SCHEMBL2476476

SCHEMBL2476476

CCC1(C(=O)O)C2C=CC(C2)C1C1C2CC3CC(C2)CC1C3

nearest known ligand 0.32

Predicted protein targets (top 9)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 2/20 0.32
TDP1 Q9NUW8 2/20 0.32
KDM4E B2RXH2 1/20 0.32
LMNA P02545 1/20 0.32
MEN1 O00255 1/20 0.31
POLB P06746 1/20 0.31
KMT2A Q03164 1/20 0.31
CTDSP1 Q9GZU7 1/20 0.31
HSD11B1 P28845 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL717502 0.83
SCHEMBL6764223 0.82 MAPK1 (0.32)
SCHEMBL2477133 0.78 TDP1 (0.40) ALDH1A1TDP1KDM4ELMNAMEN1
SCHEMBL4733433 0.71
SCHEMBL6468952 0.70 ALDH1A1 (0.37) ALDH1A1TDP1KDM4ELMNAMEN1
SCHEMBL5712564 0.66 HSD11B1 (0.40) MEN1KMT2AHSD11B1
SCHEMBL5837332 0.64 KDM4E (0.38) ALDH1A1TDP1KDM4ELMNAMEN1
SCHEMBL27937190 0.63 TDP1 (0.34) ALDH1A1TDP1KDM4ELMNAMEN1
SCHEMBL7699416 0.60 ALDH1A1 (0.36) ALDH1A1TDP1KDM4ELMNAMEN1
SCHEMBL6683362 0.59 MEN1 (0.31) ALDH1A1TDP1MEN1POLBKMT2A

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 6 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-6720129-B2 PHOTORESIST COMPRISING FLUOROALKYLATED UNITS OF PHTHALIMIDE AND NORBORNENE-BASED ESTERS SUCH AS 2-METHOXYBUTYL-2-ADAMANTANYL 5-NORBORNENE-2-CARBOXYLATE; ETCH RESISTANCE, HEAT RESISTANCE AND ADHESIVENESS HYNIX SEMICONDUCTOR INC (KR) 2004-04-13 US claimed
US-20020164541-A1 Maleimide-photoresist polymers containing fluorine and photoresist compositions comprising the same HYNIX SEMICONDUCTOR, INC. (KR) 2002-11-07 US claimed
US-20130095425-A1 PHOTORESIST COMPOSITION SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2013-04-18 US disclosed
EP-1078945-B1 Polymer for use in a photoresist composition SAMSUNG ELECTRONICS CO LTD (KR) 2011-10-12 EP disclosed
US-6642336-B1 Ultraviolet radiation transparent; improved adhesion, contrast and dry etch resistance SAMSUNG ELECTRONICS CO., LTD. (KR) 2003-11-04 US disclosed
EP-1078945-A2 Polymer for use in a photoresist composition SAMSUNG ELECTRONICS CO. LTD. (KR) 2001-02-28 EP disclosed