SCHEMBL210241

SCHEMBL210241

CCC1(OC(=O)CCl)C2CC3CC(C2)CC1C3

nearest known ligand 0.38

Predicted protein targets (top 11)

geneUniProtsupporting neighboursconfidence
CYP17A1 P05093 1/20 0.33
CYP19A1 P11511 1/20 0.33
HSD11B1 P28845 4/20 0.32
MEN1 O00255 1/20 0.31
KMT2A Q03164 1/20 0.31
L3MBTL1 Q9Y468 1/20 0.31
JAK2 O60674 1/20 0.30
ALDH1A1 P00352 1/20 0.30
LMNA P02545 1/20 0.30
RAB9A P51151 1/20 0.30
EPHX2 P34913 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL952413 0.89 EPHX2 (0.34) CYP17A1CYP19A1MEN1KMT2AL3MBTL1
SCHEMBL172815 0.85 CYP17A1 (0.35) CYP17A1CYP19A1HSD11B1ALDH1A1LMNA
SCHEMBL23975519 0.83
SCHEMBL2672518 0.82 TRPA1 (0.36) CYP17A1CYP19A1HSD11B1ALDH1A1
SCHEMBL12936734 0.82 ALDH1A1 (0.39) CYP17A1CYP19A1HSD11B1MEN1KMT2A
SCHEMBL4741912 0.82 CYP17A1 (0.33) CYP17A1CYP19A1HSD11B1
SCHEMBL2603148 0.81 HSD11B1 (0.33) CYP17A1CYP19A1HSD11B1MEN1KMT2A
SCHEMBL210037 0.80 CYP19A1 (0.49) CYP17A1CYP19A1HSD11B1JAK2ALDH1A1
SCHEMBL439938 0.79 HSD11B1 (0.34) CYP17A1CYP19A1HSD11B1ALDH1A1LMNA
SCHEMBL25509620 0.79 HSD11B1 (0.38) CYP17A1CYP19A1HSD11B1MEN1KMT2A

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 59 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-11822241-B2 Salt, acid generator, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2023-11-21 US disclosed
US-11822241-B2 Salt, acid generator, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2023-11-21 US disclosed
US-11820736-B2 Salt, acid generator, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2023-11-21 US disclosed
US-11820736-B2 Salt, acid generator, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2023-11-21 US disclosed
US-20230004084-A1 SALT, ACID GENERATOR, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2023-01-05 US disclosed
US-20220413383-A1 SALT, ACID GENERATOR, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2022-12-29 US disclosed
US-20220011668-A1 SALT, ACID GENERATOR, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2022-01-13 US disclosed
US-20210371376-A1 SALT, ACID GENERATOR, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2021-12-02 US disclosed
US-20210341836-A1 SALT, ACID GENERATOR, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2021-11-04 US disclosed
EP-2093213-B1 Positive resist composition and method of forming a resist pattern using the same TOKYO OHKA KOGYO CO LTD (JP) 2017-10-04 EP disclosed
US-20090220886-A1 POLYHYDRIC COMPOUND AND CHEMICALLY AMPLIFIED RESIST COMPOSITION CONTAINING THE SAME SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2009-09-03 US disclosed
US-20090214982-A1 POSITIVE RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, AND POLYMERIC COMPOUND TOKYO OHKA KOGYO CO., LTD. (JP) 2009-08-27 US disclosed
EP-2093213-A1 Positive resist composition, method of forming resist pattern, and polymeric compound TOKYO OHKA KOGYO CO., LTD. (JP) 2009-08-26 EP disclosed
US-7556908-B2 Chemically amplified positive resist composition, (meth)acrylate derivative and a process for producing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2009-07-07 US disclosed
US-7494763-B2 Polyhydric phenol compound and chemically amplified resist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2009-02-24 US disclosed
US-20090042131-A1 acrylate ester homo- or co-polymer increased solubility in an alkali developing solution under action of acid and an acid-generator, having an acid dissociable, dissolution inhibiting group TOKYO OHKA KOGYO CO., LTD. (JP) 2009-02-12 US disclosed
US-20080248417-A1 Polyhydric phenol compound and chemically amplified resist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2008-10-09 US disclosed
US-7193106-B2 Halogenoacetoxyadamantane derivatives and process for production thereof IDEMITSU KOSAN CO., LTD. (JP) 2007-03-20 US disclosed
US-20050258395-A1 Halogenoacetoxyadamantane derivatives and process for production thereof IDEMITSU KOSAN CO., LTD. (JP) 2005-11-24 US disclosed
EP-1516867-A1 HALOGENOACETOXYADAMANTANE DERIVATIVES AND PROCESS FOR PRODUCTION THEREOF IDEMITSU KOSAN CO., LTD. (JP) 2005-03-23 EP disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (10 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20210341836-A1 SALT, ACID GENERATOR, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN H1-10, H1-0, CHRM1 CYP17A1 1937/4885CYP19A1 2186/4885HSD11B1 578/4885
US-20230004084-A1 SALT, ACID GENERATOR, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN H1-10, H1-0, H1-4 CYP17A1 2194/4885CYP19A1 3310/4885HSD11B1 194/4885
US-20210371376-A1 SALT, ACID GENERATOR, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN H1-10, H1-0, OXSR1 CYP17A1 1225/4885CYP19A1 1643/4885HSD11B1 212/4885
US-20080248417-A1 Polyhydric phenol compound and chemically amplified resist composition containing the same CCNA1, C1R, CCNA2 CYP17A1 923/4885CYP19A1 913/4885HSD11B1 1270/4885
US-20090042131-A1 acrylate ester homo- or co-polymer increased solubility in an alkali developing solution under action of acid and an acid-generator, having an acid dissociable, dissolution inhibiting group ADH1A, F12, DDAH1 CYP17A1 425/4885CYP19A1 183/4885HSD11B1 92/4885
US-20090220886-A1 POLYHYDRIC COMPOUND AND CHEMICALLY AMPLIFIED RESIST COMPOSITION CONTAINING THE SAME C5, C1R, H1-4 CYP17A1 1865/4885CYP19A1 1532/4885HSD11B1 2484/4885
US-20220011668-A1 SALT, ACID GENERATOR, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN H1-0, H1-10, CHRM1 CYP17A1 2101/4885CYP19A1 2567/4885HSD11B1 451/4885
US-11820736-B2 Salt, acid generator, resist composition and method for producing resist pattern H1-10, H1-0, H1-2 CYP17A1 1557/4885CYP19A1 2719/4885HSD11B1 244/4885
US-11822241-B2 Salt, acid generator, resist composition and method for producing resist pattern H1-10, H1-0, CHRM1 CYP17A1 1937/4885CYP19A1 2186/4885HSD11B1 578/4885
US-20220413383-A1 SALT, ACID GENERATOR, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN H1-10, H1-0, OR10J3 CYP17A1 1503/4885CYP19A1 2870/4885HSD11B1 192/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.