SCHEMBL396269

SCHEMBL396269

CC[S+](CC)Cc1ccccc1

nearest known ligand 0.50

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
TP53 P04637 1/20 0.50
CALM1 P0DP23 1/20 0.41
TSHR P16473 5/20 0.39
ALDH1A1 P00352 4/20 0.39
IDO1 P14902 1/20 0.38
LOXL2 Q9Y4K0 1/20 0.38
TRPA1 O75762 1/20 0.38
KDM4E B2RXH2 2/20 0.37
TDP1 Q9NUW8 1/20 0.37
CYP3A4 P08684 1/20 0.37
MAPT P10636 1/20 0.37
MAOB P27338 1/20 0.36
HPGD P15428 1/20 0.36
ALOX15 P16050 1/20 0.36
ALOX12 P18054 1/20 0.36
CASP1 P29466 1/20 0.36
HSD17B10 Q99714 1/20 0.36
TAAR1 Q96RJ0 3/20 0.36
MAOA P21397 1/20 0.36
SLC6A2 P23975 1/20 0.36

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Hydrochloric Acid SCHEMBL967040 0.97 TP53 (0.48) TP53CALM1TSHRALDH1A1IDO1
Bromide SCHEMBL29399740 0.97 TP53 (0.48) TP53CALM1TSHRALDH1A1IDO1
SCHEMBL8973723 0.95 TP53 (0.50) TP53CALM1TSHRALDH1A1IDO1
SCHEMBL767035 0.87 TP53 (0.39) TP53TSHRALDH1A1TRPA1
SCHEMBL247179 0.83 CALM1 (0.50) TP53CALM1TSHRALDH1A1IDO1
Bromide SCHEMBL10885367 0.80 CALM1 (0.47) TP53CALM1TSHRALDH1A1IDO1
Iodide SCHEMBL10884305 0.80 CALM1 (0.47) TP53CALM1TSHRALDH1A1IDO1
SCHEMBL4235702 0.80 TP53 (0.46) TP53CALM1TSHRALDH1A1IDO1
SCHEMBL9843203 0.80 TP53 (0.37) TP53CALM1
SCHEMBL4235680 0.77 TP53 (0.48) TP53CALM1TSHRALDH1A1IDO1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 124 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8173584-B2 Composition and method for treating semiconductor substrate surface LASERWORT LTD (HK) 2012-05-08 US claimed
US-20120083436-A1 COMPOSITION AND METHOD FOR TREATING SEMICONDUCTOR SUBSTRATE SURFACE LASERWORT LTD (HK) 2012-04-05 US claimed
US-8101561-B2 Composition and method for treating semiconductor substrate surface LASERWORT LTD (HK) 2012-01-24 US claimed
US-20110118165-A1 COMPOSITION AND METHOD FOR TREATING SEMICONDUCTOR SUBSTRATE SURFACE Lee, Wai Mun (US) 2011-05-19 US claimed
US-20260118764-A1 COMPOSITION FOR FORMING SILICON-CONTAINING RESIST UNDERLAYER FILM AND SILICON-CONTAINING RESIST UNDERLAYER FILM NISSAN CHEMICAL CORPORATION (JP) 2026-04-30 US disclosed
EP-4715465-A1 MULTILAYER BODY, METHOD FOR PRODUCING MULTILAYER BODY, AND PHOTOSENSITIVE SURFACE MODIFIER Nissan Chemical Corporation (JP) 2026-03-25 EP disclosed
US-12585188-B2 Composition for forming resist underlying film NISSAN CHEMICAL CORPORATION (JP) 2026-03-24 US disclosed
EP-4679175-A1 COMPOSITION FOR FORMING SILICON-CONTAINING RESIST UNDERLAYER FILM Nissan Chemical Corporation (JP) 2026-01-14 EP disclosed
EP-4673515-A1 SILICON-BASED LIQUID CRYSTAL ALIGNMENT AGENT FOR SMART WINDOWS Saint-Gobain Glass France (FR) 2026-01-07 EP disclosed
US-20250377596-A1 SILICON-CONTAINING RESIST UNDERLAYER FILM-FORMING COMPOSITION NISSAN CHEMICAL CORPORATION (JP) 2025-12-11 US disclosed
US-12493243-B2 Film-forming composition NISSAN CHEMICAL CORPORATION (JP) 2025-12-09 US disclosed
US-20250362609-A1 SILICON-CONTAINING RESIST UNDERLAYER FILM-FORMING COMPOSITION CONTAINING POLYFUNCTIONAL SULFONIC ACID NISSAN CHEMICAL CORPORATION (JP) 2025-11-27 US disclosed
US-20120083436-A1 COMPOSITION AND METHOD FOR TREATING SEMICONDUCTOR SUBSTRATE SURFACE LASERWORT LTD (HK) 2012-04-05 US disclosed
US-20120070994-A1 RESIST UNDERLAYER FILM FORMING COMPOSITION CONTAINING SILICON HAVING SULFIDE BOND NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2012-03-22 US disclosed
US-8101561-B2 Composition and method for treating semiconductor substrate surface LASERWORT LTD (HK) 2012-01-24 US disclosed
US-8101561-B2 Composition and method for treating semiconductor substrate surface LASERWORT LTD (HK) 2012-01-24 US disclosed
US-20110118165-A1 COMPOSITION AND METHOD FOR TREATING SEMICONDUCTOR SUBSTRATE SURFACE Lee, Wai Mun (US) 2011-05-19 US disclosed
US-20110118165-A1 COMPOSITION AND METHOD FOR TREATING SEMICONDUCTOR SUBSTRATE SURFACE Lee, Wai Mun (US) 2011-05-19 US disclosed
WO-2009040107-A2 METHOD FOR THE PRODUCTION OF METAL-CONTAINING NANOPARTICLES ALBERT-LUDWIGS-UNIVERSITÄT FREIBURG (DE) 2009-04-02 WO disclosed
US-3966720-A Process for producing desacetoxy cephalosporanic acid compound NIKKEN CHEMICALS CO., LTD. (JA) 1976-06-29 US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (3 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20260118764-A1 COMPOSITION FOR FORMING SILICON-CONTAINING RESIST UNDERLAYER FILM AND SILICON-CONTAINING RESIST UNDERLAYER FILM SRSF1, MACF1, SRPK1 TP53 2101/4885CALM1 4620/4885TSHR 4084/4885
US-20120070994-A1 RESIST UNDERLAYER FILM FORMING COMPOSITION CONTAINING SILICON HAVING SULFIDE BOND SMC3, SRSF3, SRSF9 TP53 2177/4885CALM1 3261/4885TSHR 2660/4885
US-12585188-B2 Composition for forming resist underlying film SRR, SMC1A, ASH2L TP53 4706/4885CALM1 3936/4885TSHR 3614/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.