SCHEMBL2473998

SCHEMBL2473998

CCCCO[Si](O)(c1ccccc1)c1ccccc1

nearest known ligand 0.44

Predicted protein targets (top 16)

geneUniProtsupporting neighboursconfidence
LTA4H P09960 2/20 0.44
TSHR P16473 4/20 0.42
L3MBTL1 Q9Y468 3/20 0.42
TDP1 Q9NUW8 2/20 0.42
CYP2C9 P11712 3/20 0.39
CYP2C19 P33261 3/20 0.39
CYP1A2 P05177 2/20 0.39
CYP3A4 P08684 4/20 0.38
ALDH1A1 P00352 3/20 0.38
MAPK1 P28482 2/20 0.38
CYP2D6 P10635 3/20 0.38
CYP19A1 P11511 2/20 0.38
TP53 P04637 1/20 0.37
HSD17B10 Q99714 1/20 0.37
PCSK9 Q8NBP7 1/20 0.36
LMNA P02545 1/20 0.36

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL8034448 0.93 TSHR (0.45) LTA4HTSHRCYP3A4ALDH1A1MAPK1
SCHEMBL8048262 0.93 TSHR (0.45) LTA4HTSHRCYP3A4ALDH1A1MAPK1
SCHEMBL1686817 0.85 LTA4H (0.44) LTA4HTSHRL3MBTL1TDP1CYP2C9
SCHEMBL8052071 0.84 SOAT2 (0.45) ALDH1A1
SCHEMBL8052068 0.84 SOAT2 (0.45) ALDH1A1
SCHEMBL28693226 0.81 LTA4H (0.42) LTA4HTSHRL3MBTL1TDP1CYP2C9
SCHEMBL28994572 0.80 LTA4H (0.41) LTA4HTSHRL3MBTL1TDP1CYP2C9
SCHEMBL431558 0.80 LTA4H (0.47) LTA4HTSHRL3MBTL1TDP1CYP2C9
SCHEMBL705748 0.80 DUT (0.47) LTA4HTSHRL3MBTL1TDP1CYP2C9
SCHEMBL431649 0.80 LTA4H (0.47) LTA4HTSHRL3MBTL1TDP1CYP2C9

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 45 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-120153318-A Photosensitive resin composition, method for producing cured relief pattern using same, and method for producing polyimide film 旭化成株式会社 2025-06-13 CN disclosed
WO-2024210063-A1 PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR PRODUCING CURED RELIEF PATTERN, CURED FILM, AND SEMICONDUCTOR DEVICE 旭化成株式会社 2024-10-10 WO disclosed
US-20240101761-A1 POLYIMIDE PRECURSOR RESIN COMPOSITION AND METHOD FOR MANUFACTURING SAME ASAHI KASEI KABUSHIKI KAISHA (JP) 2024-03-28 US disclosed
US-11640112-B2 Photosensitive resin composition and method for producing cured relief pattern ASAHI KASEI KABUSHIKI KAISHA (JP) 2023-05-02 US disclosed
CN-115755526-A Photosensitive resin composition and method for producing cured relief pattern 旭化成株式会社 2023-03-07 CN disclosed
CN-115039029-A Negative photosensitive resin composition and method for producing cured relief pattern 旭化成株式会社 2022-09-09 CN disclosed
CN-107870516-B Positive photosensitive resin composition, patterned film and method for manufacturing bump 奇美实业股份有限公司 2022-08-02 CN disclosed
WO-2022154020-A1 POLYIMIDE PRECURSOR RESIN COMPOSITION AND METHOD FOR MANUFACTURING SAME 旭化成株式会社 2022-07-21 WO disclosed
US-20220011669-A1 PHOTOSENSITIVE RESIN COMPOSITION AND METHOD FOR PRODUCING CURED RELIEF PATTERN ASAHI KASEI KABUSHIKI KAISHA (JP) 2022-01-13 US disclosed
US-11163234-B2 Photosensitive resin composition and method for producing cured relief pattern ASAHI KASEI KABUSHIKI KAISHA (JP) 2021-11-02 US disclosed
US-8461699-B2 Positive-type photosensitive resin composition, method for producing resist pattern, semiconductor device, and electronic device HITACHI CHEMICAL COMPANY, LTD. (JP) 2013-06-11 US disclosed
WO-2012126766-A1 N-(3-CARBAMOYLPHENYL)-1H-PYRAZOLE-5-CARBOXAMIDE DERIVATIVES AND THE USE THEREOF FOR CONTROLLING ANIMAL PESTS BAYER CROPSCIENCE AG (DE) 2012-09-27 WO disclosed
EP-2469337-A1 Positive photosensitive resin composition, method for forming pattern, and electronic component Hitachi Chemical DuPont MicroSystems Ltd. (JP) 2012-06-27 EP disclosed
US-20110254178-A1 POSITIVE-TYPE PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR PRODUCING RESIST PATTERN, SEMICONDUCTOR DEVICE, AND ELECTRONIC DEVICE RESONAC CORPORATION (JP) 2011-10-20 US disclosed
EP-2372457-A1 POSITIVE-TYPE PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR PRODUCING RESIST PATTERN, SEMICONDUCTOR DEVICE, AND ELECTRONIC DEVICE Hitachi Chemical Company, Ltd. (JP) 2011-10-05 EP disclosed
US-7638254-B2 Positive photosensitive resin composition, method for forming pattern, and electronic part HITACHI CHEMICAL DUPONT MICROSYSTEMS LTD (JP) 2009-12-29 US disclosed
US-20090011364-A1 POSITIVE PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR FORMING PATTERN, AND ELECTRONIC PART HATTORI TAKASHI 2009-01-08 US disclosed
EP-1744213-A1 POSITIVE PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR FORMING PATTERN, AND ELECTRONIC COMPONENT Hitachi Chemical DuPont Microsystems Ltd. (JP) 2007-01-17 EP disclosed
EP-1412346-A1 METHOD FOR PRODUCING NOVEL SPINOSYN DERIVATIVES Bayer CropScience AG (DE) 2004-04-28 EP disclosed
WO-2003010155-A1 METHOD FOR PRODUCING NOVEL SPINOSYN DERIVATIVES BAYER CROPSCIENCE AG (DE) 2003-02-06 WO disclosed