SCHEMBL1130148

SCHEMBL1130148

C[S+](C)c1ccc(OC(=O)C(F)(F)F)c2ccccc12

nearest known ligand 0.37

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
▸ TSHR P16473 2/20 0.37
▸ PKM P14618 1/20 0.37
▸ NPC1 O15118 1/20 0.37
▸ RAB9A P51151 1/20 0.37
▸ LMNA P02545 2/20 0.35
▸ L3MBTL1 Q9Y468 1/20 0.35
▸ ELANE P08246 1/20 0.34
▸ NCEH1 Q6PIU2 2/20 0.33
▸ GAA P10253 2/20 0.33
▸ HSD17B10 Q99714 2/20 0.33
▸ ALDH1A1 P00352 1/20 0.33
▸ PGR P06401 1/20 0.33
▸ PTGS1 P23219 1/20 0.33
▸ MAPK1 P28482 1/20 0.33
▸ SLC22A6 Q4U2R8 1/20 0.33
▸ CYP1A2 P05177 1/20 0.32
▸ CYP3A4 P08684 1/20 0.32
▸ CYP2C9 P11712 1/20 0.32
▸ CYP2C19 P33261 1/20 0.32
▸ ESR1 P03372 3/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Methylsulfanylmethane SCHEMBL5636396 0.76 ESR1 (0.44) TSHRPKMNPC1RAB9AGAA
Hydrochloric Acid SCHEMBL4411919 0.75 TYMS (0.45) TSHRPKMNPC1RAB9ALMNA
SCHEMBL36125 0.73 DRD2 (0.34) GAAESR1ESR2MEN1KMT2A
SCHEMBL4082182 0.72 ALDH1A1 (0.56) RAB9AL3MBTL1GAAHSD17B10ALDH1A1
SCHEMBL6851496 0.72 TDP1 (0.55) TSHRELANEGAAALDH1A1MAPK1
SCHEMBL28404237 0.72 ELANE (0.47) TSHRELANEGAAHSD17B10ALDH1A1
SCHEMBL1842714 0.71 HSD17B10 (0.46) RAB9AL3MBTL1GAAHSD17B10ALDH1A1
Trifluoroacetic Acid SCHEMBL1130145 0.71 IDO1 (0.41) —
SCHEMBL30341823 0.70 PKM (0.49) TSHRPKMNPC1RAB9ALMNA
SCHEMBL25695077 0.70 NPSR1 (0.35) TSHRPKMNPC1RAB9ALMNA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 19 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20200303086-A1 ELECTROCONDUCTIVE FILM AND METHOD FOR MANUFACTURING ELECTROCONDUCTIVE PATTERN TOKYO UNIVERSITY OF SCIENCE FOUNDATION (JP) 2020-09-24 — — US disclosed
US-10720259-B2 Electroconductive film and method for manufacturing electroconductive pattern TOKYO UNIVERSITY OF SCIENCE FOUNDATION (JP) 2020-07-21 — — US disclosed
US-20170309363-A1 ELECTROCONDUCTIVE FILM AND METHOD FOR MANUFACTURING ELECTROCONDUCTIVE PATTERN TOKYO UNIVERSITY OF SCIENCE FOUNDATION (JP) 2017-10-26 — — US disclosed
EP-1323742-B1 Radiation sensitive refractive index changing composition and refractive index changing method JSR CORP (JP) 2011-02-16 — — EP disclosed
US-7320854-B2 Mixture of oxide particles, polymerizable compound,radiation sensitive decomposer and releasing agent JSR CORPORATION (JP) 2008-01-22 — — US disclosed
US-7205085-B2 Composition having permitivity being radiation-sensitively changeable and method for forming permitivity pattern JSR CORPORATION (JP) 2007-04-17 — — US disclosed
US-7125647-B2 Radiation-sensitive composition changing in refractive index and utilization thereof JSR CORPORATION (JP) 2006-10-24 — — US disclosed
US-7071255-B2 Radiation-sensitive composition capable of having refractive index distribution JSR CORPORATION (JP) 2006-07-04 — — US disclosed
EP-1494072-A2 Radiation sensitive refractive index changing composition, pattern forming method and optical material JSR Corporation (JP) 2005-01-05 — — EP disclosed
US-20040265737-A1 Radiation sensitive refractive index changing composition, pattern forming method and optical material JSR CORPORATION (JP) 2004-12-30 — — US disclosed
US-6787289-B2 OPTICS JSR CORPORATION (JP) 2004-09-07 — — US disclosed
EP-1413924-A1 COMPOSITION HAVING PERMITIVITY BEING RADIATION-SENSITIVELY CHANGEABLE AND METHOD FOR FORMING PERMITIVITY PATTERN JSR Corporation (JP) 2004-04-28 — — EP disclosed
US-20040005506-A1 Composition having permitivity being radiation-sensitively changeable and method for forming permitivity pattern JSR CORPORATION (JP) 2004-01-08 — — US disclosed
EP-1375597-A1 RADIATION-SENSITIVE COMPOSITION CHANGING IN REFRACTIVE INDEX AND UTILIZATION THEREOF JSR Corporation (JP) 2004-01-02 — — EP disclosed
EP-1369459-A1 RADIATION-SENSITIVE COMPOSITION CAPABLE OF HAVING REFRACTIVE INDEX DISTRIBUTION JSR Corporation (JP) 2003-12-10 — — EP disclosed
US-20030187119-A1 Radiation-sensitive composition capable of having refractive index distribution JSR CORPORATION (JP) 2003-10-02 — — US disclosed
US-20030171468-A1 Radiation-sensitive composition changing in refractive index and utilization thereof JSR CORPORATION (JP) 2003-09-11 — — US disclosed
US-20030139486-A1 Radiation sensitive refractive index changing composition and refractive index changing method JSR CORPORATION (JP) 2003-07-24 — — US disclosed
EP-1323742-A2 Radiation sensitive refractive index changing composition and refractive index changing method JSR Corporation (JP) 2003-07-02 — — EP disclosed
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