SCHEMBL12936738

SCHEMBL12936738

CCC(=O)OC1(CC)CCCCC1

nearest known ligand 0.34

Predicted protein targets (top 13)

geneUniProtsupporting neighboursconfidence
KDM4E B2RXH2 3/20 0.33
CYP19A1 P11511 1/20 0.33
OPRM1 P35372 3/20 0.32
OPRD1 P41143 3/20 0.32
OPRK1 P41145 3/20 0.32
FFAR3 O14843 1/20 0.31
CYP2C19 P33261 1/20 0.31
LMNA P02545 1/20 0.31
CHRM2 P08172 1/20 0.30
CHRM4 P08173 1/20 0.30
CHRM1 P11229 1/20 0.30
CHRM3 P20309 1/20 0.30
ALDH1A1 P00352 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL13925835 1.00 KDM4E (0.33) KDM4ECYP19A1OPRM1OPRD1OPRK1
SCHEMBL14649899 1.00 KDM4E (0.33) KDM4ECYP19A1OPRM1OPRD1OPRK1
SCHEMBL2611791 0.98 OPRM1 (0.33) KDM4ECYP19A1OPRM1OPRD1OPRK1
SCHEMBL12011319 0.87 KDM4E (0.32) KDM4E
SCHEMBL10222878 0.85 NAAA (0.32) KDM4ECYP2C19ALDH1A1
SCHEMBL11990295 0.84 NAAA (0.37) KDM4E
SCHEMBL4171360 0.84 KDM4E (0.31) KDM4ECYP19A1OPRM1OPRD1OPRK1
SCHEMBL7080628 0.84 USP2 (0.37) KDM4ECYP19A1OPRM1OPRD1OPRK1
SCHEMBL12197285 0.84 ALDH1A1 (0.41) KDM4ECYP19A1FFAR3LMNAALDH1A1
SCHEMBL10186725 0.84 KDM4E (0.31) KDM4ECYP19A1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 23 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-11920104-B2 Ethers and esters of 1-substituted cycloalkanols for use as aroma chemicals BASF SE (DE) 2024-03-05 US disclosed
US-20230194983-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2023-06-22 US disclosed
US-11248086-B2 Hard-mask forming composition and method for manufacturing electronic component TOKYO OHKA KOGYO CO., LTD. (JP) 2022-02-15 US disclosed
US-20210340461-A1 ETHERS AND ESTERS OF 1-SUBSTITUTED CYCLOALKANOLS FOR USE AS AROMA CHEMICALS BASF SE (DE) 2021-11-04 US disclosed
US-20210340461-A1 ETHERS AND ESTERS OF 1-SUBSTITUTED CYCLOALKANOLS FOR USE AS AROMA CHEMICALS BASF SE (DE) 2021-11-04 US disclosed
CN-112867704-A Ethers and esters of 1-substituted cycloalkanols as fragrance chemicals 巴斯夫欧洲公司 2021-05-28 CN disclosed
WO-2020079007-A1 ETHERS AND ESTERS OF 1-SUBSTITUTED CYCLOALKANOLS FOR USE AS AROMA CHEMICALS BASF SE (DE) 2020-04-23 WO disclosed
EP-3640234-A1 ETHERS AND ESTERS OF 1-SUBSTITUTED CYCLOALKANOLS FOR USE AS AROMA CHEMICALS BASF SE (DE) 2020-04-22 EP disclosed
US-9557651-B2 Chemically amplified positive-type photosensitive resin composition TOKYO OHKA KOGYO CO., LTD. (JP) 2017-01-31 US disclosed
US-20150268553-A1 CHEMICALLY AMPLIFIED POSITIVE-TYPE PHOTOSENSITIVE RESIN COMPOSITION TOKYO OHKA KOGYO CO., LTD. (JP) 2015-09-24 US disclosed
US-8507180-B2 Chemically amplified positive-type photoresist composition for thick film, chemically amplified dry film for thick film, and method for production of thick film resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2013-08-13 US disclosed
WO-2013047902-A1 ACTINIC-RAY- OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTINIC-RAY- OR RADIATION-SENSITIVE FILM THEREFROM AND METHOD OF FORMING PATTERN FUJIFILM CORPORATION (JP) 2013-04-04 WO disclosed
WO-2013018524-A1 PHOTOSENSITIVE RESIN COMPOSITION, MATERIAL FOR FORMING RELIEF PATTERN, PHOTOSENSITIVE FILM, POLYIMIDE FILM, CURED RELIEF PATTERN AND METHOD FOR PRODUCING SAME, AND SEMICONDUCTOR DEVICE 富士フイルム株式会社 (JP) 2013-02-07 WO disclosed
US-20120251946-A1 PHOTORESIST COMPOSITION SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2012-10-04 US disclosed
US-20110300482-A1 SULFONIUM SALT, PHOTO-ACID GENERATOR, AND PHOTOSENSITIVE RESIN COMPOSITION SAN-APRO, LTD (JP) 2011-12-08 US disclosed
US-20100190107-A1 CYCLIC COMPOUND, PHOTORESIST BASE MATERIAL AND PHOTORESIST COMPOSITION IDEMITSU KOSAN CO. LTD (JP) 2010-07-29 US disclosed
WO-2010067905-A2 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION AND PATTERN FORMING METHOD USING THE SAME FUJIFILM CORPORATION (JP) 2010-06-17 WO disclosed
WO-2010067898-A2 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION AND PATTERN FORMING METHOD USING THE COMPOSITION FUJIFILM CORPORATION (JP) 2010-06-17 WO disclosed
US-20100047715-A1 CHEMICALLY AMPLIFIED POSITIVE-TYPE PHOTORESIST COMPOSITION FOR THICK FILM, CHEMICALLY AMPLIFIED DRY FILM FOR THICK FILM, AND METHOD FOR PRODUCTION OF THICK FILM RESIST PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2010-02-25 US disclosed
US-20090123838-A1 CATHODE SUBSTRATE TOKYO OHKA KOGYO CO., LTD. (JP) 2009-05-14 US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (3 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20100190107-A1 CYCLIC COMPOUND, PHOTORESIST BASE MATERIAL AND PHOTORESIST COMPOSITION CRY1, PCNA, ERCC4 KDM4E 3997/4885CYP19A1 803/4885OPRM1 2554/4885
US-20230194983-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE RER1, TERB1, TRRAP KDM4E 1921/4885CYP19A1 3302/4885OPRM1 4093/4885
US-20110300482-A1 SULFONIUM SALT, PHOTO-ACID GENERATOR, AND PHOTOSENSITIVE RESIN COMPOSITION ASIC1, H1-0, IK KDM4E 960/4885CYP19A1 3774/4885OPRM1 564/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.