SCHEMBL855811

SCHEMBL855811

C=C(C)C(=O)OCOC1C2CC3CC(C2)C(=O)C1C3

nearest known ligand 0.33

Predicted protein targets (top 2)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 1/20 0.33
TSHR P16473 1/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL13008684 0.84 KMT2A (0.30)
SCHEMBL13759960 0.83
SCHEMBL14313768 0.83
SCHEMBL13718849 0.83 ALDH1A1 (0.31) ALDH1A1TSHR
SCHEMBL15278108 0.82
SCHEMBL953223 0.81 ALDH1A1 (0.30) ALDH1A1TSHR
SCHEMBL15278109 0.81 L3MBTL1 (0.33)
SCHEMBL218470 0.81 ALDH1A1 (0.41) ALDH1A1TSHR
SCHEMBL13809878 0.80
SCHEMBL14982828 0.80

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 16 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9023580-B2 Method of forming polymeric compound, resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2015-05-05 US disclosed
EP-2433972-B1 Polymer compound, photoresist composition containing such polymer compound, and method for forming resist pattern TOKYO OHKA KOGYO CO LTD (JP) 2014-11-12 EP disclosed
EP-1717261-B1 POLYMER COMPOUND, PHOTORESIST COMPOSITION CONTAINING SUCH POLYMER COMPOUND, AND METHOD FOR FORMING RESIST PATTERN TOKYO OHKA KOGYO CO LTD (JP) 2014-01-01 EP disclosed
US-20130137049-A1 METHOD OF FORMING POLYMERIC COMPOUND, RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2013-05-30 US disclosed
EP-2433972-A1 Polymer compound, photoresist composition containing such polymer compound, and method for forming resist pattern Tokyo Ohka Kogyo Co., Ltd. (JP) 2012-03-28 EP disclosed
US-7723007-B2 Polymer compound, photoresist composition including the polymer compound, and resist pattern formation method TOKYO OHKA KOGYO CO., LTD. (JP) 2010-05-25 US disclosed
US-7723007-B2 Polymer compound, photoresist composition including the polymer compound, and resist pattern formation method TOKYO OHKA KOGYO CO., LTD. (JP) 2010-05-25 US disclosed
US-7723007-B2 Polymer compound, photoresist composition including the polymer compound, and resist pattern formation method TOKYO OHKA KOGYO CO., LTD. (JP) 2010-05-25 US disclosed
US-7608381-B2 copolymer of an acrylate monomer containing a 20 membered cyclic group, an acrylate monomer of alpha-alkyl acrylate estre having a lactone containing monocyclic or polycyclic group, a lower alkylate ester having an aliphatic cyclic group containing non acid dissociable dissociation inhibiting group TOKYO OHKA KOGYO CO., LTD. (JP) 2009-10-27 US disclosed
US-7608381-B2 copolymer of an acrylate monomer containing a 20 membered cyclic group, an acrylate monomer of alpha-alkyl acrylate estre having a lactone containing monocyclic or polycyclic group, a lower alkylate ester having an aliphatic cyclic group containing non acid dissociable dissociation inhibiting group TOKYO OHKA KOGYO CO., LTD. (JP) 2009-10-27 US disclosed
US-20080166655-A1 Polymer Compound, Photoresist Composition Including the Polymer Compound, and Resist Pattern Formation Method OGATA TOSHIYUKI 2008-07-10 US disclosed
US-20080166655-A1 Polymer Compound, Photoresist Composition Including the Polymer Compound, and Resist Pattern Formation Method OGATA TOSHIYUKI 2008-07-10 US disclosed
US-20080166655-A1 Polymer Compound, Photoresist Composition Including the Polymer Compound, and Resist Pattern Formation Method OGATA TOSHIYUKI 2008-07-10 US disclosed
US-20080096126-A1 Polymer Compound, Positive Resist Composition and Process for Forming Resist Pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2008-04-24 US disclosed
US-20080096126-A1 Polymer Compound, Positive Resist Composition and Process for Forming Resist Pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2008-04-24 US disclosed
EP-1717261-A1 POLYMER COMPOUND, PHOTORESIST COMPOSITION CONTAINING SUCH POLYMER COMPOUND, AND METHOD FOR FORMING RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2006-11-02 EP disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (1 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20080166655-A1 Polymer Compound, Photoresist Composition Including the Polymer Compound, and Resist Pattern Formation Method CRHR1, ADH1C, ADH1A ALDH1A1 253/4885TSHR 1579/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.