SCHEMBL2519258

SCHEMBL2519258

CCc1c(CC(C)C)cccc1[SiH2]O

nearest known ligand 0.48

Predicted protein targets (top 11)

geneUniProtsupporting neighboursconfidence
GABRA1 P14867 4/20 0.48
GABRB2 P47870 4/20 0.48
HTT P42858 1/20 0.31
ALOX15 P16050 1/20 0.31
ALOX12 P18054 1/20 0.31
ELANE P08246 1/20 0.31
CTSG P08311 1/20 0.31
GABRG2 P18507 1/20 0.30
GABRB3 P28472 1/20 0.30
GABRA2 P47869 1/20 0.30
ANPEP P15144 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL9745359 0.83 GABRA1 (0.46) GABRA1GABRB2HTTANPEP
SCHEMBL1918647 0.80 GABRA1 (0.52) GABRA1GABRB2ELANECTSG
SCHEMBL2522528 0.79 GABRA1 (0.52) GABRA1GABRB2ELANECTSG
SCHEMBL9243360 0.77 GABRA1 (0.54) GABRA1GABRB2HTTELANECTSG
SCHEMBL2518240 0.76 CYP3A4 (0.40) GABRA1GABRB2ELANECTSG
SCHEMBL2743774 0.72 GABRA1 (0.62) GABRA1GABRB2ELANECTSGGABRG2
SCHEMBL273305 0.71 GABRA1 (0.42) GABRA1GABRB2HTTALOX15ALOX12
SCHEMBL2522716 0.71 GABRA1 (0.42) GABRA1GABRB2
SCHEMBL28646156 0.69 GABRA1 (0.40) GABRA1GABRB2ALOX15ALOX12ANPEP
SCHEMBL9251033 0.69 GABRA1 (0.41) GABRA1GABRB2ALOX15ALOX12ELANE

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 11 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-117730398-A Resin composition for dicing protective layer and method for processing semiconductor wafer 株式会社力森诺科 2024-03-19 CN disclosed
US-9786576-B2 Positive-type photosensitive resin composition, method for production of resist pattern, semiconductor device, and electronic device HITACHI CHEMICAL COMPANY, LTD (JP) 2017-10-10 US disclosed
US-20170165879-A1 RESIN PRECURSOR, RESIN COMPOSITION CONTAINING SAME, POLYIMIDE RESIN MEMBRANE, RESIN FILM, AND METHOD FOR PRODUCING SAME ASAHI KASEI KABUSHIKI KAISHA (JP) 2017-06-15 US disclosed
CN-105452386-A Curable resin composition YOKOHAMA RUBBER CO LTD 2016-03-30 CN disclosed
US-9274422-B2 Photosensitive resin composition, method for forming pattern-cured film using photosensitive resin composition, and electronic component HITACHI CHEMICAL DUPONT MICROSYSTEMS, LTD. (JP) 2016-03-01 US disclosed
US-20140120462-A1 PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR FORMING PATTERN-CURED FILM USING PHOTOSENSITIVE RESIN COMPOSITION, AND ELECTRONIC COMPONENT HITACHI CHEMICAL DUPONT MICROSYSTEMS, LTD. (JP) 2014-05-01 US disclosed
EP-2221666-B1 POSITIVE-TYPE PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR PRODUCTION OF RESIST PATTERN, AND SEMICONDUCTOR DEVICE HITACHI CHEMICAL CO LTD (JP) 2013-09-18 EP disclosed
US-20110250396-A1 POSITIVE-TYPE PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR PRODUCTION OF RESIST PATTERN, SEMICONDUCTOR DEVICE, AND ELECTRONIC DEVICE RESONAC CORPORATION (JP) 2011-10-13 US disclosed
CN-101993537-A Alkali-soluble polymer, photosensitive resin composition comprising the same, and uses of the same ASAHI KASEI E MATERIALS CORP 2011-03-30 CN disclosed
EP-2221666-A1 POSITIVE-TYPE PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR PRODUCTION OF RESIST PATTERN, SEMICONDUCTOR DEVICE, AND ELECTRONIC DEVICE Hitachi Chemical Company, Ltd. (JP) 2010-08-25 EP disclosed
US-20100159217-A1 NEGATIVE-TYPE PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR FORMING PATTERNS, AND ELECTRONIC PARTS HITACHI CHEMICAL DUPONT MICROSYSTEMS, LTD (JP) 2010-06-24 US disclosed