SCHEMBL75487

SCHEMBL75487

C=C(C)C(=O)OCC1(O)C2CC3CC(C2)CC1C3

nearest known ligand 0.41

Predicted protein targets (top 5)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 5/20 0.41
TSHR P16473 3/20 0.38
THRB P10828 1/20 0.36
HSD11B1 P28845 2/20 0.33
SMN1; SMN2 Q16637 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL1310160 0.85 ALDH1A1 (0.42) ALDH1A1TSHRTHRBHSD11B1
SCHEMBL3415852 0.84 THRB (0.41) ALDH1A1TSHRTHRBSMN1; SMN2
SCHEMBL15928282 0.83 ALDH1A1 (0.41) ALDH1A1TSHRTHRBHSD11B1
SCHEMBL14795024 0.81 ALDH1A1 (0.44) ALDH1A1TSHRTHRB
SCHEMBL3053050 0.81 ALDH1A1 (0.39) ALDH1A1TSHRTHRBHSD11B1
SCHEMBL75649 0.81 ALDH1A1 (0.39) ALDH1A1TSHRTHRBHSD11B1
SCHEMBL3407069 0.80 TSHR (0.47) ALDH1A1TSHRTHRB
SCHEMBL22811898 0.80 HSD11B1 (0.51) ALDH1A1TSHRTHRBHSD11B1SMN1; SMN2
SCHEMBL3053049 0.78 ALDH1A1 (0.37) ALDH1A1TSHRTHRBHSD11B1
SCHEMBL3797993 0.76 ALDH1A1 (0.54) ALDH1A1TSHRTHRB

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 62 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-11874603-B2 Photoresist composition comprising amide compound and pattern formation methods using the same ROHM AND HAAS ELECTRONIC MATERIALS KOREA LTD. (KR) 2024-01-16 US disclosed
US-11874603-B2 Photoresist composition comprising amide compound and pattern formation methods using the same ROHM AND HAAS ELECTRONIC MATERIALS KOREA LTD. (KR) 2024-01-16 US disclosed
US-11829069-B2 Photoresist compositions and methods ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2023-11-28 US disclosed
US-20230099348-A1 PHOTORESIST COMPOSITION COMPRISING AMIDE COMPOUND AND PATTERN FORMATION METHODS USING THE SAME DUPONT SPECIALTY MATERIALS KOREA LTD (KR) 2023-03-30 US disclosed
EP-2485090-B1 Radiation-sensitive resin composition for forming resist pattern JSR CORP (JP) 2020-12-23 EP disclosed
US-20180203352-A1 MONOMERS, POLYMERS AND PHOTORESIST COMPOSITIONS ROHM AND HAAS ELECTRONIC MATERIALS KOREA LTD. (KR) 2018-07-19 US disclosed
US-20180059545-A1 MONOMERS, POLYMERS AND PHOTORESIST COMPOSITIONS DUPONT SPECIALTY MATERIALS KOREA LTD (KR) 2018-03-01 US disclosed
US-20170090287-A1 OVERCOAT COMPOSITIONS AND METHODS FOR PHOTOLITHOGRAPHY DUPONT SPECIALTY MATERIALS KOREA LTD (KR) 2017-03-30 US disclosed
US-20170090283-A1 PHOTORESIST COMPOSITIONS AND METHODS DUPONT SPECIALTY MATERIALS KOREA LTD (KR) 2017-03-30 US disclosed
US-20170090283-A1 PHOTORESIST COMPOSITIONS AND METHODS DUPONT SPECIALTY MATERIALS KOREA LTD (KR) 2017-03-30 US disclosed
US-20120308928-A1 RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, POLYMERIC COMPOUND AND METHOD OF PRODUCING THE SAME TOKYO OHKA KOGYO CO., LTD. (JP) 2012-12-06 US disclosed
WO-2012157352-A1 PHOTORESIST COMPOSITION JSR株式会社 (JP) 2012-11-22 WO disclosed
US-20120202150-A1 RADIATION-SENSITIVE RESIN COMPOSITION JSR CORPORATION (JP) 2012-08-09 US disclosed
US-20120202150-A1 RADIATION-SENSITIVE RESIN COMPOSITION JSR CORPORATION (JP) 2012-08-09 US disclosed
EP-2485090-A1 Radiation-sensitive resin composition for forming resist pattern JSR Corporation (JP) 2012-08-08 EP disclosed
US-20120108043-A1 PATTERN FORMING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-05-03 US disclosed
US-8129100-B2 Double patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-03-06 US disclosed
US-20100266954-A1 ADAMANTANE DERIVATIVE, METHOD FOR PRODUCING THE SAME, AND CURING COMPOSITION CONTAINING ADAMANTANE DERIVATIVE IDEMITSU KOSAN CO., LTD. (JP) 2010-10-21 US disclosed
US-20100266954-A1 ADAMANTANE DERIVATIVE, METHOD FOR PRODUCING THE SAME, AND CURING COMPOSITION CONTAINING ADAMANTANE DERIVATIVE IDEMITSU KOSAN CO., LTD. (JP) 2010-10-21 US disclosed
US-20090253084-A1 DOUBLE PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2009-10-08 US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (5 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20170090287-A1 OVERCOAT COMPOSITIONS AND METHODS FOR PHOTOLITHOGRAPHY OGT, COLGALT1, PARG ALDH1A1 2382/4885TSHR 4812/4885THRB 4598/4885
US-20100266954-A1 ADAMANTANE DERIVATIVE, METHOD FOR PRODUCING THE SAME, AND CURING COMPOSITION CONTAINING ADAMANTANE DERIVATIVE APP, TET1, AMD1 ALDH1A1 8/4885TSHR 4139/4885THRB 3702/4885
US-20180059545-A1 MONOMERS, POLYMERS AND PHOTORESIST COMPOSITIONS PARG, LCP1, ALG3 ALDH1A1 894/4885TSHR 4727/4885THRB 4517/4885
US-20170090283-A1 PHOTORESIST COMPOSITIONS AND METHODS PARG, PNN, PARN ALDH1A1 4826/4885TSHR 4722/4885THRB 4747/4885
US-20180203352-A1 MONOMERS, POLYMERS AND PHOTORESIST COMPOSITIONS MAP1LC3C, LCP1, PIN1 ALDH1A1 2061/4885TSHR 4290/4885THRB 4285/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.