SCHEMBL5143771

SCHEMBL5143771

FC(F)(F)C(F)(F)C(F)(F)C(F)(F)c1ccc(Br)cc1

nearest known ligand 0.42

Predicted protein targets (top 13)

geneUniProtsupporting neighboursconfidence
CA1 P00915 1/20 0.42
CA2 P00918 1/20 0.42
CA5A P35218 1/20 0.42
CA9 Q16790 1/20 0.42
CYP2A6 P11509 1/20 0.38
LMNA P02545 1/20 0.36
TRPV1 Q8NER1 1/20 0.33
ALDH1A1 P00352 2/20 0.31
ALOX15 P16050 2/20 0.31
KDM4E B2RXH2 1/20 0.31
MAPK1 P28482 1/20 0.31
ESR1 P03372 1/20 0.30
ESR2 Q92731 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL8769941 0.98 CA1 (0.41) CA1CA2CA5ACA9CYP2A6
SCHEMBL7138748 0.98 CA1 (0.41) CA1CA2CA5ACA9CYP2A6
SCHEMBL3963219 0.98 CA1 (0.41) CA1CA2CA5ACA9CYP2A6
SCHEMBL14577302 0.93 CA1 (0.43) CA1CA2CA5ACA9CYP2A6
SCHEMBL19056952 0.93 CA1 (0.46) CA1CA2CA5ACA9CYP2A6
SCHEMBL19056950 0.90 CA1 (0.45) CA1CA2CA5ACA9CYP2A6
SCHEMBL5239662 0.87 CA1 (0.46) CA1CA2CA5ACA9CYP2A6
Biphenyl SCHEMBL6131233 0.87 ALDH1A1 (0.48) CA1CA2CA5ACA9TRPV1
SCHEMBL673282 0.85 LMNA (0.43) CA1CA2LMNAESR1ESR2
SCHEMBL663302 0.82 CA1 (0.46) CA1CA2CA5ACA9CYP2A6

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 8 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7285369-B2 photoresist composition comprising resins that increases solubility in alkali developing solution by the action of an acid and photoacid generators, which exhibits high sensitivity, high resolution and stability FUJIFILM CORPORATION (JP) 2007-10-23 US disclosed
US-20050079441-A1 Positive resist composition and pattern forming method using the same FUJI PHOTO FILM CO., LTD. 2005-04-14 US disclosed
EP-1522891-A1 Positive resist composition and pattern forming method using the same FUJI PHOTO FILM CO., LTD. (JP) 2005-04-13 EP disclosed
EP-1519228-A2 Positive resist composition and pattern formation method using the same FUJI PHOTO FILM CO., LTD. (JP) 2005-03-30 EP disclosed
US-20050064329-A1 Positive resist composition and pattern formation method using the same FUJI PHOTO FILM CO., LTD. 2005-03-24 US disclosed
EP-0629205-B1 INTERMEDIATES FOR THERMALLY STABLE, FLUORINE-CONTAINING POLYSILOXANES AND GLASS FIBER COATED THEREWITH DU PONT (US) 1997-09-10 EP disclosed
EP-0629205-A1 THERMALLY STABLE, FLUORINE-CONTAINING ORGANOSILANES. DU PONT (US) 1994-12-21 EP disclosed
WO-1993020084-A1 THERMALLY STABLE, FLUORINE-CONTAINING ORGANOSILANES E.I. DU PONT DE NEMOURS AND COMPANY (US) 1993-10-14 WO disclosed