SCHEMBL2680077

SCHEMBL2680077

CCC1(C=C(C)C(=O)O)CCCCCCC1

nearest known ligand 0.31

Predicted protein targets (top 1)

geneUniProtsupporting neighboursconfidence
CYP2C19 P33261 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL6522429 1.00 CYP2C19 (0.31) CYP2C19
SCHEMBL3291143 1.00 CYP2C19 (0.31) CYP2C19
SCHEMBL3288533 1.00 CYP2C19 (0.31) CYP2C19
SCHEMBL2680377 1.00 CYP2C19 (0.31) CYP2C19
SCHEMBL479236 1.00 CYP2C19 (0.31) CYP2C19
SCHEMBL3292924 1.00 CYP2C19 (0.31) CYP2C19
SCHEMBL2064948 0.98
SCHEMBL989309 0.98
SCHEMBL3288490 0.94
SCHEMBL3286642 0.90 CD81 (0.30)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 41 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9527938-B2 Copolymer for lithography and method of manufacturing the same, resist composition, and method of manufacturing substrate MITSUBISHI RAYON CO., LTD. (JP) 2016-12-27 US claimed
US-20150099230-A1 COPOLYMER FOR LITHOGRAPHY AND METHOD OF MANUFACTURING THE SAME, RESIST COMPOSITION, AND METHOD OF MANUFACTURING SUBSTRATE MITSUBISHI RAYON CO., LTD. (JP) 2015-04-09 US claimed
US-20110053083-A1 CHEMICALLY AMPLIFIED PHOTORESIST COMPOSITION AND PROCESS FOR ITS USE INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2011-03-03 US claimed
US-20210011379-A1 POSITIVE-WORKING PHOTORESIST COMPOSITION, PATTERN PRODUCED THEREFROM, AND METHOD FOR PRODUCING PATTERN LG CHEM, LTD. (KR) 2021-01-14 US disclosed
EP-3186226-B1 OXIME SULFONATE DERIVATIVES BASF SE (DE) 2020-06-17 EP disclosed
US-10336851-B2 Copolymer for semiconductor lithography, resist composition, and method for manufacturing substrate MITSUBISHI CHEMICAL CORPORATION 2019-07-02 US disclosed
US-20190171099-A1 POLYMERIZABLE COMPOSITION COMPRISING AN OXIME SULFONATE AS THERMAL CURING AGENT BASF SE (DE) 2019-06-06 US disclosed
US-10241399-B2 Polymerizable composition comprising an oxime sulfonate as thermal curing agent BASF SE (DE) 2019-03-26 US disclosed
US-10234761-B2 Oxime ester photoinitiators BASF SE (DE) 2019-03-19 US disclosed
EP-2668156-B1 POLYMERIZABLE COMPOSITION COMPRISING AN OXIME SULFONATE AS THERMAL CURING AGENT BASF SE (DE) 2018-10-31 EP disclosed
US-10073343-B2 Non-ionic compound, resin, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2018-09-11 US disclosed
US-20150147695-A1 RESIN, PHOTORESIST COMPOSITION, AND METHOD FOR PRODUCING PHOTORESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2015-05-28 US disclosed
US-20130331533-A1 POLYMER FOR LITHOGRAPHY MITSUBISHI RAYON CO., LTD. (JP) 2013-12-12 US disclosed
EP-2668156-A1 POLYMERIZABLE COMPOSITION COMPRISING AN OXIME SULFONATE AS THERMAL CURING AGENT BASF SE (DE) 2013-12-04 EP disclosed
US-20130308219-A1 POLYMERIZABLE COMPOSITION COMPRISING AN OXIME SULFONATE AS THERMAL CURING AGENT BASF SE (DE) 2013-11-21 US disclosed
US-20130224654-A1 COPOLYMERS FOR LITHOGRAPHY AND METHOD FOR PRODUCING SAME, RESIST COMPOSITION, METHOD FOR PRODUCING SUBSTRATE WITH PATTERN FORMED THEREUPON, METHOD FOR EVALUATING COPOLYMERS, AND METHOD FOR ANALYZING COPOLYMER COMPOSITIONS MITSUBISHI RAYON CO., LTD. (JP) 2013-08-29 US disclosed
WO-2012101245-A1 POLYMERIZABLE COMPOSITION COMPRISING AN OXIME SULFONATE AS THERMAL CURING AGENT BASF SE (DE) 2012-08-02 WO disclosed
US-20120115086-A1 METHOD FOR PRODUCING POLYMER, POLYMER FOR LITHOGRAPHY, RESIST COMPOSITION, AND METHOD FOR PRODUCING SUBSTRATE MITSUBISHI RAYON CO., LTD. (JP) 2012-05-10 US disclosed
US-20110053083-A1 CHEMICALLY AMPLIFIED PHOTORESIST COMPOSITION AND PROCESS FOR ITS USE INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2011-03-03 US disclosed
US-7713680-B2 Radiation sensitive resin composition for forming a protective film, method of forming a protective film from the composition, liquid crystal display device and solid-state image sensing device JSR CORPORATION (JP) 2010-05-11 US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (4 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-10234761-B2 Oxime ester photoinitiators C9, C5, CBR3 CYP2C19 13/4885
US-10073343-B2 Non-ionic compound, resin, resist composition and method for producing resist pattern AFF1, AFF2, RER1 CYP2C19 2793/4885
US-10241399-B2 Polymerizable composition comprising an oxime sulfonate as thermal curing agent SULT1E1, COX6B1, SULT1A1 CYP2C19 189/4885
US-20190171099-A1 POLYMERIZABLE COMPOSITION COMPRISING AN OXIME SULFONATE AS THERMAL CURING AGENT SULT1E1, COX6B1, SULT1A1 CYP2C19 189/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.