SCHEMBL10178634

SCHEMBL10178634

CCC(C)c1ccc(COc2ccccc2C(=O)OC)cc1

nearest known ligand 0.52

Predicted protein targets (top 16)

geneUniProtsupporting neighboursconfidence
RAB9A P51151 2/20 0.52
L3MBTL1 Q9Y468 2/20 0.52
NPC1 O15118 1/20 0.52
HSP90AA1 P07900 1/20 0.52
KDM4E B2RXH2 1/20 0.51
HTT P42858 1/20 0.46
PARP1 P09874 1/20 0.46
SLC6A3 Q01959 1/20 0.46
LMNA P02545 2/20 0.46
HPGD P15428 1/20 0.46
FFAR4 Q5NUL3 1/20 0.46
ALDH1A1 P00352 1/20 0.46
MAPT P10636 1/20 0.45
SGMS2 Q8NHU3 2/20 0.45
PLA2G1B P04054 1/20 0.45
ATG4B Q9Y4P1 1/20 0.45

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL6722042 0.87 LMNA (0.49) RAB9AL3MBTL1NPC1KDM4EPARP1
SCHEMBL10178720 0.86 ALDH1A1 (0.49) RAB9ANPC1HSP90AA1KDM4EHTT
SCHEMBL10411181 0.86 SLC6A3 (0.58) RAB9AL3MBTL1KDM4EHTTPARP1
SCHEMBL10179052 0.85 NPC1 (0.54) RAB9AL3MBTL1NPC1HSP90AA1KDM4E
SCHEMBL13144216 0.83 SLC6A3 (0.65) RAB9AL3MBTL1NPC1HSP90AA1KDM4E
SCHEMBL978857 0.82 HTT (0.64) L3MBTL1NPC1HTTSLC6A3LMNA
SCHEMBL5309541 0.81 KMT2A (0.64) RAB9AL3MBTL1NPC1KDM4ESLC6A3
SCHEMBL13044291 0.81 SGMS2 (0.55) RAB9AL3MBTL1KDM4EHTTPARP1
SCHEMBL4002825 0.79 FFAR4 (0.55) L3MBTL1NPC1KDM4EHTTPARP1
SCHEMBL15627054 0.79 NPC1 (0.47) RAB9AL3MBTL1NPC1HSP90AA1KDM4E

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 2 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8124310-B2 Positive resist composition and pattern forming method using the same FUJIFILM CORPORATION (JP) 2012-02-28 US disclosed
US-20090087784-A1 POSITIVE RESIST COMPOSITION AND PATTERN FORMING METHOD USING THE SAME FUJIFILM CORPORATION (JP) 2009-04-02 US disclosed