SCHEMBL14028985

SCHEMBL14028985

CC(C)(c1cc(C(C)(C)c2cc(CO)c(O)c(CO)c2)cc(C(C)(C)c2cc(CO)c(O)c(CO)c2)c1)c1cc(CO)c(O)c(CO)c1

nearest known ligand 0.59

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
ALOX15 P16050 3/20 0.59
KLF10 Q13118 1/20 0.59
MAPK1 P28482 1/20 0.59
HTT P42858 1/20 0.59
HIF1A Q16665 3/20 0.46
ALOX12 P18054 2/20 0.46
CYP3A4 P08684 2/20 0.46
HPGD P15428 2/20 0.46
TSHR P16473 2/20 0.46
HSD17B10 Q99714 2/20 0.46
ALDH1A1 P00352 1/20 0.46
CASP1 P29466 1/20 0.46
RECQL P46063 1/20 0.46
TDP1 Q9NUW8 1/20 0.46
CYP2C19 P33261 3/20 0.44
SHBG P04278 1/20 0.41
GPR35 Q9HC97 1/20 0.39
CHEK1 O14757 1/20 0.39
DAPK3 O43293 1/20 0.39
RET P07949 1/20 0.39

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL26134510 0.98 ALOX15 (0.61) ALOX15KLF10MAPK1HTTHIF1A
SCHEMBL224429 0.98 ALOX15 (0.61) ALOX15KLF10MAPK1HTTHIF1A
SCHEMBL10051856 0.90 KLF10 (0.59) ALOX15KLF10MAPK1HTTHIF1A
SCHEMBL12285444 0.90 ALOX15 (0.53) ALOX15KLF10MAPK1HTTHIF1A
SCHEMBL25446794 0.88 ALOX15 (0.52) ALOX15KLF10MAPK1HTTHIF1A
SCHEMBL21096823 0.88 ALOX15 (0.52) ALOX15KLF10MAPK1HTTHIF1A
SCHEMBL836696 0.87 SHBG (0.57) ALOX15KLF10MAPK1HTTHIF1A
SCHEMBL4852210 0.86 KLF10 (0.55) ALOX15KLF10MAPK1HTTHIF1A
SCHEMBL8733565 0.86 KLF10 (0.59) ALOX15KLF10MAPK1HTTHIF1A
SCHEMBL12134641 0.86 ALOX15 (0.46) ALOX15KLF10MAPK1HTTHIF1A

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 7 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-10444627-B2 Pattern formation method, active light-sensitive or radiation-sensitive resin composition, resist film, production method for electronic device using same, and electronic device FUJIFILM CORPORATION (JP) 2019-10-15 US disclosed
US-20160147154-A1 PATTERN FORMATION METHOD, ACTIVE LIGHT-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, PRODUCTION METHOD FOR ELECTRONIC DEVICE USING SAME, AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2016-05-26 US disclosed
US-20160147154-A1 PATTERN FORMATION METHOD, ACTIVE LIGHT-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, PRODUCTION METHOD FOR ELECTRONIC DEVICE USING SAME, AND ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2016-05-26 US disclosed
US-9034560-B2 Negative resist composition and pattern forming method using the same FUJIFILM CORPORATION (JP) 2015-05-19 US disclosed
US-20140227642-A1 NEGATIVE RESIST COMPOSITION AND PATTERN FORMING METHOD USING THE SAME FUJIFILM CORPORATION (JP) 2014-08-14 US disclosed
US-8637222-B2 Negative resist pattern forming method, developer and negative chemical-amplification resist composition used therefor, and resist pattern FUJIFILM CORPORATION (JP) 2014-01-28 US disclosed
US-20080241745-A1 Mixture of alkali soluble polymer, crosslinking agent, acid generator ; radiation with actinic radiation; quaternary ammonium compound FUJIFILM CORPORATION (JP) 2008-10-02 US disclosed