SCHEMBL3090141

SCHEMBL3090141

C=C(CC)C(=O)OC(=O)OC12CC3CC(CC(O)(C3)C1)C2

nearest known ligand 0.36

Predicted protein targets (top 12)

geneUniProtsupporting neighboursconfidence
HSD11B1 P28845 3/20 0.36
DPP4 P27487 2/20 0.33
ALDH1A1 P00352 1/20 0.33
PKM P14618 1/20 0.33
DPP8 Q6V1X1 1/20 0.31
DPP9 Q86TI2 1/20 0.31
MDH1 P40925 1/20 0.31
MDH2 P40926 1/20 0.31
NPSR1 Q6W5P4 1/20 0.31
ABL1 P00519 1/20 0.30
TSHR P16473 1/20 0.30
RIN1 Q13671 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL28762558 0.92 HSD11B1 (0.38) HSD11B1DPP4ALDH1A1PKMDPP8
SCHEMBL1482780 0.89
SCHEMBL2603060 0.79 HSD11B1 (0.41) HSD11B1DPP4ALDH1A1PKMDPP8
SCHEMBL10064097 0.78 PKM (0.35) HSD11B1DPP4ALDH1A1PKMDPP8
SCHEMBL13383446 0.78 PKM (0.37) HSD11B1DPP4ALDH1A1PKMDPP8
SCHEMBL15281467 0.78 PKM (0.37) HSD11B1DPP4ALDH1A1PKMDPP8
SCHEMBL41045 0.78 PKM (0.37) HSD11B1DPP4ALDH1A1PKMDPP8
SCHEMBL5608375 0.77 PKM (0.39) HSD11B1DPP4ALDH1A1PKMDPP8
SCHEMBL283707 0.76 CYP19A1 (0.39) ALDH1A1NPSR1
SCHEMBL14523960 0.75 PKM (0.37) HSD11B1DPP4ALDH1A1PKMDPP8

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 2 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7794914-B2 liquid immersion lithography, solves problem of defect caused by residual fluid droplets on the resist film; blend of resin containing no fluorine and acid labile group, and an acrylic fluoro-copolymer with units of a fluoromonomer and units of acid labile, lactone, or hydroxy-functional group SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2010-09-14 US disclosed
US-20070218401-A1 liquid immersion lithography, solves problem of defect caused by residual fluid droplets on the resist film; blend of resin containing no fluorine and acid labile group, and an acrylic fluoro-copolymer with units of a fluoromonomer and units of acid labile, lactone, or hydroxy-functional group SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2007-09-20 US disclosed