SCHEMBL2593871

SCHEMBL2593871

C=COC(CCC)c1c(C(=O)O)ccc(C(=O)O)c1C(CCC)OC=C

nearest known ligand 0.36

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
TAS1R3 Q7RTX0 6/20 0.36
TAS1R1 Q7RTX1 6/20 0.36
KDM4C Q9H3R0 1/20 0.34
ALDH1A1 P00352 2/20 0.34
KDM4E B2RXH2 1/20 0.34
MEN1 O00255 1/20 0.34
RECQL P46063 1/20 0.34
KMT2A Q03164 1/20 0.34
PPARA Q07869 3/20 0.32
PPARG P37231 2/20 0.32
CYP1A2 P05177 1/20 0.31
GABRP O00591 2/20 0.31
GABRD O14764 2/20 0.31
GABRA1 P14867 2/20 0.31
GABRB1 P18505 2/20 0.31
GABRG2 P18507 2/20 0.31
GABRB3 P28472 2/20 0.31
GABRA5 P31644 2/20 0.31
GABRA3 P34903 2/20 0.31
GABRA2 P47869 2/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL2509479 0.88 SLC37A4 (0.35) KDM4C
SCHEMBL28948581 0.85 SLC37A4 (0.35) KDM4C
SCHEMBL4905644 0.81 ALDH1A1 (0.39) TAS1R3TAS1R1KDM4CALDH1A1KDM4E
SCHEMBL1638457 0.81 KMT2A (0.40) KDM4CALDH1A1KDM4EMEN1RECQL
SCHEMBL14053480 0.79 CHRM1 (0.31)
SCHEMBL29159220 0.75 THRB (0.35) KDM4CALDH1A1KDM4EMEN1RECQL
SCHEMBL9634865 0.72 THRB (0.36) ALDH1A1KDM4EMEN1RECQLKMT2A
SCHEMBL25385930 0.71 AOC3 (0.39) MEN1KMT2ACYP1A2TSHR
SCHEMBL6865012 0.71 MAPT (0.34) TAS1R3TAS1R1ALDH1A1KDM4EPOLB
SCHEMBL6444436 0.71 KDM4E (0.40) ALDH1A1KDM4EMEN1RECQLKMT2A

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 10 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9134610-B2 Resist underlayer coating forming composition for forming photo-crosslinking cured resist underlayer coating NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2015-09-15 US disclosed
US-20130189850-A1 RESIST UNDERLAYER COATING FORMING COMPOSITION FOR FORMING PHOTO-CROSSLINKING CURED RESIST UNDERLAYER COATING NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2013-07-25 US disclosed
US-8426111-B2 Resist underlayer coating forming composition for forming photo-crosslinking cured resist underlayer coating NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2013-04-23 US disclosed
US-20120288795-A1 COMPOSITION FOR FORMATION OF PHOTOSENSITIVE RESIST UNDERLAYER FILM AND METHOD FOR FORMATION OF RESIST PATTERN NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2012-11-15 US disclosed
US-8048615-B2 Silicon-containing resist underlayer coating forming composition for forming photo-crosslinking cured resist underlayer coating NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2011-11-01 US disclosed
US-20090162782-A1 Silicon-Containing Resist Underlayer Coating Forming Composition for Forming Photo-Crosslinking Cured Resist Underlayer Coating NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2009-06-25 US disclosed
US-20090130594-A1 Resist Underlayer Coating Forming Composition for Forming Photo-Crosslinking Cured Resist Underlayer Coating NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2009-05-21 US disclosed
EP-1972998-A1 SILICON-CONTAINING RESIST UNDERLYING LAYER FILM FORMING COMPOSITION FOR FORMATION OF PHOTOCROSSLINKING CURED RESIST UNDERLYING LAYER FILM Nissan Chemical Industries, Ltd. (JP) 2008-09-24 EP disclosed
EP-1879070-A1 COMPOSITION FOR RESIST UNDERLAYER FILM FORMATION FOR FORMING PHOTOCROSSLINKING CURED RESIST UNDERLAYER FILM Nissan Chemical Industries, Ltd. (JP) 2008-01-16 EP disclosed
US-6890997-B2 Powder coating of free radical curable epoxy resin and another free radical curable resin ROHM AND HAAS COMPANY (US) 2005-05-10 US disclosed