SCHEMBL3142124

SCHEMBL3142124

C=C(CC=Cc1ccccc1)C(=O)OCC1CC2CCC1O2

nearest known ligand 0.38

Predicted protein targets (top 13)

geneUniProtsupporting neighboursconfidence
PAM P19021 1/20 0.38
SLC6A3 Q01959 4/20 0.35
SLC6A4 P31645 2/20 0.35
NAAA Q02083 2/20 0.35
MAOB P27338 1/20 0.34
TBXA2R P21731 1/20 0.33
PER2 O15055 1/20 0.32
CRY1 Q16526 1/20 0.32
CRY2 Q49AN0 1/20 0.32
MMP1 P03956 1/20 0.32
MMP2 P08253 1/20 0.32
MMP9 P14780 1/20 0.32
MMP12 P39900 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Styrene SCHEMBL4939721 0.80 SLC6A3 (0.38) SLC6A3SLC6A4PER2CRY1CRY2
SCHEMBL908295 0.77 MGLL (0.52) PAMMAOB
Styrene SCHEMBL6439835 0.73 MGLL (0.48) PAMMAOB
SCHEMBL1792779 0.71 MEN1 (0.55) PAMMAOB
Maleic Acid SCHEMBL7519144 0.71 MGLL (0.48) PAM
SCHEMBL18036722 0.70 PAM (0.49) PAMMAOBMMP1MMP2MMP9
SCHEMBL5608312 0.70 PAM (0.59) PAMMAOBMMP1MMP2MMP9
SCHEMBL3627784 0.70 ALDH1A1 (0.50) PAMNAAAMAOB
SCHEMBL2490104 0.70 PAM (0.51) PAMMAOBMMP1MMP2MMP9
SCHEMBL409074 0.70 PAM (0.51) PAMNAAAMAOBMMP1MMP2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8288072-B2 Antireflection film; fast etching speed whcih reduces deformation; accuracy; 2,3-epoxypropyl methacrylate ester-styrene copolymer SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-10-16 US disclosed
US-7687228-B2 Antireflection film composition and patterning process using the same SHIN ETSU CHEMICAL CO., LTD. (JP) 2010-03-30 US disclosed
US-20080220381-A1 Antireflection film composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2008-09-11 US disclosed