-2003099782-A2 ACETAL PROTECTED POLYMERS AND PHOTORESISTS COMPOSITIONS THEREOF ARCH SPECIALTY CHEMICALS, INC. (US) 2003-12-04 WO disclosed
EP-0579420-B1 Negative working resist material and pattern forming process WAKO PURE CHEM IND LTD (JP) 1997-03-05 EP disclosed
US-5389491-A Negative working resist composition MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. (JP) 1995-02-14 US disclosed
EP-0579420-A2 Negative working resist material and pattern forming process WAKO PURE CHEMICAL INDUSTRIES LTD (JP) 1994-01-19 EP disclosed