SCHEMBL25564209

SCHEMBL25564209

CC(=O)OC1(c2ccc(OC(F)(F)F)cc2)CCC(C)(C)C1

nearest known ligand 0.43

Predicted protein targets (top 13)

geneUniProtsupporting neighboursconfidence
SLC6A4 P31645 12/20 0.43
SLC6A3 Q01959 9/20 0.41
SLC6A2 P23975 2/20 0.39
EPHX2 P34913 2/20 0.37
PDE2A O00408 1/20 0.36
CYP3A4 P08684 1/20 0.36
CYP2C9 P11712 1/20 0.36
CYP2C19 P33261 1/20 0.36
MEN1 O00255 1/20 0.36
KMT2A Q03164 1/20 0.36
AMPD2 Q01433 1/20 0.35
TGM2 P21980 1/20 0.35
ADORA3 P0DMS8 1/20 0.35

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL25564669 0.88 SLC6A4 (0.40) SLC6A4SLC6A3SLC6A2EPHX2PDE2A
SCHEMBL25564207 0.84 OPRM1 (0.36) SLC6A4SLC6A3SLC6A2PDE2ACYP2C19
SCHEMBL25564148 0.83 SLC6A4 (0.49) SLC6A4SLC6A3SLC6A2EPHX2PDE2A
SCHEMBL25564249 0.82 SLC6A4 (0.51) SLC6A4SLC6A3SLC6A2EPHX2PDE2A
SCHEMBL25564200 0.82 DRD2 (0.44) SLC6A3SLC6A2CYP2C19
SCHEMBL25564211 0.78 SLC6A4 (0.40) SLC6A4SLC6A3SLC6A2EPHX2
SCHEMBL25564205 0.78 SLC6A4 (0.43) SLC6A4SLC6A3SLC6A2EPHX2
SCHEMBL25564221 0.75 SLC6A4 (0.43) SLC6A4SLC6A3SLC6A2EPHX2
SCHEMBL25564229 0.73 ADORA3 (0.39) SLC6A4SLC6A3SLC6A2PDE2AMEN1
SCHEMBL25564288 0.72 ADORA3 (0.40) SLC6A4SLC6A3SLC6A2PDE2ACYP3A4

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20230367213-A1 MASK BLANK, RESIST PATTERN FORMING PROCESS AND CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-11-16 US disclosed
US-20230194986-A1 CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION AND RESIST PATTERN FORMING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-06-22 US disclosed
US-20230161254-A1 CHEMICALLY AMPLIFIED RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-05-25 US disclosed