SCHEMBL24218974

SCHEMBL24218974

CC(C)(C)C(=O)OC(c1ccc(C(O)(C(F)(F)F)C(F)(F)F)cc1)(C(F)(F)F)C(F)(F)F

nearest known ligand 0.46

Predicted protein targets (top 8)

geneUniProtsupporting neighboursconfidence
▸ SMN1; SMN2 Q16637 2/20 0.46
▸ MLYCD O95822 5/20 0.45
▸ NR1H3 Q13133 9/20 0.45
▸ NR1H2 P55055 8/20 0.45
▸ LMNA P02545 2/20 0.42
▸ HTT P42858 1/20 0.42
▸ NPSR1 Q6W5P4 1/20 0.42
▸ RORC P51449 1/20 0.41

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL13163546 0.84 NR1H3 (0.45) SMN1; SMN2MLYCDNR1H3NR1H2LMNA
SCHEMBL14556842 0.83 NR1H3 (0.44) SMN1; SMN2MLYCDNR1H3NR1H2LMNA
SCHEMBL19335436 0.83 KCNN4 (0.43) NR1H3NR1H2LMNANPSR1
SCHEMBL24225758 0.80 LMNA (0.41) SMN1; SMN2MLYCDNR1H3NR1H2LMNA
SCHEMBL18479637 0.78 ELANE (0.59) SMN1; SMN2MLYCDNR1H3NR1H2
SCHEMBL15840364 0.78 SMN1; SMN2 (0.47) SMN1; SMN2MLYCDNR1H3NR1H2LMNA
SCHEMBL28313039 0.76 MAPT (0.47) SMN1; SMN2LMNAHTTNPSR1
SCHEMBL8583669 0.72 NR1H3 (0.47) SMN1; SMN2MLYCDNR1H3NR1H2RORC
SCHEMBL14086284 0.72 ELANE (0.41) SMN1; SMN2MLYCDNR1H3NR1H2LMNA
SCHEMBL131990 0.71 NR1H2 (0.68) SMN1; SMN2MLYCDNR1H3NR1H2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-11835860-B2 Resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-12-05 — — US disclosed
EP-4134388-A1 CONDUCTIVE POLYMER COMPOSITION, SUBSTRATE, AND METHOD FOR PRODUCING SUBSTRATE SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-02-15 — — EP disclosed
US-20220026803-A1 RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2022-01-27 — — US disclosed
US-20220026804-A1 RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2022-01-27 — — US disclosed
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