SCHEMBL21795322

SCHEMBL21795322

CS(=O)(=O)c1cccc2c1C#CC(=N)C2=O

nearest known ligand 0.34

Predicted protein targets (top 19)

geneUniProtsupporting neighboursconfidence
HSD11B1 P28845 1/20 0.34
RAB9A P51151 2/20 0.33
ALDH1A1 P00352 2/20 0.33
CTSG P08311 2/20 0.33
KLK7 P49862 2/20 0.33
KLK14 Q9P0G3 2/20 0.33
KLK5 Q9Y337 2/20 0.33
PRSS1 P07477 1/20 0.33
KDM4E B2RXH2 1/20 0.33
GRM2 Q14416 1/20 0.32
KMT2A Q03164 1/20 0.32
SMN1; SMN2 Q16637 1/20 0.32
CTRC Q99895 1/20 0.32
L3MBTL1 Q9Y468 1/20 0.31
ALOX5AP P20292 1/20 0.31
FEN1 P39748 1/20 0.31
BRD9 Q9H8M2 1/20 0.30
BAZ2B Q9UIF8 1/20 0.30
BAZ2A Q9UIF9 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL14488751 0.68 BAZ2B (0.36) HSD11B1RAB9AALDH1A1KDM4EGRM2
SCHEMBL23815139 0.63 ALDH1A1 (0.32) HSD11B1RAB9AALDH1A1CTSGKLK7
SCHEMBL21087501 0.62 ALDH1A1 (0.38) HSD11B1RAB9AALDH1A1CTSGKDM4E
SCHEMBL23940757 0.62 S100A4 (0.36) HSD11B1ALDH1A1KDM4EKMT2ASMN1; SMN2
SCHEMBL8106699 0.61 LOX (0.47) HSD11B1RAB9AALDH1A1KDM4ESMN1; SMN2
SCHEMBL1831245 0.61 ALOX15 (0.43) HSD11B1RAB9AALDH1A1CTSGKLK7
SCHEMBL20026453 0.60
SCHEMBL7719846 0.60 BCAT2 (0.38) HSD11B1SMN1; SMN2L3MBTL1
SCHEMBL13165739 0.60 CDK2 (0.46) PRSS1KMT2ASMN1; SMN2L3MBTL1
SCHEMBL1970261 0.60 HSD11B1 (0.40) HSD11B1RAB9AALDH1A1CTSGKLK7

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 177 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-4066059-B1 CHEMICALLY AMPLIFIED PHOTORESIST MERCK PATENT GMBH (DE) 2024-02-28 EP disclosed
US-11822242-B2 DNQ-type photoresist composition including alkali-soluble acrylic resins MERCK PATENT GMBH (DE) 2023-11-21 US disclosed
US-11822243-B2 Negative-type photosensitive resin composition, cured film, element and display device provided with cured film, and production method therefor TORAY INDUSTRIES, INC. (JP) 2023-11-21 US disclosed
US-20230369271-A1 DISPLAY DEVICE AND METHOD FOR MANUFACTURING DISPLAY DEVICE TORAY INDUSTRIES, INC. (JP) 2023-11-16 US disclosed
WO-2023190218-A1 DISPLAY DEVICE AND PHOTOSENSITIVE COMPOSITION 東レ株式会社 2023-10-05 WO disclosed
WO-2023190317-A1 DISPLAY DEVICE 東レ株式会社 2023-10-05 WO disclosed
EP-4063954-B1 POSITIVE PHOTOSENSITIVE RESIN COMPOSITION, POSITIVE PHOTOSENSITIVE DRY FILM, METHOD FOR PRODUCING POSITIVE PHOTOSENSITIVE DRY FILM, PATTERNING PROCESS, METHOD FOR FORMING CURED FILM, INTERLAYER INSULATION FILM, SURFACE PROTECTIVE FILM, AND ELECTRONIC COMPONENT SHINETSU CHEMICAL CO (JP) 2023-10-04 EP disclosed
WO-2023181812-A1 POSITIVE PHOTOSENSITIVE RESIN COMPOSITION, CURED PRODUCT THEREOF, AND DISPLAY DEVICE PROVIDED WITH SAME 東レ株式会社 2023-09-28 WO disclosed
WO-2023182327-A1 POSITIVE PHOTOSENSITIVE RESIN COMPOSITION, CURED PRODUCT, ORGANIC EL DISPLAY DEVICE, AND METHOD FOR PRODUCING CURED PRODUCT 東レ株式会社 2023-09-28 WO disclosed
EP-3398983-B1 POLYMER OF POLYIMIDE PRECURSOR, POSITIVE TYPE PHOTOSENSITIVE RESIN COMPOSITION, NEGATIVE TYPE PHOTOSENSITIVE RESIN COMPOSITION, PATTERNING PROCESS, METHOD FOR FORMING CURED FILM, INTERLAYER INSULATING FILM, SURFACE PROTECTIVE FILM, AND ELECTRONIC PARTS SHINETSU CHEMICAL CO (JP) 2023-09-27 EP disclosed
US-20170139323-A1 Resin Composition Including Novel Polymer and Organic Film Using the Same SAMSUNG SDI CO., LTD. (KR) 2017-05-18 US disclosed
US-9633755-B2 Conductive composition, conductive member, conductive member production method, touch panel, and solar cell FUJIFILM CORPORATION (JP) 2017-04-25 US disclosed
US-20170088672-A1 POLYMER, PHOTOSENSITIVE RESIN COMPOSITION, AND ELECTRONIC DEVICE SUMITOMO BAKELITE CO., LTD. (JP) 2017-03-30 US disclosed
WO-2017038664-A1 COMPOSITION, CURED FILM, METHOD FOR MANUFACTURING CURED FILM, METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE 富士フイルム株式会社 2017-03-09 WO disclosed
US-9578732-B2 Composition for forming silver ion diffusion-suppressing layer, film for silver ion diffusion-suppressing layer, circuit board, electronic device, conductive film laminate, and touch panel FUJIFILM CORPORATION (JP) 2017-02-21 US disclosed
US-9575410-B2 Photosensitive resin composition, method for producing hardened relief pattern, semiconductor device and display device ASAHI KASEI E-MATERIALS CORPORATION (JP) 2017-02-21 US disclosed
US-9562124-B2 Thermo-oxidatively stable, side chain polyether functionalized polynorbornenes for microelectronic and optoelectronic devices and assemblies thereof PROMERUS, LLC (US) 2017-02-07 US disclosed
US-9557645-B2 Positive photosensitive resin composition, photo-curable dry film and method for producing same, layered product, patterning process, and substrate SHIN-ETSU CHEMICAL CO., LTD. (JP) 2017-01-31 US disclosed
US-20150118622-A1 Positive Photosensitive Resin Composition, Photosensitive Resin Film Prepared by Using the Same, and Display Device CHEIL INDUSTRIES INC. (KR) 2015-04-30 US disclosed
US-7229739-B2 Infrared sensitive mixture of a hydroxy substituted polymer such as a novolak or resole and a diphenylcarbinol solubility suppressor, e.g.,4,4'-bis(dimethylamino)benzhydrol, benzhydrol or 4,4'-dimethoxybenzhydrol; may also contain an infrared radiation absorbing compound. ANOCOIL CORPORATION (US) 2007-06-12 US disclosed