SCHEMBL51399

SCHEMBL51399

O=S(=O)([O-])C(F)(F)C(F)(F)C(F)(F)C(F)(F)F.c1ccc([S+](c2ccccc2)c2ccccc2)cc1

nearest known ligand 0.38

Predicted protein targets (top 9)

geneUniProtsupporting neighboursconfidence
CA2 P00918 17/20 0.38
CA1 P00915 16/20 0.38
MMP1 P03956 4/20 0.36
MMP2 P08253 4/20 0.36
MMP9 P14780 4/20 0.36
MMP8 P22894 4/20 0.36
MMP13 P45452 4/20 0.36
GPR3 P46089 1/20 0.35
PTPN1 P18031 1/20 0.35

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL1482705 1.00 CA2 (0.38) CA2CA1MMP1MMP2MMP9
SCHEMBL546546 0.98 CA2 (0.39) CA2CA1MMP1MMP2MMP9
SCHEMBL6117378 0.98 CA2 (0.37) CA2CA1MMP1MMP2MMP9
Perflubutane SCHEMBL6325042 0.98 CA2 (0.39) CA2CA1MMP1MMP2MMP9
SCHEMBL60437 0.98 CA2 (0.39) CA2CA1MMP1MMP2MMP9
SCHEMBL5567499 0.98 CA2 (0.39) CA2CA1MMP1MMP2MMP9
SCHEMBL60137 0.98 CA2 (0.39) CA2CA1MMP1MMP2MMP9
SCHEMBL4535202 0.98 CA2 (0.39) CA2CA1MMP1MMP2MMP9
Trifluoromethanesulfonic Acid SCHEMBL3413696 0.97 GPR3 (0.40) CA2CA1MMP1MMP2MMP9
SCHEMBL7569683 0.95 CA1 (0.35) CA2CA1MMP1MMP2MMP9

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Appears in 5087 patents — a generic fragment claimed broadly, so it's down-weighted as IP noise. Top by claim status then date:

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-12638775-B2 Methods and compositions for improved patterning of photoresist TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. (TW) 2026-05-26 US claimed
EP-4735934-A2 SURFACE ACTIVATED CHEMICAL VAPOR DEPOSITION AND USES THEREOF Gvd Corporation (US) 2026-05-06 EP claimed
US-20260049180-A1 FAST CURING, STICKY POLYMERS FOR MEDICAL USES UNIV CALIFORNIA (US) 2026-02-19 US claimed
US-20250377591-A1 PHOTORESIST COMPOSITION AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE SAMSUNG ELECTRONICS CO LTD (KR) 2025-12-11 US claimed
CN-119978604-A Polymer film composition, polymer film, and laminate 福斯特(滁州)新材料有限公司 2025-05-13 CN claimed
CN-113296359-B Bottom layer composition and method for manufacturing semiconductor device 台湾积体电路制造股份有限公司 2025-05-02 CN claimed
CN-119923600-A Chemically amplified positive resist composition for improving pattern profile and enhancing adhesion YC化学制品株式会社 2025-05-02 CN claimed
US-12269925-B1 Fast curing, biocompatible and biodegradable adhesives and sealants THE REGENTS OF THE UNIVERSITY OF CALIFORNIA (US) 2025-04-08 US claimed
CN-119463075-A Poly (4-hydroxystyrene) -based block copolymer and preparation and application thereof 微芯新材料(湖州)有限公司 2025-02-18 CN claimed
US-12232338-B2 Low-voltage operation dual-gate organic thin-film transistors and methods of manufacturing thereof CORNING INCORPORATED (US) 2025-02-18 US claimed
WO-2005036261-A1 NEGATIVE RESIST COMPOSITION WITH FLUOROSULFONAMIDE-CONTAINING POLYMER INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2005-04-21 WO claimed
US-6876017-B2 Polymer sacrificial light absorbing structure and method INTEL CORPORATION (US) 2005-04-05 US claimed
US-20050058930-A1 Negative resist composition with fluorosulfonamide-containing polymer GLOBALFOUNDRIES U.S. INC. 2005-03-17 US claimed
US-20040161710-A1 Pattern formation method MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 2004-08-19 US claimed
US-20040157415-A1 Polymer sacrificial light absorbing structure and method INTEL CORPORATION 2004-08-12 US claimed
US-20040009433-A1 Pattern formation method MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 2004-01-15 US claimed
EP-1311908-A2 PHOTORESIST COMPOSITION FOR DEEP UV AND PROCESS THEREOF CLARIANT INTERNATIONAL LTD. (CH) 2003-05-21 EP claimed
US-6447980-B1 POLY(MALEIC ANHYDRIDE-CO-T-BUTYL 5-NORBORNENE-2-CARBOXYLATE-CO-2-HYDROXYETHYL 5-NORBORNENE-2-CARBOXYLATE-CO-5-NORBORNENE-2-CARBOXYLIC ACID-CO-2-METHYL ADAMANTYL METHACRYLATE-CO-MEVALONIC LACTONE) AND ACID GENERATOR CLARIANT FINANCE (BVI) LIMITED (VG) 2002-09-10 US claimed
WO-2002006901-A2 PHOTORESIST COMPOSITION FOR DEEP UV AND PROCESS THEREOF CLARIANT INTERNATIONAL LTD (CH) 2002-01-24 WO claimed
US-6235446-B1 MIXTURE OF P-HYDROXYSTYRENE, ACRYLATED ESTER JSR CORPORATION (JP) 2001-05-22 US claimed