SCHEMBL65109

SCHEMBL65109

COC(C)OCCN(CCOC(C)OC)CCOC(C)OC

nearest known ligand 0.30

Predicted protein targets (top 1)

geneUniProtsupporting neighboursconfidence
PIK3CD O00329 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL19554731 0.88 MEN1 (0.33)
SCHEMBL5442853 0.82 CHRM2 (0.41) PIK3CD
SCHEMBL8557129 0.80
SCHEMBL11021303 0.80 LMNA (0.37)
SCHEMBL1396230 0.78
SCHEMBL64624 0.77 LMNA (0.60)
SCHEMBL2827756 0.76
SCHEMBL2928095 0.75 LMNA (0.32)
SCHEMBL12120256 0.75 KDM4E (0.33)
SCHEMBL14920988 0.74 MEN1 (0.41)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 1424 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20190171106-A1 Silsesquioxane Resin and Oxaamine Composition DOW SILICONES CORPORATION 2019-06-06 US claimed
WO-2017192345-A1 SILSESQUIOXANE RESIN AND OXAAMINE COMPOSITION DOW CORNING CORPORATION (US) 2017-11-09 WO claimed
US-6838019-B2 Phosphorescent material and electroluminescent device using thereof RITEK CORPORATION (TW) 2005-01-04 US claimed
US-20030102800-A1 Phosphorescent material RITEK CORPORATION (TW) 2003-06-05 US claimed
US-20260086457-A1 RESIST COMPOSITION AND RESIST PATTERN FORMATION METHOD TOKYO OHKA KOGYO CO LTD (JP) 2026-03-26 US disclosed
US-20260086458-A1 RESIST COMPOSITION, METHOD FOR FORMING RESIST PATTERN, COMPOUND, AND POLYMER COMPOUND TOKYO OHKA KOGYO CO LTD (JP) 2026-03-26 US disclosed
US-12583973-B2 Polyimide-based polymer, positive photosensitive resin composition, negative photosensitive resin composition, patterning method, method for forming cured film, interlayer insulating film, surface protective film, and electronic component SHIN-ETSU CHEMICAL CO., LTD. (JP) 2026-03-24 US disclosed
US-20260079394-A1 RESIST COMPOSITION, METHOD FOR FORMING RESIST PATTERN, COMPOUND AND ACID DIFFUSION CONTROL AGENT TOKYO OHKA KOGYO CO LTD (JP) 2026-03-19 US disclosed
US-20260079395-A1 RESIST COMPOSITION, RESIST PATTERN FORMING METHOD, COMPOUND AND ACID DIFFUSION CONTROL AGENT TOKYO OHKA KOGYO CO LTD (JP) 2026-03-19 US disclosed
US-12566376-B2 Resist composition and resist pattern forming method TOKYO OHKA KOGYO CO., LTD. (JP) 2026-03-03 US disclosed
US-20260050211-A1 RESIST COMPOSITION, RESIST PATTERN FORMING METHOD, COMPOUND, AND INTERMEDIATE THEREOF TOKYO OHKA KOGYO CO LTD (JP) 2026-02-19 US disclosed
US-20260003277-A1 NEGATIVE PHOTOSENSITIVE COMPOSITION, AND METHOD FOR PRODUCING PATTERNED CURED FILM TOKYO OHKA KOGYO CO LTD (JP) 2026-01-01 US disclosed
US-5220023-A Intermediates for inotropic agents JANSSEN PHARMACEUTICA N.V. (BE) 1993-06-15 US disclosed
US-5120845-A Treating congestive heart failure JANSSEN PHARMACEUTICA N.V. (BE) 1992-06-09 US disclosed
US-5064958-A CHEMICAL INTERMEDIATES FOR ANTIBACTERIAL COMPOUNDS PFIZER INC. (US) 1991-11-12 US disclosed
US-5043327-A Treating mammals with congestive heart failure JANSSEN PHARMACEUTICA N.V. (BE) 1991-08-27 US disclosed
US-4941940-A Etching a hydrolyzable polymer, hydrolysis, electroless plating with nickel or copper JP LABORATORIES, INC. (US) 1990-07-17 US disclosed
US-4939290-A Bactericides PFIZER INC. (US) 1990-07-03 US disclosed
EP-0370686-A2 A process for preparing quinolone carboxylic acid intermediates PFIZER INC. (US) 1990-05-30 EP disclosed
US-4927970-A Substituted 3-cyclobutene-1,2-dione intermediates BRISTOL-MYERS COMPANY (US) 1990-05-22 US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (9 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20260086458-A1 RESIST COMPOSITION, METHOD FOR FORMING RESIST PATTERN, COMPOUND, AND POLYMER COMPOUND RER1, ITGA1, AR PIK3CD 3383/4885
US-20260086457-A1 RESIST COMPOSITION AND RESIST PATTERN FORMATION METHOD CCND2, CCNA1, CCND1 PIK3CD 2991/4885
US-20260003277-A1 NEGATIVE PHOTOSENSITIVE COMPOSITION, AND METHOD FOR PRODUCING PATTERNED CURED FILM H1-4, H1-10, H1-0 PIK3CD 1111/4885
US-20260079395-A1 RESIST COMPOSITION, RESIST PATTERN FORMING METHOD, COMPOUND AND ACID DIFFUSION CONTROL AGENT F9, AFF2, AFF1 PIK3CD 3427/4885
US-20260050211-A1 RESIST COMPOSITION, RESIST PATTERN FORMING METHOD, COMPOUND, AND INTERMEDIATE THEREOF RARG, RXRG, IGF1R PIK3CD 4671/4885
US-12566376-B2 Resist composition and resist pattern forming method RER1, REV1, GAR1 PIK3CD 4801/4885
US-20260079394-A1 RESIST COMPOSITION, METHOD FOR FORMING RESIST PATTERN, COMPOUND AND ACID DIFFUSION CONTROL AGENT DRD1, DRD2, FANCD2 PIK3CD 2241/4885
US-12583973-B2 Polyimide-based polymer, positive photosensitive resin composition, negative photosensitive resin composition, patterning method, method for forming cured film, interlayer insulating film, surface protective film, and electronic component PRDM9, ARCN1, PUF60 PIK3CD 241/4885
US-20030102800-A1 Phosphorescent material PKD1, RPS6KA1, RPS6KA6 PIK3CD 489/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.