Predicted protein targets (top 7)
| gene | UniProt | supporting neighbours | confidence | |
|---|---|---|---|---|
| ▸ | CYP2A6 | P11509 | 1/20 | 0.36 |
| ▸ | MEN1 | O00255 | 1/20 | 0.31 |
| ▸ | LMNA | P02545 | 1/20 | 0.31 |
| ▸ | THRB | P10828 | 1/20 | 0.31 |
| ▸ | BLM | P54132 | 1/20 | 0.31 |
| ▸ | KMT2A | Q03164 | 1/20 | 0.31 |
| ▸ | TDP1 | Q9NUW8 | 1/20 | 0.31 |
Click a target to see other patent compounds predicted against it — the reverse direction, in place.
Similar compounds — the chemically nearest patent molecules
Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.
| Compound | similarity | top predicted | shared targets | |
|---|---|---|---|---|
| SCHEMBL4438638 | 0.84 | CYP2A6 (0.38) | CYP2A6MEN1LMNATHRBBLM | |
| SCHEMBL4403285 | 0.80 | MEN1 (0.38) | CYP2A6MEN1LMNATHRBBLM | |
| SCHEMBL4408128 | 0.77 | MEN1 (0.32) | CYP2A6MEN1LMNATHRBBLM | |
| SCHEMBL4408121 | 0.73 | PPARG (0.37) | CYP2A6MEN1LMNAKMT2ATDP1 | |
| SCHEMBL4944634 | 0.72 | THRB (0.52) | CYP2A6MEN1LMNATHRBBLM | |
| SCHEMBL18564382 | 0.71 | — | — | |
| SCHEMBL10067902 | 0.70 | CYP2A6 (0.35) | CYP2A6MEN1LMNATHRBBLM | |
| SCHEMBL981676 | 0.70 | LMNA (0.55) | CYP2A6MEN1LMNATHRBBLM | |
| SCHEMBL1893653 | 0.68 | HSD17B10 (0.41) | CYP2A6LMNATDP1 | |
| SCHEMBL4745707 | 0.68 | CYP2A6 (0.37) | CYP2A6TDP1 |
Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.
Patent provenance — the patents this molecule appears in, and who filed them
Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.
| Patent | Title | Assignee | Published | Priority | Filing | Country | Status |
|---|---|---|---|---|---|---|---|
| US-8877422-B2 | Resist underlayer film composition and patterning process using the same | SHIN-ETSU CHEMICAL CO., LTD. (JP) | 2014-11-04 | — | — | US | disclosed |
| EP-2447775-B1 | Resist underlayer film composition and patterning process using the same | SHINETSU CHEMICAL CO (JP) | 2013-05-29 | — | — | EP | disclosed |
| US-20120108071-A1 | RESIST UNDERLAYER FILM COMPOSITION AND PATTERNING PROCESS USING THE SAME | SHIN-ETSU CHEMICAL CO., LTD. (JP) | 2012-05-03 | — | — | US | disclosed |
| EP-2447775-A1 | Resist underlayer film composition and patterning process using the same | Shin-Etsu Chemical Co., Ltd. (JP) | 2012-05-02 | — | — | EP | disclosed |