SCHEMBL13027268

SCHEMBL13027268

COc1c(CO)ccc(C)c1C[Si](OC)(OC)OC

nearest known ligand 0.34

Predicted protein targets (top 12)

geneUniProtsupporting neighboursconfidence
▸ PDCD1 Q15116 1/20 0.34
▸ CD274 Q9NZQ7 1/20 0.34
▸ MAPT P10636 1/20 0.33
▸ KDM4E B2RXH2 1/20 0.31
▸ ALDH1A1 P00352 1/20 0.31
▸ AKR1B1 P15121 1/20 0.31
▸ PDE4A P27815 1/20 0.30
▸ PDE4B Q07343 1/20 0.30
▸ PDE4C Q08493 1/20 0.30
▸ PDE4D Q08499 1/20 0.30
▸ CA2 P00918 1/20 0.30
▸ CA4 P22748 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL13027339 0.86 MAPT (0.30) MAPT
SCHEMBL15672365 0.86 PDCD1 (0.33) PDCD1CD274MAPTAKR1B1
SCHEMBL13027245 0.83 ADRA2A (0.31) —
SCHEMBL13027122 0.75 PDCD1 (0.36) PDCD1CD274MAPTKDM4EALDH1A1
SCHEMBL13027288 0.74 ALDH1A1 (0.36) MAPTALDH1A1
SCHEMBL13027241 0.73 AGXT (0.34) MAPTALDH1A1
SCHEMBL13027249 0.73 ALDH1A1 (0.32) MAPTALDH1A1
SCHEMBL17616016 0.72 CA2 (0.39) PDCD1CD274MAPTKDM4EALDH1A1
SCHEMBL13027257 0.71 ALDH1A1 (0.34) MAPTKDM4EALDH1A1
SCHEMBL13027225 0.71 CYP1A2 (0.31) —

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 2 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8697330-B2 Composition for forming a silicon-containing antireflection film, substrate having the silicon-containing antireflection film from the composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-04-15 — — US disclosed
US-20100285407-A1 Composition for forming a silicon-containing antireflection film, substrate having the silicon-containing antireflection film from the composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-11-11 — — US disclosed
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