SCHEMBL684988

SCHEMBL684988

C=Cc1ccc(OC(C)OCC23CC4CC(CC(C4)C2)C3)cc1

nearest known ligand 0.34

Predicted protein targets (top 10)

geneUniProtsupporting neighboursconfidence
SCN9A Q15858 2/20 0.34
CHRNA7 P36544 2/20 0.34
CHRNB2 P17787 1/20 0.31
CHRNB4 P30926 1/20 0.31
CHRNA3 P32297 1/20 0.31
CHRNA4 P43681 1/20 0.31
ALDH1A3 P47895 1/20 0.30
MEN1 O00255 1/20 0.30
KMT2A Q03164 1/20 0.30
ALDH1A1 P00352 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL19333726 0.93 SCN9A (0.31) SCN9A
SCHEMBL17736193 0.87 MEN1 (0.37) CHRNA7CHRNB2CHRNB4CHRNA3CHRNA4
SCHEMBL18924642 0.82
SCHEMBL22048407 0.82 CHRNA7 (0.32) CHRNA7
SCHEMBL20333367 0.81 MEN1 (0.36) SCN9AMEN1KMT2AALDH1A1
SCHEMBL686108 0.81 CNR2 (0.36) SCN9AMEN1KMT2AALDH1A1
SCHEMBL19772578 0.80
SCHEMBL685653 0.80 ALDH1A3 (0.33) CHRNA7CHRNB2CHRNB4CHRNA3CHRNA4
SCHEMBL10182512 0.79 ALDH1A1 (0.37) SCN9AMEN1KMT2AALDH1A1
SCHEMBL25858572 0.78 MEN1 (0.34) SCN9AMEN1KMT2AALDH1A1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 328 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-10795258-B2 Resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2020-10-06 US disclosed
US-10774029-B2 Compound, resin, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2020-09-15 US disclosed
US-10725380-B2 Compound, resin, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2020-07-28 US disclosed
US-10670965-B2 Polymers and photoresist compositions ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2020-06-02 US disclosed
US-10599033-B2 Salt, acid generator, resin, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2020-03-24 US disclosed
US-10571805-B2 Resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2020-02-25 US disclosed
US-10377692-B2 Photoresist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2019-08-13 US disclosed
US-10365560-B2 Resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2019-07-30 US disclosed
US-10359700-B2 Salt, acid generator, photoresist composition and process of producing photoresist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2019-07-23 US disclosed
US-20190025698-A1 COMPOUND, RESIN, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2019-01-24 US disclosed
US-20110065047-A1 PHOTORESIST COMPOSITION SUMITOMO CHEMICHAL COMPANY, LIMITED (JP) 2011-03-17 US disclosed
US-20110065047-A1 PHOTORESIST COMPOSITION SUMITOMO CHEMICHAL COMPANY, LIMITED (JP) 2011-03-17 US disclosed
US-20110065040-A1 PHOTORESIST COMPOSITION SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2011-03-17 US disclosed
US-20110065040-A1 PHOTORESIST COMPOSITION SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2011-03-17 US disclosed
US-20110059400-A1 PHOTORESIST COMPOSITION SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2011-03-10 US disclosed
US-20110059400-A1 PHOTORESIST COMPOSITION SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2011-03-10 US disclosed
US-20100323296-A1 RESIN AND RESIST COMPOSITION SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2010-12-23 US disclosed
US-20100323296-A1 RESIN AND RESIST COMPOSITION SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2010-12-23 US disclosed
US-20100075257-A1 Resin and Chemically Amplified Resist Composition Comprising the Same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2010-03-25 US disclosed
US-20100075257-A1 Resin and Chemically Amplified Resist Composition Comprising the Same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2010-03-25 US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (9 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20110059400-A1 PHOTORESIST COMPOSITION C1R, C1S, CCNT1 SCN9A 4709/4885CHRNA7 2055/4885CHRNB2 3321/4885
US-10725380-B2 Compound, resin, resist composition and method for producing resist pattern C1R, C9, RER1 SCN9A 3385/4885CHRNA7 2321/4885CHRNB2 2711/4885
US-20110065047-A1 PHOTORESIST COMPOSITION C1R, C1S, RER1 SCN9A 4360/4885CHRNA7 2980/4885CHRNB2 3818/4885
US-20110065040-A1 PHOTORESIST COMPOSITION C1R, P4HA1, C1S SCN9A 4374/4885CHRNA7 3065/4885CHRNB2 3632/4885
US-10359700-B2 Salt, acid generator, photoresist composition and process of producing photoresist pattern CBR1, CBR3, C1R SCN9A 865/4885CHRNA7 2405/4885CHRNB2 3352/4885
US-10599033-B2 Salt, acid generator, resin, resist composition and method for producing resist pattern RER1, FRG1, C1R SCN9A 1124/4885CHRNA7 941/4885CHRNB2 1367/4885
US-20190025698-A1 COMPOUND, RESIN, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN C1R, C9, RER1 SCN9A 3454/4885CHRNA7 2315/4885CHRNB2 2657/4885
US-10774029-B2 Compound, resin, resist composition and method for producing resist pattern C1R, C9, RER1 SCN9A 3434/4885CHRNA7 2337/4885CHRNB2 2688/4885
US-10377692-B2 Photoresist composition C1R, C1S, F12 SCN9A 4676/4885CHRNA7 2157/4885CHRNB2 3292/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.