SCHEMBL6283889

SCHEMBL6283889

C=CCOC(F)(F)C(F)(F)S(=O)(=O)O

nearest known ligand 0.32

Predicted protein targets (top 2)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 1/20 0.32
L3MBTL1 Q9Y468 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL6281884 0.84 MEN1 (0.30)
SCHEMBL27171244 0.82 CA2 (0.35)
SCHEMBL2803263 0.82
SCHEMBL6047329 0.76 ALDH1A1 (0.32) ALDH1A1L3MBTL1
SCHEMBL22735257 0.74
SCHEMBL30400932 0.74 ALDH1A1 (0.37) ALDH1A1L3MBTL1
SCHEMBL14649511 0.74 ALDH1A1 (0.32) ALDH1A1L3MBTL1
SCHEMBL6129841 0.73
SCHEMBL6129888 0.73 ALDH1A1 (0.38) ALDH1A1L3MBTL1
SCHEMBL5365972 0.72 ALDH1A1 (0.31) ALDH1A1L3MBTL1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 20 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9428485-B2 Salt, photoresist composition and method for producing photoresist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-08-30 US disclosed
US-9428485-B2 Salt, photoresist composition and method for producing photoresist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-08-30 US disclosed
US-9260542-B2 Partly fluorinated polyolefins by Ziegler-Natta polymerization GM Global Technology Operations LLC (US) 2016-02-16 US disclosed
US-20130260287-A1 Partly Fluorinated Polyolefins by Ziegler-Natta Polymerization GM Global Technology Operations LLC (US) 2013-10-03 US disclosed
US-8541157-B2 Resist composition, method of forming resist pattern, compound and acid generator including the same TOKYO OHKA KOGYO CO., LTD. (JP) 2013-09-24 US disclosed
US-8367297-B2 Resist composition, method of forming resist pattern, novel compound and acid generator TOKYO OHKA KOGYO CO., LTD. (JP) 2013-02-05 US disclosed
US-8338076-B2 Resist composition, method of forming resist pattern, novel compound, and acid generator TOKYO OHKA KOGYO CO., LTD. (JP) 2012-12-25 US disclosed
US-20120315580-A1 SALT, PHOTORESIST COMPOSITION AND METHOD FOR PRODUCING PHOTORESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2012-12-13 US disclosed
US-20120315580-A1 SALT, PHOTORESIST COMPOSITION AND METHOD FOR PRODUCING PHOTORESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2012-12-13 US disclosed
US-8206890-B2 Resist composition, method of forming resist pattern, compound and acid generator TOKYO OHKA KOGYO CO., LTD. (JP) 2012-06-26 US disclosed
US-20100196820-A1 Resist composition, method of forming resist pattern, novel compound and acid generator TOKYO OHKA KOGYO CO., LTD. (JP) 2010-08-05 US disclosed
US-7745097-B2 Compound, manufacturing method thereof, acid generator, resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2010-06-29 US disclosed
US-20100136478-A1 Resist composition, method of forming resist pattern, novel compound, and acid generator TOKYO OHKA KOGYO CO., LTD. 2010-06-03 US disclosed
US-20100081088-A1 RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, COMPOUND AND ACID GENERATOR INCLUDING THE SAME TOKYO OHKA KOGYO CO., LTD. (JP) 2010-04-01 US disclosed
US-20100015552-A1 RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, COMPOUND AND ACID GENERATOR TOKYO OHKA KOGYO CO., LTD. (JP) 2010-01-21 US disclosed
US-20090023095-A1 NOVEL COMPOUND, MANUFACTURING METHOD THEREOF, ACID GENERATOR, RESIST COMPOSITION AND METHOD OF FORMING A RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2009-01-22 US disclosed
US-6855476-B2 Photoacid generators for use in photoresist compositions ARCH SPECIALTY CHEMICALS, INC. (US) 2005-02-15 US disclosed
US-20020197558-A1 Photoacid generators for use in photoresist compositions ARCH SPECIALTY CHEMICALS, INC. 2002-12-26 US disclosed
EP-0584328-A1 PERHALOGENATED SULTONE-DERIVED MONOMERS AND POLYMERS PRODUCED THEREFROM. CENTRE NAT RECH SCIENT (FR) 1994-03-02 EP disclosed
WO-1993016988-A1 PERHALOGENATED SULTONE-DERIVED MONOMERS AND POLYMERS PRODUCED THEREFROM CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (FR) 1993-09-02 WO disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (5 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20100081088-A1 RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, COMPOUND AND ACID GENERATOR INCLUDING THE SAME ASIC1, RER1, GRIN1 ALDH1A1 717/4885L3MBTL1 4447/4885
US-20120315580-A1 SALT, PHOTORESIST COMPOSITION AND METHOD FOR PRODUCING PHOTORESIST PATTERN H1-10, H1-0, C1S ALDH1A1 2221/4885L3MBTL1 2175/4885
US-20100136478-A1 Resist composition, method of forming resist pattern, novel compound, and acid generator ASIC1, RER1, ABCC1 ALDH1A1 539/4885L3MBTL1 4226/4885
US-20100196820-A1 Resist composition, method of forming resist pattern, novel compound and acid generator ASIC1, RER1, SLC11A2 ALDH1A1 1311/4885L3MBTL1 4265/4885
US-20090023095-A1 NOVEL COMPOUND, MANUFACTURING METHOD THEREOF, ACID GENERATOR, RESIST COMPOSITION AND METHOD OF FORMING A RESIST PATTERN C1R, CYP1B1, C1S ALDH1A1 94/4885L3MBTL1 2882/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.