Trifluoromethanesulfonic Acid

Trifluoromethanesulfonic Acid

SCHEMBL4182001

C[S+](C)c1ccc(O)cc1.O=S(=O)([O-])C(F)(F)F

nearest known ligand 0.43

Full drug profile on Sugi Atlas →

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
KCNH2 Q12809 7/20 0.43
ENPP2 Q13822 1/20 0.41
LMNA P02545 1/20 0.38
GPR3 P46089 2/20 0.37
CA12 O43570 1/20 0.36
CA1 P00915 1/20 0.36
CA2 P00918 1/20 0.36
CA9 Q16790 1/20 0.36
GAA P10253 1/20 0.34
PKM P14618 1/20 0.34
ESR1 P03372 1/20 0.34
ESR2 Q92731 1/20 0.34
ALDH1A1 P00352 1/20 0.33
TP53 P04637 1/20 0.33
CYP3A4 P08684 1/20 0.33
THRB P10828 1/20 0.33
HPGD P15428 1/20 0.33
ALOX15 P16050 1/20 0.33
CASP1 P29466 1/20 0.33
RECQL P46063 1/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Trifluoromethanesulfonic Acid SCHEMBL30925713 0.98 ENPP2 (0.44) KCNH2ENPP2LMNAGPR3CA12
Sulfuric Acid SCHEMBL3625673 0.86 ENPP2 (0.48) ENPP2LMNACA12CA1CA2
Trifluoromethanesulfonic Acid SCHEMBL2350092 0.85 KCNH2 (0.42) KCNH2ENPP2LMNAGPR3CA12
SCHEMBL29714721 0.84 ENPP2 (0.52) ENPP2LMNACA12CA1CA2
Sulfuric Acid SCHEMBL3625678 0.84 LMNA (0.48) ENPP2LMNACA12CA1CA2
SCHEMBL5856324 0.84 CA1 (0.36) KCNH2ENPP2LMNACA12CA1
Trifluoromethanesulfonic Acid SCHEMBL562050 0.83 GPR3 (0.43) KCNH2GPR3CA12CA1CA2
Trifluoromethanesulfonic Acid SCHEMBL31028107 0.83 KCNH2 (0.43) KCNH2ENPP2LMNAGPR3ESR1
SCHEMBL5857309 0.82 CA2 (0.38) KCNH2ENPP2CA1CA2
Trifluoromethanesulfonic Acid SCHEMBL30536270 0.81 ACHE (0.43) GPR3CA1CA2CA9ALDH1A1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 55 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-12434998-B2 Resin-coated ultra-thin glass TORAY INDUSTRIES, INC. (JP) 2025-10-07 US disclosed
CN-114730132-B Curable resin composition, cured film, laminate, method for producing cured film, semiconductor device, and resin 富士胶片株式会社 2025-05-09 CN disclosed
WO-2025075065-A1 THERMALLY CATIONICALLY POLYMERIZABLE COMPOSITION, USE OF SAME, CATIONIC POLYMERIZATION METHOD USING SAME, AND STABILIZER FOR THERMALLY CATIONICALLY POLYMERIZABLE COMPOSITIONS 三新化学工業株式会社 2025-04-10 WO disclosed
CN-116648353-B Resin coated ultra-thin plate glass and display device 东丽株式会社 2025-01-21 CN disclosed
CN-114761466-B Curable resin composition, cured film, laminate, method for producing cured film, semiconductor device, and resin 富士胶片株式会社 2024-12-10 CN disclosed
CN-114008527-B Curable resin composition, cured film, laminate, method for producing cured film, semiconductor device, and polyimide or polyimide precursor 富士胶片株式会社 2024-11-01 CN disclosed
CN-118307457-A Preparation method of (4- (acryloyloxy) phenyl) dimethyl sulfonium trifluoro methanesulfonate 东南大学 2024-07-09 CN disclosed
US-20240199854-A1 COMPOSITION, CURED FILM, STRUCTURAL BODY, OPTICAL FILTER, SOLID-STATE IMAGING ELEMENT, IMAGE DISPLAY DEVICE, AND MANUFACTURING METHOD OF CURED FILM FUJIFLIM CORPORATION (JP) 2024-06-20 US disclosed
WO-2024057999-A1 COLORING COMPOSITION, CURED FILM, COLOR FILTER, DISPLAY DEVICE AND METHOD FOR PRODUCING CURED FILM 富士フイルム株式会社 2024-03-21 WO disclosed
US-20230365458-A1 RESIN-COATED ULTRA-THIN GLASS TORAY INDUSTRIES, INC. (JP) 2023-11-16 US disclosed
EP-0432599-B1 Light-sensitive composition, and process for the formation of relief patterns BASF AG (DE) 1997-03-19 EP disclosed
EP-0762207-A2 Positive working photosensitive composition and method of producing relief structures BASF AKTIENGESELLSCHAFT (DE) 1997-03-12 EP disclosed
US-5389494-A Radiation-sensitive mixture and production of relief images BASF AKTIENGESELLSCHAFT (DE) 1995-02-14 US disclosed
EP-0616258-A1 Radiation sensitive composition and process for forming relief structures with improved contrast BASF Aktiengesellschaft (DE) 1994-09-21 EP disclosed
EP-0553737-A1 Radiation-sensitive composition BASF Aktiengesellschaft (DE) 1993-08-04 EP disclosed
US-5151341-A RADIATION-SENSITIVE MIXTURE AND PRODUCTION OF RELIEF STRUCTURES BASF AKTIENGESELLSCHAFT, (DE) 1992-09-29 US disclosed
US-5110708-A RADIATION-SENSITIVE MIXTURE AND PRODUCTION OF RELIEF IMAGES BASF AKTIENGESELLSCHAFT (DE) 1992-05-05 US disclosed
EP-0432599-A2 Light-sensitive composition, and process for the formation of relief patterns BASF Aktiengesellschaft (DE) 1991-06-19 EP disclosed
EP-0424737-A2 Light-sensitive composition, and process for the formation of relief pattern BASF Aktiengesellschaft (DE) 1991-05-02 EP disclosed
EP-0424766-A2 Radiation-sensitive composition and process for the formation of relief patterns BASF Aktiengesellschaft (DE) 1991-05-02 EP disclosed