Trifluoromethanesulfonic Acid

Trifluoromethanesulfonic Acid

SCHEMBL927489

CC[S+](CC)CC.O=S(=O)([O-])C(F)(F)F

nearest known ligand 0.36

Full drug profile on Sugi Atlas →

Predicted protein targets (top 8)

geneUniProtsupporting neighboursconfidence
KCNH2 Q12809 7/20 0.36
ACHE P22303 8/20 0.34
GPR3 P46089 1/20 0.33
CA1 P00915 1/20 0.30
CA2 P00918 1/20 0.30
CA7 P43166 1/20 0.30
CA13 Q8N1Q1 1/20 0.30
EPHX1 P07099 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Trifluoromethanesulfonic Acid SCHEMBL6896985 0.84 KCNH2 (0.36) KCNH2ACHEGPR3CA1CA2
Trifluoromethanesulfonic Acid SCHEMBL2231643 0.82 KCNH2 (0.35) KCNH2ACHEGPR3
Trifluoromethanesulfonic Acid SCHEMBL6550544 0.81 KCNH2 (0.30) KCNH2
Trifluoromethanesulfonic Acid SCHEMBL15667318 0.78 KCNH2 (0.38) KCNH2ACHEGPR3CA1CA2
Trifluoromethanesulfonic Acid SCHEMBL64973 0.77 GPR3 (0.38) KCNH2ACHEGPR3CA1CA2
Trifluoromethanesulfonic Acid SCHEMBL28255383 0.76 KCNH2 (0.37) KCNH2ACHEGPR3CA1CA2
Trifluoromethanesulfonic Acid SCHEMBL29171769 0.76 KCNH2 (0.37) KCNH2ACHEGPR3CA1CA2
Trifluoromethanesulfonic Acid SCHEMBL3962867 0.74 GPR3 (0.39) ACHEGPR3CA1CA2CA7
Trifluoromethanesulfonic Acid SCHEMBL1293248 0.74 GPR3 (0.39) KCNH2ACHEGPR3CA1CA2
Trifluoromethanesulfonic Acid SCHEMBL27033917 0.73 BBOX1 (0.41) KCNH2ACHEGPR3EPHX1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 22 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20260121095-A1 Advanced Ion Exchange Membranes And Applications Thereof WILLIAMS RICHARD KENT (US) 2026-04-30 US disclosed
WO-2025128460-A1 ADVANCED ION EXCHANGE MEMBRANES AND APPLICATIONS THEREOF WILLIAMS RICHARD KENT (US) 2025-06-19 WO disclosed
CN-109415602-B 2-cyanoacrylate-based adhesive composition 东亚合成株式会社 2021-05-25 CN disclosed
US-10793749-B2 2-cyanoacrylate-based adhesive composition TOAGOSEI CO., LTD. (JP) 2020-10-06 US disclosed
US-20190233679-A1 2-CYANOACRYLATE-BASED ADHESIVE COMPOSITION TOAGOSEI CO., LTD. (JP) 2019-08-01 US disclosed
EP-1788436-B1 Rework process for photoresist film SHINETSU CHEMICAL CO (JP) 2013-01-09 EP disclosed
US-7868407-B2 Substrate comprising a lower silicone resin film and an upper silicone resin film SHIN-ETSU CHEMICAL CO., LTD. (JP) 2011-01-11 US disclosed
US-7642043-B2 Rework process for photoresist film SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-01-05 US disclosed
US-7638268-B2 Rework process for photoresist film SHIN-ESTU CHEMICAL CO., LTD. (JP) 2009-12-29 US disclosed
EP-1788437-B1 Rework process for photoresist film SHINETSU CHEMICAL CO (JP) 2009-12-23 EP disclosed
US-7303785-B2 Antireflective film material, and antireflective film and pattern formation method using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-12-04 US disclosed
EP-1801619-A2 Substrate, method for producing the same, and patterning process using the same Shin-Etsu Chemical Co., Ltd. (JP) 2007-06-27 EP disclosed
EP-1798599-A1 Antireflection film composition, patterning process and substrate using the same Shinetsu Chemical Co., Ltd. (JP) 2007-06-20 EP disclosed
US-20070134916-A1 Antireflection film composition, patterning process and substrate using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-06-14 US disclosed
US-20070128886-A1 Substrate, method for producing the same, and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-06-07 US disclosed
US-20070117411-A1 Rework process for photoresist film SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-05-24 US disclosed
EP-1788436-A1 Rework process for photoresist film Shin-Etsu Chemical Company, Ltd. (JP) 2007-05-23 EP disclosed
EP-1788437-A2 Rework process for photoresist film Shinetsu Chemical Co., Ltd. (JP) 2007-05-23 EP disclosed
US-20070111134-A1 solvent remove the first photoresist film, forming a second photoresist film over the second antireflection silicone resin film which is over the first antireflection silicone resin film; lower cost and provide an excellent resist pattern SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-05-17 US disclosed
US-20040253461-A1 Antireflective film material, and antireflective film and pattern formation method using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2004-12-16 US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (1 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20260121095-A1 Advanced Ion Exchange Membranes And Applications Thereof MYOC, MB, MYOF KCNH2 644/4885ACHE 1427/4885GPR3 3210/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.