SCHEMBL9405213

SCHEMBL9405213

CO[Si](CCCNS(C)(=O)=O)(OC)OC

nearest known ligand 0.39

Predicted protein targets (top 15)

geneUniProtsupporting neighboursconfidence
POLB P06746 1/20 0.39
ALDH1A1 P00352 3/20 0.37
PKM P14618 1/20 0.34
LMNA P02545 1/20 0.32
CA12 O43570 2/20 0.32
CA14 Q9ULX7 2/20 0.32
CA1 P00915 2/20 0.32
CA2 P00918 2/20 0.32
CA7 P43166 1/20 0.32
EPHX2 P34913 1/20 0.32
CYP4F2 P78329 1/20 0.31
CYP4A11 Q02928 1/20 0.31
MTNR1A P48039 1/20 0.31
GRIA1 P42261 3/20 0.30
MAPT P10636 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL3099041 0.80 POLB (0.37) POLBALDH1A1CA12CA14CA1
SCHEMBL16015210 0.80 RELA (0.36) ALDH1A1PKMLMNACA12CA14
SCHEMBL26454404 0.78 POLB (0.41) POLBALDH1A1CA12CA14CA1
SCHEMBL3103529 0.77 ALDH1A1 (0.31) ALDH1A1PKM
SCHEMBL10312335 0.76 POLB (0.42) POLBALDH1A1CA12CA14CA1
SCHEMBL3101159 0.74 PDE4A (0.30)
SCHEMBL12134704 0.74 GRIA1 (0.40) LMNACA12CA14CA1CA2
SCHEMBL3098419 0.74 MMP8 (0.35)
SCHEMBL12134703 0.74 EPHX1 (0.35) ALDH1A1LMNACA12CA14CA1
SCHEMBL3797797 0.74 POLB (0.41) POLBALDH1A1CA12CA14CA1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 25 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-112947000-B Composition for forming silicon-containing EUV resist underlayer film containing sulfonate 日产化学工业株式会社 2024-11-29 CN disclosed
CN-112947000-A Composition for forming silicon-containing EUV resist underlayer film containing sulfonic acid/salt 日产化学工业株式会社 2021-06-11 CN disclosed
US-20210116813-A1 COMPOSITION FOR RESIST UNDERLAYER FILM FORMATION, UNDERLAYER FILM FOR LITHOGRAPHY, AND PATTERN FORMATION METHOD MITSUBISHI GAS CHEMICAL COMPANY, INC. (JP) 2021-04-22 US disclosed
EP-3786710-A1 RESIST UNDERLAYER FILM-FORMING COMPOSITION, UNDERLAYER FILM FOR LITHOGRAPHY, AND PATTERN FORMATION METHOD MITSUBISHI GAS CHEMICAL COMPANY, INC. (JP) 2021-03-03 EP disclosed
CN-112005168-A Resist underlayer film forming composition, underlayer film for lithography, and pattern forming method 三菱瓦斯化学株式会社 2020-11-27 CN disclosed
US-10613440-B2 Silicon-containing EUV resist underlayer film-forming composition containing onium sulfonate NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2020-04-07 US disclosed
US-10079146-B2 Resist underlayer film forming composition containing silicon containing cyclic organic group having hetero atom NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2018-09-18 US disclosed
US-9524871-B2 Silicon-containing resist underlayer film-forming composition having sulfone structure NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2016-12-20 US disclosed
US-9494862-B2 Resist underlayer film forming composition containing silicon having sulfone structure and amine structure NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2016-11-15 US disclosed
US-9291900-B2 Composition for forming resist underlayer film, containing silicon that bears diketone-structure-containing organic group NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2016-03-22 US disclosed
US-9023588-B2 Resist underlayer film forming composition containing silicon having nitrogen-containing ring NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2015-05-05 US disclosed
US-20140170855-A1 SILICON-CONTAINING RESIST UNDERLAYER FILM-FORMING COMPOSITION HAVING SULFONE STRUCTURE NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2014-06-19 US disclosed
EP-2735904-A1 THIN FILM FORMATION COMPOSITION FOR LITHOGRAPHY WHICH CONTAINS TITANIUM AND SILICON Nissan Chemical Industries, Ltd. (JP) 2014-05-28 EP disclosed
US-20140120730-A1 THIN FILM FORMING COMPOSITION FOR LITHOGRAPHY CONTAINING TITANIUM AND SILICON NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2014-05-01 US disclosed
EP-2669737-A1 COMPOSITION FOR FORMING RESIST UNDERLAYER FILMS, CONTAINING SILICON THAT BEARS DIKETONE-STRUCTURE-CONTAINING ORGANIC GROUP Nissan Chemical Industries, Ltd. (JP) 2013-12-04 EP disclosed
US-20130302991-A1 COMPOSITION FOR FORMING RESIST UNDERLAYER FILM, CONTAINING SILICON THAT BEARS DIKETONE-STRUCTURE-CONTAINING ORGANIC GROUP NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2013-11-14 US disclosed
EP-2538276-A1 COMPOSITION FOR FORMATION OF RESIST UNDERLAYER FILM CONTAINING SILICON HAVING NITROGEN-CONTAINING RING Nissan Chemical Industries, Ltd. (JP) 2012-12-26 EP disclosed
US-20120315765-A1 RESIST UNDERLAYER FILM FORMING COMPOSITION CONTAINING SILICON HAVING NITROGEN-CONTAINING RING NISSAN CHEMICAL INDUSTRIES, LTD. (JP) 2012-12-13 US disclosed
US-5283310-A Organosilicon, organometallic graft polymer SAINT-GOBAIN VITRAGE INTERNATIONAL (FR) 1994-02-01 US disclosed
EP-0532408-A1 Proton-conducting polymer and its use as electrolyte in electrochemical devices SAINT-GOBAIN VITRAGE INTERNATIONAL (FR) 1993-03-17 EP disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (1 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20120315765-A1 RESIST UNDERLAYER FILM FORMING COMPOSITION CONTAINING SILICON HAVING NITROGEN-CONTAINING RING SRSF1, SRSF7, SRRM2 POLB 1809/4885ALDH1A1 2272/4885PKM 2590/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.