SCHEMBL3482639

SCHEMBL3482639

CCCCc1ccccc1[SiH](OC)OC

nearest known ligand 0.41

Predicted protein targets (top 13)

geneUniProtsupporting neighboursconfidence
LIPG Q9Y5X9 1/20 0.41
ALOX5 P09917 1/20 0.40
PTGS2 P35354 1/20 0.40
CYP3A4 P08684 1/20 0.38
CYP2D6 P10635 1/20 0.38
CYP2C9 P11712 1/20 0.38
TLR8 Q9NR97 1/20 0.36
PPARA Q07869 1/20 0.36
THRA P10827 1/20 0.35
THRB P10828 1/20 0.35
TYR P14679 1/20 0.34
NR1H2 P55055 1/20 0.34
NR1H3 Q13133 1/20 0.34

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL19356831 0.93 LIPG (0.50) LIPGALOX5PTGS2PPARATHRA
SCHEMBL3482132 0.89 ADRA2A (0.34) LIPGALOX5PTGS2PPARA
SCHEMBL1931186 0.84 TAAR1 (0.42) TLR8
SCHEMBL28545893 0.84 CYP4A11 (0.34) LIPGALOX5PTGS2
SCHEMBL1123365 0.84 HDAC3 (0.32)
SCHEMBL3481842 0.84 LIPG (0.40) LIPGALOX5PTGS2CYP3A4CYP2D6
SCHEMBL1929389 0.82 MAOA (0.41) TLR8
SCHEMBL3482697 0.82 LIPG (0.42) LIPGALOX5PTGS2CYP3A4CYP2D6
SCHEMBL1144164 0.80 ATM (0.36)
SCHEMBL555622 0.79 TAAR1 (0.53)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 9 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-3727686-A1 MOISTURE-CURING COMPOSITIONS Covestro Deutschland AG (DE) 2020-10-28 EP disclosed
EP-2128897-B1 SILICON DIELECTRIC TREATING AGENT FOR USE AFTER ETCHING, PROCESS FOR PRODUCING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE FUJITSU LTD (JP) 2015-05-06 EP disclosed
EP-2599836-B1 CURABLE COMPOSITION FOR SEMICONDUCTOR ENCAPSULATION ADEKA CORP (JP) 2015-03-25 EP disclosed
US-8716209-B2 Agent for post-etch treatment of silicon dielectric film, method of manufacturing semiconductor device, and semiconductor device FUJITSU LIMITED (JP) 2014-05-06 US disclosed
US-8470937-B2 Curable composition for semiconductor encapsulation ADEKA CORPORATION (JP) 2013-06-25 US disclosed
EP-2599836-A1 CURABLE COMPOSITION FOR SEMICONDUCTOR ENCAPSULATION Adeka Corporation (JP) 2013-06-05 EP disclosed
US-20120126435-A1 CURABLE COMPOSITION FOR SEMICONDUCTOR ENCAPSULATION ADEKA CORPORATION (JP) 2012-05-24 US disclosed
US-20100007031-A1 AGENT FOR POST-ETCH TREATMENT OF SILICON DIELECTRIC FILM, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE FUJITSU LIMITED (JP) 2010-01-14 US disclosed
EP-2128897-A1 SILICON DIELECTRIC TREATING AGENT FOR USE AFTER ETCHING, PROCESS FOR PRODUCING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE Fujitsu Limited (JP) 2009-12-02 EP disclosed