SCHEMBL1697128

SCHEMBL1697128

C=C(C)C(=O)OCCC(=O)OC1CCC2CC1OC2=O

nearest known ligand 0.33

Predicted protein targets (top 4)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 1/20 0.33
THRB P10828 1/20 0.32
TSHR P16473 2/20 0.31
PRKCA P17252 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL10027362 0.93 THRB (0.33) ALDH1A1THRBTSHR
SCHEMBL12840775 0.90 ALDH1A1 (0.33) ALDH1A1THRBTSHR
SCHEMBL685870 0.88 ALDH1A1 (0.35) ALDH1A1TSHR
SCHEMBL13330294 0.85 THRB (0.38) ALDH1A1THRBTSHR
SCHEMBL19062654 0.84 GPX4 (0.35) ALDH1A1
SCHEMBL75422 0.84 GPX4 (0.35) ALDH1A1
SCHEMBL25617837 0.84 GPX4 (0.35) ALDH1A1
SCHEMBL1697127 0.83 TSHR (0.33) ALDH1A1THRBTSHR
SCHEMBL15078263 0.83 BCHE (0.32) ALDH1A1THRB
SCHEMBL6354066 0.80 PRKCA (0.32) PRKCA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 38 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9405187-B2 Salt, acid generator and resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-08-02 US disclosed
US-9229320-B2 Resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-01-05 US disclosed
US-9063414-B2 Photoresist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2015-06-23 US disclosed
US-8993210-B2 Salt and photoresist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2015-03-31 US disclosed
US-8530135-B2 Photoresist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2013-09-10 US disclosed
US-8530137-B2 Photoresist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2013-09-10 US disclosed
US-8481242-B2 Salt and photoresist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2013-07-09 US disclosed
US-8431326-B2 Salt and photoresist composition comprising the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2013-04-30 US disclosed
US-8426106-B2 Photoresist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2013-04-23 US disclosed
US-8304164-B2 Photoresist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2012-11-06 US disclosed
US-20110046333-A1 ACRYLIC ACID-BASED POLYMER AND METHOD OF PRODUCING THE SAME NIPPON SODA CO., LTD. (JP) 2011-02-24 US disclosed
US-7847045-B2 Acrylic acid-based polymer and method of producing the same NIPPON SODA CO., LTD. (JP) 2010-12-07 US disclosed
US-20100210805-A1 METHOD FOR PRODUCING STAR POLYMER NIPPON SODA CO., LTD. (JP) 2010-08-19 US disclosed
US-20100159404-A1 PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-06-24 US disclosed
US-20090209726-A1 ACRYLIC STAR POLYMER NIPPON SODA CO., LTD. (JP) 2009-08-20 US disclosed
US-20090111961-A1 Acrylic Acid-Based Polymer and Method of Producing the Same NIPPON SODA CO., LTD. (JP) 2009-04-30 US disclosed
US-20090087786-A1 PATTERNING PROCESS AND RESIST COMPOSITION USED THEREIN SHIN-ETSU CHEMICAL CO., LTD. (JP) 2009-04-02 US disclosed
US-7494759-B2 Positive resist compositions and process for the formation of resist patterns with the same TOKYO OHKA KOGYO CO., LTD. (JP) 2009-02-24 US disclosed
US-20080214685-A1 Multibrached Polymer and Method for Producing the Same NIPPON SODA CO., LTD. (JP) 2008-09-04 US disclosed
US-20070224538-A1 Positive Resist Compositions and Process for the Formation of Resist Patterns With the Same TOKYO OHKA KOGYO CO., LTD. (JP) 2007-09-27 US disclosed