SCHEMBL5408470

SCHEMBL5408470

CCCc1ccc([I+](OS(=O)(=O)c2cc(Cl)ccc2Cl)c2ccc(CCC)cc2)cc1

nearest known ligand 0.40

Predicted protein targets (top 13)

geneUniProtsupporting neighboursconfidence
GAA P10253 2/20 0.40
MAPT P10636 1/20 0.37
F2 P00734 1/20 0.37
ALDH1A1 P00352 5/20 0.36
KDM4E B2RXH2 2/20 0.36
POLB P06746 1/20 0.36
CTDSP1 Q9GZU7 1/20 0.36
NR3C1 P04150 1/20 0.36
PGR P06401 1/20 0.36
L3MBTL1 Q9Y468 2/20 0.36
CA2 P00918 1/20 0.35
MCL1 Q07820 1/20 0.35
RAB9A P51151 1/20 0.34

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL5403649 0.90 TP53 (0.41) GAAMAPTF2ALDH1A1KDM4E
SCHEMBL5412226 0.87 CA2 (0.36) GAAMAPTALDH1A1KDM4EPOLB
SCHEMBL5412177 0.82 TP53 (0.40) MAPTALDH1A1KDM4EL3MBTL1MCL1
SCHEMBL5406935 0.81 MCL1 (0.36) GAAMAPTALDH1A1KDM4EL3MBTL1
SCHEMBL5408741 0.80 HSD17B2 (0.41) ALDH1A1KDM4EL3MBTL1MCL1
SCHEMBL5401430 0.80 RAB9A (0.38) MAPTALDH1A1KDM4EPGRL3MBTL1
SCHEMBL5400611 0.79 KDM4E (0.47) GAAALDH1A1KDM4EPOLBL3MBTL1
SCHEMBL5411397 0.76 KAT6A (0.40) GAAPOLBCA2RAB9A
SCHEMBL5414726 0.76 TP53 (0.35) MAPTF2ALDH1A1KDM4EPOLB
SCHEMBL5411400 0.71 CA2 (0.43) GAAALDH1A1L3MBTL1CA2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7312014-B2 Poly(p-hydroxystyrene/styrene/alkyl acrylate) terpolymer derivative and acid generator comprising triphenylsulfonium benzenesulfonate derivative; forming positive pattern using transcription technology in high vacuum with irradiated energy such as electron beam, extreme ultraviolet ray and X-ray WAKO PURE CHEMICAL INDUSTRIES LTD. (JP) 2007-12-25 US disclosed
US-20040170918-A1 Poly(p-hydroxystyrene/styrene/alkyl acrylate) terpolymer derivative and acid generator comprising triphenylsulfonium benzenesulfonate derivative; forming positive pattern using transcription technology in high vacuum with irradiated energy such as electron beam, extreme ultraviolet ray and X-ray WAKO PURE CHEMICAL INDUSTRIES LTD. (JP) 2004-09-02 US disclosed
EP-1406123-A1 RESIST COMPOSITIONS Wako Pure Chemical Industries, Ltd. (JP) 2004-04-07 EP disclosed