Tetramethylammonium Ion

Tetramethylammonium Ion

SCHEMBL4007651

C[N+](C)(C)C.C[N+](C)(C)C.C[N+](C)(C)C.C[N+](C)(C)C.C[N+](C)(C)C.[O-][Si]([O-])([O-])[O-].[OH-]

nearest known ligand 0.44

Full drug profile on Sugi Atlas →

Known targets — ChEMBL curated mechanism

GABRA1GABRA2GABRA3GABRA4GABRA5GABRA6GABRB1GABRB2GABRB3GABRDGABREGABRG1GABRG2GABRG3GABRPGABRQ

The experimentally established mechanism targets of Tetramethylammonium Ion. The predicted profile below is derived independently by chemical similarity — agreement is a validation signal, a miss is honest.

Predicted protein targets (top 3)

geneUniProtsupporting neighboursconfidence
CHRNB2 P17787 1/20 0.44
CHRNA7 P36544 1/20 0.44
CHRNA4 P43681 1/20 0.44

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Tetramethylammonium Ion SCHEMBL136727 0.94 CHRNB2 (0.50) CHRNB2CHRNA7CHRNA4
Tetramethylammonium Ion SCHEMBL2494399 0.78 CHRNB2 (0.44) CHRNB2CHRNA7CHRNA4
Tetramethylammonium Ion SCHEMBL2003451 0.78 CHRNB2 (0.44) CHRNB2CHRNA7CHRNA4
Tetramethylammonium Ion SCHEMBL9114012 0.74 CHRNB2 (0.80) CHRNB2CHRNA7CHRNA4
Tetramethylammonium Ion SCHEMBL15477 0.74
Tetramethylammonium Ion SCHEMBL4108131 0.74 CHRNB2 (0.80) CHRNB2CHRNA7CHRNA4
Tetramethylammonium Ion SCHEMBL136726 0.74 CHRNB2 (0.40) CHRNB2CHRNA7CHRNA4
Tetramethylammonium Ion SCHEMBL4007649 0.70 CHRNB2 (0.36) CHRNB2CHRNA7CHRNA4
Tetramethylammonium Ion SCHEMBL8185035 0.68 CHRNB2 (0.67) CHRNB2CHRNA7CHRNA4
Tetramethylammonium Ion SCHEMBL7166906 0.68 CHRNB2 (0.67) CHRNB2CHRNA7CHRNA4

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 21 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-116694221-A Carbon dioxide laser carving low-temperature explosion-proof paint and preparation method thereof 千浪化研新材料(上海)有限公司 2023-09-05 CN claimed
CN-101233456-A Metal and dielectric compatible sacrificial anti-reflective coating cleaning and removal compositions ADVANCED TECH MATERIALS (US) 2008-07-30 CN claimed
EP-1891482-A1 METAL AND DIELECTRIC COMPATIBLE SACRIFICIAL ANTI-REFLECTIVE COATING CLEANING AND REMOVAL COMPOSITION ADVANCED TECHNOLOGY MATERIALS, INC. (US) 2008-02-27 EP claimed
WO-2006133253-A1 METAL AND DIELECTRIC COMPATIBLE SACRIFICIAL ANTI-REFLECTIVE COATING CLEANING AND REMOVAL COMPOSITION ADVANCED TECHNOLOGY MATERIALS, INC. (US) 2006-12-14 WO claimed
CN-116694221-B Carbon dioxide laser carving low-temperature explosion-proof paint and preparation method thereof 千浪化研新材料(上海)有限公司 2024-04-12 CN disclosed
CN-116694221-A Carbon dioxide laser carving low-temperature explosion-proof paint and preparation method thereof 千浪化研新材料(上海)有限公司 2023-09-05 CN disclosed
US-9422513-B2 Metal and dielectric compatible sacrificial anti-reflective coating cleaning and removal composition ADVANCED TECHNOLOGY MATERIALS, INC. (US) 2016-08-23 US disclosed
US-20150094248-A1 METAL AND DIELECTRIC COMPATIBLE SACRIFICIAL ANTI-REFLECTIVE COATING CLEANING AND REMOVAL COMPOSITION TRUIST BANK, AS NOTES COLLATERAL AGENT 2015-04-02 US disclosed
US-8951948-B2 Metal and dielectric compatible sacrificial anti-reflective coating cleaning and removal composition ADVANCED TECHNOLOGY MATERIALS, INC. (US) 2015-02-10 US disclosed
CN-102981377-B Metal and dielectric compatible sacrificial anti-reflective coating cleaning and removal composition ADVANCED TECH MATERIALS 2014-11-12 CN disclosed
CN-102981377-A Metal and dielectric compatible sacrificial anti-reflective coating cleaning and removal composition ADVANCED TECH MATERIALS 2013-03-20 CN disclosed
CN-101233456-B Metal and dielectric compatible sacrificial anti-reflective coating cleaning and removal compositions ADVANCED TECH MATERIALS 2013-01-02 CN disclosed
US-20080242574-A1 Stripping post etching residue from microelectronic devices without affecting underlying silicate materials and interconnect metals; fluoride containing compound in organic solvent ADVANCED TECHNOLOGY MATERIALS, INC (US) 2008-10-02 US disclosed
CN-101233456-A Metal and dielectric compatible sacrificial anti-reflective coating cleaning and removal compositions ADVANCED TECH MATERIALS (US) 2008-07-30 CN disclosed
US-20080156908-A1 Method of milling cerium compound by means of ball mill NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2008-07-03 US disclosed
EP-1891482-A1 METAL AND DIELECTRIC COMPATIBLE SACRIFICIAL ANTI-REFLECTIVE COATING CLEANING AND REMOVAL COMPOSITION ADVANCED TECHNOLOGY MATERIALS, INC. (US) 2008-02-27 EP disclosed
WO-2006133253-A1 METAL AND DIELECTRIC COMPATIBLE SACRIFICIAL ANTI-REFLECTIVE COATING CLEANING AND REMOVAL COMPOSITION ADVANCED TECHNOLOGY MATERIALS, INC. (US) 2006-12-14 WO disclosed
CN-1246224-C Preparation method of high titanium content mesoppore molecular sieve CHINA PETROCHEMICAL CORP (CN) 2006-03-22 CN disclosed
US-20050253001-A1 Cerium compound milling method using ball mill NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2005-11-17 US disclosed
CN-1475441-A Preparation method of high titanium content mesoppore molecular sieve 中国石油化工股份有限公司 2004-02-18 CN disclosed