SCHEMBL15470580

SCHEMBL15470580

C=C(C)C(=O)OC(C)(C)C1CCC=C(C)CC1

nearest known ligand 0.43

Predicted protein targets (top 11)

geneUniProtsupporting neighboursconfidence
LMNA P02545 3/20 0.43
CYP3A4 P08684 2/20 0.43
ALOX15 P16050 2/20 0.43
PTPN1 P18031 1/20 0.35
STAT3 P40763 2/20 0.34
MEN1 O00255 1/20 0.34
MAPK1 P28482 1/20 0.34
KMT2A Q03164 1/20 0.34
CHRNA7 P36544 1/20 0.34
CES2 O00748 1/20 0.31
MET P08581 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL15470547 0.89 LMNA (0.34) LMNACYP3A4ALOX15
SCHEMBL15470540 0.87 LMNA (0.51) LMNACYP3A4ALOX15PTPN1STAT3
SCHEMBL15470579 0.81 LMNA (0.33) LMNACYP3A4ALOX15
SCHEMBL15470578 0.80 LMNA (0.42) LMNACYP3A4ALOX15PTPN1STAT3
SCHEMBL15470576 0.78 ALOX15 (0.30) ALOX15
SCHEMBL674286 0.78 ALDH1A1 (0.39)
SCHEMBL15470551 0.77 LMNA (0.54) LMNACYP3A4ALOX15PTPN1STAT3
SCHEMBL14825701 0.77 MTNR1A (0.43)
SCHEMBL15470545 0.77 LMNA (0.49) LMNACYP3A4ALOX15PTPN1STAT3
SCHEMBL15470553 0.77 ALDH1A1 (0.32) LMNACYP3A4ALOX15

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9075308-B2 Positive resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-07-07 US disclosed
US-9075308-B2 Positive resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-07-07 US disclosed
US-20140045122-A1 POSITIVE RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-02-13 US disclosed
US-20140045122-A1 POSITIVE RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-02-13 US disclosed